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    • 1. 发明授权
    • Semiconductor integrated circuit
    • 半导体集成电路
    • US08724409B2
    • 2014-05-13
    • US12947441
    • 2010-11-16
    • Kang Seol LeeJae Hyuk Im
    • Kang Seol LeeJae Hyuk Im
    • G11C7/00G11C29/00G05F3/16G05F3/20
    • H03K19/00384
    • A semiconductor integrated circuit includes an internal reference voltage generation unit configured to generate an internal reference voltage; a high voltage generation unit configured to pump an external driving voltage based on the internal reference voltage applied from the internal reference voltage generation unit, and generate a high voltage having a specified level; and a reference voltage transfer unit configured to generate a test reference voltage from a reference voltage in a package test mode to correspond to a change in a driving operation of the external driving voltage applied from outside, and monitor and force the internal reference voltage.
    • 半导体集成电路包括:内部参考电压生成单元,被配置为产生内部参考电压; 高电压产生单元,被配置为基于从内部参考电压产生单元施加的内部参考电压来泵浦外部驱动电压,并产生具有指定电平的高电压; 以及参考电压传送单元,被配置为在封装测试模式下从参考电压产生测试参考电压,以对应于从外部施加的外部驱动电压的驱动操作的变化,并监视和强制内部参考电压。
    • 4. 发明授权
    • Monitoring circuit for semiconductor device
    • 半导体器件监控电路
    • US08098074B2
    • 2012-01-17
    • US12345649
    • 2008-12-29
    • Chang-Ho DoJae-Hyuk Im
    • Chang-Ho DoJae-Hyuk Im
    • H01H85/30G01R31/02
    • G11C29/027G11C17/165G11C17/18G11C29/02G11C29/50G11C29/50008
    • Provided is a technology for monitoring the electrical resistance of an element such as a fuse whose resistance is changed due to the electrical stress among internal circuits included in a semiconductor device. The present invention provides a monitoring circuit to monitor the change in the device specification during the device is being programmed and after the device is programmed. The present invention enables the verification of an optimized condition to let the device have a certain electrical resistance, by comparing the load voltage and the fuse voltage with the reference voltage that can sense the range of resistance variation more precisely. Also, it can guarantee device reliability since it is still possible to sense electrical resistance after the electrical stress is being given. Also, the present invention can increase the utility of the fuse by possessing an output to monitor electrical resistance sensed inside of the semiconductor.
    • 提供了一种用于监视诸如由于包含在半导体器件中的内部电路之间的电应力而导致电阻改变的熔丝的元件的电阻的技术。 本发明提供了一种监视电路,用于在设备被编程期间以及在设备被编程之后监视设备规格的变化。 本发明能够通过将负载电压和熔丝电压与可以更精确地感测电阻变化范围的参考电压进行比较来验证优化条件以使器件具有一定的电阻。 此外,它可以保证器件的可靠性,因为仍然可以在给出电应力之后感测电阻。 此外,本发明还可以通过具有输出来监测半导体内部感测的电阻来增加熔断器的效用。
    • 5. 发明授权
    • Internal voltage generating circuit
    • 内部电压发生电路
    • US07978003B2
    • 2011-07-12
    • US12630657
    • 2009-12-03
    • Kang-Seol LeeJae-Hyuk Im
    • Kang-Seol LeeJae-Hyuk Im
    • G05F1/10G05F3/02
    • G11C5/14
    • There is an internal voltage generating circuit for providing a stable high voltage by making a response time short. The internal voltage generating circuit includes a charge pump unit for generate a high voltage being higher than an external voltage in response to pumping control signals and a supply driving control signal; a pumping control signal generating unit for outputting the pumping control signals to the charge pump unit based on a driving signal; and a supply driving control unit for receiving the driving signal to generate the supply driving control signal to the charge pump unit.
    • 存在内部电压产生电路,用于通过使响应时间短而提供稳定的高电压。 内部电压产生电路包括电荷泵单元,用于响应于泵送控制信号和电源驱动控制信号而产生高于外部电压的高电压; 泵送控制信号产生单元,用于基于驱动信号将泵送控制信号输出到电荷泵单元; 以及电源驱动控制单元,用于接收驱动信号以向电荷泵单元产生电源驱动控制信号。
    • 9. 发明申请
    • REDUNDANCY CIRCUIT
    • 冗余电路
    • US20080304341A1
    • 2008-12-11
    • US11958320
    • 2007-12-17
    • Jae Hyuk ImYong Ju Chon
    • Jae Hyuk ImYong Ju Chon
    • G11C7/00
    • G11C29/785G11C2229/763G11C2229/766
    • A redundancy circuit can include a first fuse set that is configured to receive an address signal and an initializing signal activated when power is up, and to output a first redundancy signal, the first redundancy signal being used to repair a defective cell by using a laser beam radiating method, a second fuse set that is configured to receive the initializing signal, a specific address signal, a test mode signal that is activated when a defective cell exists, and the address signal, and to output a second redundancy signal, the second redundancy signal being used to repair the defective cell by using an electrical fusing method, a first memory cell array that is controlled by the first redundancy signal, and a second memory cell array that is controlled by the second redundancy signal.
    • 冗余电路可以包括:第一熔丝组,其被配置为接收地址信号;以及在上电时激活的初始化信号;以及输出第一冗余信号,所述第一冗余信号用于通过使用激光器来修复有缺陷的单元 波束辐射方法,被配置为接收初始化信号的第二熔丝组,特定地址信号,当存在缺陷单元时被激活的测试模式信号和地址信号,并输出第二冗余信号,第二熔丝组 冗余信号用于通过使用电熔接方法修复故障单元,由第一冗余信号控制的第一存储单元阵列和由第二冗余信号控制的第二存储单元阵列。