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1. 发明授权

US08008661B2 Insert module for a test handler 有权
标题翻译：插入测试处理程序的模块
公开(公告)号：US08008661B2
公开(公告)日：2011-08-30
申请号：US12638292
申请日：2009-12-15
申请人： Young-Chul Lee , Jeong-Tae Choi , Dong-Gu Kim , Woon-Sik Kim
发明人： Young-Chul Lee , Jeong-Tae Choi , Dong-Gu Kim , Woon-Sik Kim
IPC分类号： H01L23/34
CPC分类号： G01R1/0466
摘要： An insert module for a test handler includes an insert body and a support frame. The insert body has a receiving space for receiving a semiconductor device. The semiconductor device having connection pads protruding externally from a surface of the semiconductor device. The support frame is formed in an inner side portion of the insert body defining the receiving space to provide a seating surface for contacting and supporting the semiconductor device. The support frame includes a fixing frame and a guide pattern. The fixing frame is inserted into and fixed with the insert body and defines an opening that exposes the semiconductor device. The guide pattern extends from the fixing frame to the inside of the opening to contact the semiconductor device and guide the connection pads.
摘要翻译：用于测试处理器的插入模块包括插入体和支撑框架。插入体具有用于接收半导体器件的接收空间。具有从半导体器件的表面向外突出的连接焊盘的半导体器件。支撑框架形成在插入体的限定接收空间的内侧部分中，以提供用于接触和支撑半导体器件的就座表面。支撑框架包括固定框架和引导图案。固定框架插入并固定在插入体上并限定了露出半导体器件的开口。引导图案从固定框架延伸到开口的内部以与半导体器件接触并引导连接焊盘。

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