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    • 3. 发明申请
    • Method of fabricating and repairing ceramic components for semiconductor fabrication using plasma spray process
    • 使用等离子喷涂工艺制造和修复用于半导体制造的陶瓷部件的方法
    • US20030129772A1
    • 2003-07-10
    • US10309325
    • 2002-12-04
    • KOMICO Co., Ltd
    • Jin-Sik Choi
    • H01L021/00
    • H01L21/481Y10S438/974
    • Provided is a method of fabricating and repairing ceramic components for semiconductor fabrication, through which erosion and polymer deposition occurring on ceramic components for semiconductor fabrication are decreased by modifying the dielectric surface of a component having an electrical insulation characteristic so that the ceramic components can be repaired after being used. The method includes activating a surface layer of a component, which is manufactured by sintering a ceramic, and depositing a dielectric coating layer on the surface layer of the ceramic component using a plasma spray process; when the dielectric coating layer is damaged as the ceramic component is used for semiconductor fabrication, removing the dielectric coating layer; and repairing the ceramic component by depositing a dielectric coating layer on the surface layer of the ceramic component from which the damaged dielectric coating layer has been removed.
    • 提供一种制造和修复用于半导体制造的陶瓷部件的方法,通过这种方法通过改变具有电绝缘特性的部件的电介质表面来降低通过其产生用于半导体制造的陶瓷部件上的侵蚀和聚合物沉积,从而可以修复陶瓷部件 使用后。 该方法包括激活通过烧结陶瓷制造的部件的表面层,以及使用等离子体喷涂工艺在陶瓷部件的表面层上沉积电介质涂层; 当陶瓷部件用于半导体制造时,当电介质涂层被损坏时,去除电介质涂层; 以及通过在去除了损坏的电介质涂层的陶瓷部件的表面层上沉积介电涂层来修复陶瓷部件。