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1. 发明授权

US11592402B2 Connecting device for inspection 有权
公开(公告)号：US11592402B2
公开(公告)日：2023-02-28
申请号：US17392214
申请日：2021-08-02
申请人： Kabushiki Kaisha Nihon Micronics
发明人： Minoru Sato
IPC分类号： G01N21/88 , G01N21/95 , H01L21/66
摘要： A connecting device for inspection includes optical probes, and a probe head including a plurality of guide plates. The probe head includes a first guide plate, and a second guide plate arranged movably with respect to the first guide plate in a radial direction of the penetration holes in a state in which the optical probes are inserted to the respective penetration holes. The probe head holds the optical probes by inner wall surfaces of the penetration holes of the first guide plate and inner wall surfaces of the penetration holes of the second guide plate in a state in which the positions of the central axes of the penetration holes of the first guide plate are shifted in the radial direction from the positions of the central axes of the penetration holes of the second guide plate.

2. 发明申请

US20220390489A1 PROBE UNIT 有权
公开(公告)号：US20220390489A1
公开(公告)日：2022-12-08
申请号：US17730579
申请日：2022-04-27
申请人： KABUSHIKI KAISHA NIHON MICRONICS
发明人： SATOSHI NARITA , SHOU HARAKO , JUKIYA FUKUSHI
IPC分类号： G01R1/067 , G01R1/073
摘要： It is possible to make the free length of a contactor uniform even when the contactor is joined to a position that deviates from a joint position in a high-frequency conducting path and make contact with an electrode with stability, which improves measurement quality. A probe unit according to the present disclosure includes: a coaxial connector that is attached to a main body and gives and receives an electrical signal to and from a tester via a coaxial cable; a high-frequency conducting path that is connected to the coaxial connector and transmits an electrical signal; a plurality of contactors, each having a tip portion that makes electrical contact with an electrode of an object to be inspected and giving and receiving an electrical signal to and from the high-frequency conducting path; and a pedestal that is interposed between the contactor and the high-frequency conducting path, and the pedestal is provided in each contactor such that a free length of the contactor is a predetermined length.

3. 发明申请

US20220221502A1 CONNECTING DEVICE FOR INSPECTION 有权
公开(公告)号：US20220221502A1
公开(公告)日：2022-07-14
申请号：US17608118
申请日：2020-04-03
申请人： Kabushiki Kaisha Nihon Micronics
发明人： Minoru SATO
IPC分类号： G01R31/26 , G01R1/073
摘要： A connecting device for inspection includes a probe head (30) configured to hold electric contacts (10) and optical contacts (20) such that tip ends of the respective contacts are exposed on a lower surface of the probe head (30), and a transformer (40) including connecting wires (41) arranged therein and optical wires (42) penetrating therethrough. The respective proximal ends of the electric contacts (10) and the optical contacts (20) are exposed on an upper surface of the probe head (30), and tip ends on one side of the connecting wires (41) electrically connected to the proximal ends of the electric contacts (10) and connecting ends of the optical wires (42) optically connected to the proximal ends of the optical contacts (20) are arranged in a lower surface of the transformer (40). A positional relationship between the tip end of the respective electric contacts (10) and the tip end of the respective optical contacts (20) on the lower surface of the probe head (30) corresponds to a positional relationship between an electrical signal terminal and an optical signal terminal of a semiconductor device.

4. 发明申请

US20220214391A1 CONNECTING DEVICE FOR INSPECTION 有权
公开(公告)号：US20220214391A1
公开(公告)日：2022-07-07
申请号：US17604319
申请日：2020-04-03
申请人： Kabushiki Kaisha Nihon Micronics
发明人： Minoru SATO
IPC分类号： G01R31/26 , G01R1/073
摘要： A connecting device for inspection includes a probe head (30) configured to hold electric contacts (10) and optical contacts (20) such that tip ends of the respective contacts are exposed on a lower surface of the probe head (30) while proximal ends of the electric contacts (10) are exposed on an upper surface of the probe head and the optical contacts (20) are fixed to the probe head (30), and a transformer (40) including connecting wires (41) provided therein such that tip ends on one side of the connecting wires (41) electrically connected to the proximal ends of the electric contacts (10) exposed on the upper surface of the probe head (30) are arranged in a lower surface of the transformer (40) while the optical contacts (20) slidably penetrate the transformer (40). A positional relationship between the tip end of the respective electric contacts (10) and the tip end of the respective optical contacts (20) on the lower surface of the probe head (30) corresponds to a positional relationship between an electrical signal terminal and an optical signal terminal of a semiconductor device. The optical contacts (20) continuously penetrate the probe head (30) and the transformer (40).

5. 发明申请

US20220123358A1 SECONDARY BATTERY 有权
公开(公告)号：US20220123358A1
公开(公告)日：2022-04-21
申请号：US17422159
申请日：2020-01-30
申请人： Kabushiki Kaisha Nihon Micronics
发明人： Kazuyuki TSUNOKUNI , Juri OGASAWARA , Takashi TONOKAWA , Hiroyuki KATO
IPC分类号： H01M10/0562 , H01M4/525 , H01M4/1391 , H01M4/04
摘要： A technique of improving the performance of a secondary battery is provided. A secondary battery according to an embodiment includes a first electrode, a second electrode, a first layer disposed on the first electrode and including a first n-type oxide semiconductor, a second layer disposed on the first layer and including a second n-type oxide semiconductor material and a first insulating material, a third layer which is disposed on the second layer and is a solid electrolyte layer, and a fourth layer disposed on the third layer and including hexagonal Ni(OH)2 microcrystals.

6. 发明授权

US11249109B2 Electric connection device 有权
公开(公告)号：US11249109B2
公开(公告)日：2022-02-15
申请号：US16757292
申请日：2018-08-03
申请人： Kabushiki Kaisha Nihon Micronics
发明人： Mika Nasu
IPC分类号： G01R1/067 , G01R1/073
摘要： An electric connection device includes a probe (10) and a probe head (20). The probe (10) includes: a tubular barrel (11), a rod-like top-side plunger (121), and a rod-like bottom-side plunger (122). The top- and bottom-side plungers are connected to the barrel (11) with tips thereof exposed from respective open ends of the barrel (11). The probe head (2) includes guide plates (211 and 212) which are spaced apart from each other in the axial direction of the probe (10) and each include a through-hole through which a body of the barrel (11) penetrates. A protrusion (13) having an outer diameter greater than the body of the barrel (11) is provided on the circumference of the probe (10). The guide plates (211 and 212) include a support guide plate in which the through-hole has a diameter smaller than the outer diameter of the protrusion (13). The probe (10) is supported by the support guide plate with the top-side plunger (121) up such that the lower section of the protrusion (13) is in contact with the edge of the upper opening of the through-hole of the support guide plate.

7. 发明授权

US11245113B2 Secondary battery 有权
公开(公告)号：US11245113B2
公开(公告)日：2022-02-08
申请号：US16286362
申请日：2019-02-26
申请人： Kabushiki Kaisha Nihon Micronics
发明人： Takashi Tonokawa , Yutaka Kosaka , Kazuyuki Tsunokuni , Hikaru Takano , Shigefusa Chichibu , Kazunobu Kojima
IPC分类号： H01M4/52 , H01M10/38 , H01M4/62 , H01M10/36
摘要： A secondary battery includes: a first oxide semiconductor having a first conductivity type; a first charging layer disposed on the first oxide semiconductor layer, and composed by including a first insulating material and a second oxide semiconductor having the first conductivity type; a second charging layer disposed on the first charging layer; a third oxide semiconductor layer having a second conductivity type disposed on the second charging layer; and a hydroxide layer disposed between the first charging layer and the third oxide semiconductor layer, and containing a hydroxide of a metal constituting the third oxide semiconductor layer. The highly reliable secondary battery is capable of improving an energy density and increasing battery characteristics (electricity accumulation capacity).

8. 发明申请

US20220034821A1 CONNECTING DEVICE FOR INSPECTION 有权
公开(公告)号：US20220034821A1
公开(公告)日：2022-02-03
申请号：US17392214
申请日：2021-08-02
申请人： Kabushiki Kaisha Nihon Micronics
发明人： Minoru SATO
IPC分类号： G01N21/88 , G01N21/95 , H01L21/66
摘要： A connecting device for inspection includes optical probes, and a probe head including a plurality of guide plates. The probe head includes a first guide plate, and a second guide plate arranged movably with respect to the first guide plate in a radial direction of the penetration holes in a state in which the optical probes are inserted to the respective penetration holes. The probe head holds the optical probes by inner wall surfaces of the penetration holes of the first guide plate and inner wall surfaces of the penetration holes of the second guide plate in a state in which the positions of the central axes of the penetration holes of the first guide plate are shifted in the radial direction from the positions of the central axes of the penetration holes of the second guide plate.

9. 发明申请

US20210376548A1 Electrical Contactor and Method of Manufacturing Electrical Contactor 有权
公开(公告)号：US20210376548A1
公开(公告)日：2021-12-02
申请号：US17229324
申请日：2021-04-13
申请人： KABUSHIKI KAISHA NIHON MICRONICS
发明人： TOMOAKI KUGA
IPC分类号： H01R43/16
摘要： To provide a method of manufacturing an electrical contactor including a volute spring structure extending in upward and downward directions formed integrally using a single material, having mechanical simplicity and excellent functionality, and functioning as an electric circuit achieving connection without loss.
The present disclosure is intended for a method of manufacturing an electrical contactor made of a plate-like member having electrical conductivity, comprising: (1) a first step of forming the plate-like member into a barrel shape by winding the plate-like member in a spiral pattern; (2) a second step of compressing the plate-like member formed into the barrel shape from a vertical direction until the plate-like member assumes a volute shape with an upper spiral structure and a lower spiral structure overlapping each other; and (3) a third step of forming a volute-shaped electrical contactor by performing predetermined hardening treatment on the plate-like member temporarily assuming the volute shape as a result of the second step.

10. 发明申请

US20210364552A1 OPTICAL PROBE, OPTICAL PROBE ARRAY, OPTICAL PROBE CARD, AND METHOD OF MANUFACTURING OPTICAL PROBE 有权
公开(公告)号：US20210364552A1
公开(公告)日：2021-11-25
申请号：US17324740
申请日：2021-05-19
申请人： Kabushiki Kaisha Nihon Micronics
发明人： Michitaka OKUTA , Yuki SAITO , Jukiya FUKUSHI , Shou HARAKO
IPC分类号： G01R1/073 , G01R31/26 , G02B6/42
摘要： An optical probe includes a first region and a second region connected to have a continuous optical waveguide in which a transmission mode is a single mode. The first region connected to a tip-end surface opposed to an optical device includes a region in which a mode field diameter that is maximum at the tip-end surface is gradually decreased toward a boundary between the first region and the second region. The tip-end surface is a curved surface and has a radius of curvature set so that an advancing direction of an optical signal entering through the tip-end surface approximates in parallel to a central-axis direction of the optical waveguide.

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