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    • 3. 发明授权
    • Apparatus for manufacturing compound semiconductor, method for manufacturing compound semiconductor, and compound semiconductor
    • 用于制造化合物半导体的装置,化合物半导体的制造方法和化合物半导体
    • US09064696B2
    • 2015-06-23
    • US13817388
    • 2011-08-16
    • Hideki YasuharaAkira Bandoh
    • Hideki YasuharaAkira Bandoh
    • H01L21/20H01L21/02C23C16/458C30B25/12H01L21/687C30B25/02C30B29/40H01L33/00
    • H01L21/02293C23C16/4583C30B25/02C30B25/12C30B29/403H01L21/0237H01L21/0242H01L21/02458H01L21/0254H01L21/02573H01L21/0262H01L21/6875H01L21/68757H01L21/68764H01L21/68771H01L33/007
    • Provided is an apparatus for manufacturing a compound semiconductor, which forms a compound semiconductor layer using a metal-organic chemical vapor deposition method. The apparatus is characterized in that: the apparatus is provided with a reaction container, a holder, which is disposed in the reaction container and has placed thereon a subject, on which the layer is to be formed, the subject having facing up the subject surface where the layer is to be formed, and a raw material supply port, through which the raw material gas of the compound semiconductor is supplied to the inside of the reaction container from the outside; the holder is in contact with the lower surface of the subject, the contact being inside of the outer circumferential portion of the subject to the center of the upper surface of the holder; and that the holder has a supporting portion, which supports the subject such that a predetermined interval is maintained between the upper surface of the holder and the lower surface of the subject. In the manufacture of the compound semiconductor using the MOCVD method, temperature distribution on the substrate surface to be deposited with a compound semiconductor crystal, and deviation of in-plane averaged light emission wavelength from a target value are suppressed using the apparatus.
    • 提供一种使用金属有机化学气相沉积法形成化合物半导体层的化合物半导体的制造装置。 该装置的特征在于:该装置设置有反应容器,保持器,其设置在反应容器中并且放置在其上将要形成该层的被摄体,被摄体具有面向对象表面 以及将来自外部的化合物半导体的原料气体从该原料供给口供给反应容器的内部的原料供给口, 所述保持器与所述被检体的下表面接触,所述接触部位于所述被检体的外周部分的内侧到所述保持器的上表面的中心; 并且保持器具有支撑部分,该支撑部分支撑受试者,使得在保持器的上表面和被检体的下表面之间保持预定的间隔。 在使用MOCVD法的化合物半导体的制造中,使用该装置抑制了使用化合物半导体晶体沉积的衬底表面上的温度分布和面内平均发光波长与目标值的偏差。
    • 4. 发明申请
    • APPARATUS FOR MANUFACTURING COMPOUND SEMICONDUCTOR, METHOD FOR MANUFACTURING COMPOUND SEMICONDUCTOR, AND COMPOUND SEMICONDUCTOR
    • 制造化合物半导体的装置,制造化合物半导体的方法和化合物半导体
    • US20130143393A1
    • 2013-06-06
    • US13817388
    • 2011-08-16
    • Hideki YasuharaAkira Bandoh
    • Hideki YasuharaAkira Bandoh
    • H01L21/02
    • H01L21/02293C23C16/4583C30B25/02C30B25/12C30B29/403H01L21/0237H01L21/0242H01L21/02458H01L21/0254H01L21/02573H01L21/0262H01L21/6875H01L21/68757H01L21/68764H01L21/68771H01L33/007
    • Provided is an apparatus for manufacturing a compound semiconductor, which forms a compound semiconductor layer using a metal-organic chemical vapor deposition method. The apparatus is characterized in that: the apparatus is provided with a reaction container, a holder, which is disposed in the reaction container and has placed thereon a subject, on which the layer is to be formed, the subject having facing up the subject surface where the layer is to be formed, and a raw material supply port, through which the raw material gas of the compound semiconductor is supplied to the inside of the reaction container from the outside; the holder is in contact with the lower surface of the subject, the contact being inside of the outer circumferential portion of the subject to the center of the upper surface of the holder; and that the holder has a supporting portion, which supports the subject such that a predetermined interval is maintained between the upper surface of the holder and the lower surface of the subject. In the manufacture of the compound semiconductor using the MOCVD method, temperature distribution on the substrate surface to be deposited with a compound semiconductor crystal, and deviation of in-plane averaged light emission wavelength from a target value are suppressed using the apparatus.
    • 提供一种使用金属有机化学气相沉积法形成化合物半导体层的化合物半导体的制造装置。 该装置的特征在于:该装置设置有反应容器,保持器,其设置在反应容器中并且放置在其上将要形成该层的被摄体,被摄体具有面向对象表面 以及将来自外部的化合物半导体的原料气体从该原料供给口供给反应容器的内部的原料供给口, 所述保持器与所述被检体的下表面接触,所述接触部位于所述被检体的外周部分的内侧到所述保持器的上表面的中心; 并且保持器具有支撑部分,该支撑部分支撑受试者,使得在保持器的上表面和被检体的下表面之间保持预定的间隔。 在使用MOCVD法的化合物半导体的制造中,使用该装置抑制了使用化合物半导体晶体沉积的衬底表面上的温度分布和面内平均发光波长与目标值的偏差。