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1. 发明申请

US20100158092A1 JITTER ADDITION APPARATUS AND TEST APPARATUS 失效
标题翻译：智能手机装置和测试装置
公开(公告)号：US20100158092A1
公开(公告)日：2010-06-24
申请号：US12629400
申请日：2009-12-02
申请人： Kenichi NAGATANI , Takayuki NAKAMURA
发明人： Kenichi NAGATANI , Takayuki NAKAMURA
IPC分类号： H04B17/00
CPC分类号： G01R31/31709
摘要： Provided is a jitter injection apparatus that injects jitter into a signal, comprising: a plurality of jitter injecting sections that are provided in series in a transmission path that propagates the signal; an output section that selects the signal that is passed from a jitter injecting section at a first stage through a designated jitter injecting section, and outputs the selected signal; and a plurality of branch-path jitter injecting sections that (i) are provided in a plurality of branch paths that propagate the signal output by each jitter injecting section from the transmission path to the output section and (ii) are relays having frequency characteristics of attenuating a high-frequency band more than a low-frequency band
摘要翻译：提供了一种将抖动注入到信号中的抖动注入装置，包括：在传播信号的传输路径中串联设置的多个抖动注入部分; 输出部，其通过指定的抖动注入部选择从第一级的抖动注入部通过的信号，并输出所选择的信号; 和多个分支路径抖动注入部分，（i）设置在将由每个抖动注入部分输出的信号从传输路径传播到输出部分的多个分支路径中，并且（ii）是具有频率特性比低频带衰减高频带

2. 发明申请

US20090041101A1 TEST APPARATUS 有权
标题翻译：测试仪器
公开(公告)号：US20090041101A1
公开(公告)日：2009-02-12
申请号：US11834688
申请日：2007-08-07
申请人： KENICHI NAGATANI
发明人： KENICHI NAGATANI
IPC分类号： H04B17/00
CPC分类号： G01R31/31709
摘要： A test apparatus includes a transmitting-side jitter measuring unit which measures a jitter of a transmission signal output from a transmitting circuit, a jitter applying unit which applies a jitter to the transmission signal and inputs the signal to a receiving circuit, a jitter range measuring unit which determines whether the logical value of the transmission signal detected by the receiving circuit is equal to a preset expectation value for each amplitude of the jitter applied to the transmission signal by the jitter applying unit, and measures the range of jitter amplitudes within which the logical value of the transmission signal is equal to the expectation value, and a jitter tolerance measuring unit which calculates jitter tolerance of the receiving circuit based on the jitter of the transmission signal measured by the transmitting-side jitter measuring unit and the range of jitter amplitudes measured by the jitter range measuring unit.
摘要翻译：一种测试装置，包括测量从发送电路输出的发送信号的抖动的发送侧抖动测量单元，向发送信号施加抖动并将该信号输入到接收电路的抖动施加单元，抖动范围测量单元，其确定由所述接收电路检测到的所述发送信号的逻辑值是否等于由所述抖动施加单元施加到所述发送信号的抖动的每个幅度的预设期望值，并且测量所述抖动幅度的范围，传输信号的逻辑值等于期望值，抖动容差测量单元，其基于由发送侧抖动测量单元测量的发送信号的抖动和抖动幅度的范围来计算接收电路的抖动容限由抖动范围测量单位测量。

3. 发明授权

US5399850A Document reading apparatus, having a body unit for holding apparatus components 失效
标题翻译：文件读取装置，具有用于保持装置部件的主体单元
公开(公告)号：US5399850A
公开(公告)日：1995-03-21
申请号：US997444
申请日：1992-12-28
申请人： Kenichi Nagatani , Keitoku Morita , Hiroyuki Okushiba , Shinichi Kojima , Ryoichi Sakaguchi
发明人： Kenichi Nagatani , Keitoku Morita , Hiroyuki Okushiba , Shinichi Kojima , Ryoichi Sakaguchi
IPC分类号： H04N1/028 , G06K7/14 , H04N1/03 , H04N1/031 , H01J40/14 , H01J3/14
CPC分类号： H04N1/0306 , G06K7/14 , H04N1/03 , H04N1/0318 , H04N1/1934 , H04N3/1581 , H04N2201/02493 , H04N2201/03112 , H04N2201/03187
摘要： A document reading apparatus comprises a light transmitting plate in contact with a document, a light source to light the document, a plurality of lenses arranged in line at a specified interval to image light reflected from the document and form a scaled-down document image, a plurality of semiconductor chips having a multiplicity of photoelectric transducer elements arranged in line respectively corresponding to each lens in order to receive the document image, a circuit wiring base plate on which semiconductor chips are placed, and a body unit to hold the light transmitting plate, the light source, and the circuit wiring base plate. The document image is formed in a scaled-down state by the plurality of lenses, and received by the plurality of semiconductor chips respectively corresponding to each lens. Since the document image is formed in a scaled-down state, it is not necessary to arrange the photoelectric transducer elements continuously between adjacent semiconductor chips. Therefore, a clearance can be kept between the semiconductor chips, and it is not necessary to arrange the photoelectric transducer elements substantially with the same length as the document, thereby a document reading apparatus which is handled as a part is constructed.
摘要翻译：文件读取装置包括与原稿接触的透光板，用于点亮原稿的光源，以指定间隔排成一行的多个透镜，以对从文档反射的光进行成像并形成缩小的文档图像，多个半导体芯片，具有多个分别对应于每个透镜的光电换能器元件以便接收原稿图像，半导体芯片放置在其上的电路布线基板和用于保持透光板的主体单元，光源和电路布线基板。原稿图像通过多个透镜以缩小状态形成，并被分别对应于每个透镜的多个半导体芯片接收。由于原稿图像形成为按比例缩小状态，因此不需要在相邻的半导体芯片之间连续配置光电换能器元件。因此，可以在半导体芯片之间保持间隙，并且不需要将光电传感器元件基本上与文件的长度大致相同，从而构成作为一部分处理的原稿读取装置。

4. 发明授权

US08090009B2 Test apparatus 有权
标题翻译：测试仪器
公开(公告)号：US08090009B2
公开(公告)日：2012-01-03
申请号：US11834688
申请日：2007-08-07
申请人： Kenichi Nagatani
发明人： Kenichi Nagatani
IPC分类号： H04B3/46 , H04B1/38 , H04L7/00 , H03D3/24
CPC分类号： G01R31/31709
摘要： A test apparatus includes a transmitting-side jitter measuring unit which measures a jitter of a transmission signal output from a transmitting circuit, a jitter applying unit which applies a jitter to the transmission signal and inputs the signal to a receiving circuit, a jitter range measuring unit which determines whether the logical value of the transmission signal detected by the receiving circuit is equal to a preset expectation value for each amplitude of the jitter applied to the transmission signal by the jitter applying unit, and measures the range of jitter amplitudes within which the logical value of the transmission signal is equal to the expectation value, and a jitter tolerance measuring unit which calculates jitter tolerance of the receiving circuit based on the jitter of the transmission signal measured by the transmitting-side jitter measuring unit and the range of jitter amplitudes measured by the jitter range measuring unit.
摘要翻译：一种测试装置，包括测量从发送电路输出的发送信号的抖动的发送侧抖动测量单元，向发送信号施加抖动并将该信号输入到接收电路的抖动施加单元，抖动范围测量单元，其确定由所述接收电路检测到的所述发送信号的逻辑值是否等于由所述抖动施加单元施加到所述发送信号的抖动的每个幅度的预设期望值，并且测量所述抖动幅度的范围，传输信号的逻辑值等于期望值，抖动容差测量单元，其基于由发送侧抖动测量单元测量的发送信号的抖动和抖动幅度的范围来计算接收电路的抖动容限由抖动范围测量单位测量。

5. 发明申请

US20100283480A1 TEST APPARATUS, TEST METHOD, AND DEVICE 审中-公开
标题翻译：测试装置，测试方法和设备
公开(公告)号：US20100283480A1
公开(公告)日：2010-11-11
申请号：US12767749
申请日：2010-04-26
申请人： Kenichi NAGATANI , Masahiro ISHIDA
发明人： Kenichi NAGATANI , Masahiro ISHIDA
IPC分类号： H01H31/02
CPC分类号： G01R31/31709
摘要： Provided is a test apparatus that tests a device under test, wherein the device under test includes an internal circuit that generates a plurality of internal clocks having different phases based on a reference clock provided thereto, selects from among the internal clocks an internal clock having a predetermined relative phase with respect to an input signal having a frequency substantially equal to that of the internal clocks, and samples the input signal according to the selected internal clock. The test apparatus comprises a selection control section that fixes the internal clock selected by the internal circuit; a phase control section that, with the selection of the internal clock being fixed by the selection control section, sequentially shifts the phase of the internal clock by inputting the reference clock to the device under test while sequentially shifting the phase of the reference clock outside of the device under test; and a measuring section that measures a characteristic of at least one of the input signal and the internal circuit, based on the sampling result of the internal circuit.
摘要翻译：提供了一种测试被测器件的测试装置，其中被测器件包括内部电路，该内部电路基于提供的参考时钟产生具有不同相位的多个内部时钟，从内部时钟中选择具有相对于具有与内部时钟的频率基本相等的频率的输入信号的预定相对相位，并且根据所选择的内部时钟对输入信号进行采样。测试装置包括：选择控制部分，其固定由内部电路选择的内部时钟; 相位控制部，通过选择控制部选择了内部时钟，通过将基准时钟输入到被测设备，依次移位内部时钟的相位，同时依次将基准时钟的相位偏移到被测设备; 以及基于内部电路的采样结果来测量输入信号和内部电路中的至少一个的特性的测量部。

6. 发明申请

US20100244881A1 TRANSMISSION CHARACTERISTICS MEASUREMENT APPARATUS, TRANSMISSION CHARACTERISTICS MEASUREMENT METHOD, AND ELECTRONIC DEVICE 有权
标题翻译：传输特性测量装置，传输特性测量方法和电子设备
公开(公告)号：US20100244881A1
公开(公告)日：2010-09-30
申请号：US12413604
申请日：2009-03-30
申请人： Masahiro ISHIDA , Kenichi NAGATANI
发明人： Masahiro ISHIDA , Kenichi NAGATANI
IPC分类号： G01R31/26
CPC分类号： G01R27/28 , H04L1/244 , H04L25/022 , H04L27/01
摘要： Provided is a transfer characteristic measurement apparatus that measures a transfer characteristic of a circuit under test between input and output, comprising a test signal input section that generates a test signal by adding together a carrier signal having a prescribed frequency and an additional signal having a frequency that differs from the prescribed frequency, and inputs the test signal to the circuit under test; and a transfer characteristic measuring section that measures the transfer characteristic of the circuit under test at the frequency of the additional signal based on a result from a measurement of an output signal output by the circuit under test. The circuit under test may be formed on a semiconductor chip. The circuit under test may correct a signal input to the semiconductor chip, and outputs the corrected signal. The semiconductor chip may further include a sampling circuit that samples the output signal of the circuit under test at the frequency of the carrier signal.
摘要翻译：提供了一种传感特性测量装置，其测量输入和输出之间的被测电路的传输特性，包括测试信号输入部分，其通过将具有规定频率的载波信号与具有规定频率的附加信号相加来生成测试信号与规定频率不同，并将测试信号输入到被测电路; 以及传输特性测量部分，其基于由被测电路输出的输出信号的测量结果，在附加信号的频率下测量被测电路的传输特性。被测电路可以形成在半导体芯片上。被测电路可以校正输入到半导体芯片的信号，并输出校正信号。半导体芯片还可以包括采样电路，其以载波信号的频率对待测电路的输出信号进行采样。

7. 发明申请

US20080294952A1 TEST APPARATUS AND DEVICE 有权
标题翻译：测试装置和装置
公开(公告)号：US20080294952A1
公开(公告)日：2008-11-27
申请号：US12125936
申请日：2008-05-23
申请人： KENICHI NAGATANI , ATSUO SAWARA , HIROSHI NAKAGAWA
发明人： KENICHI NAGATANI , ATSUO SAWARA , HIROSHI NAKAGAWA
IPC分类号： G11C29/08 , G06F11/26
CPC分类号： G11C29/56 , G01R31/31905 , G01R31/31935 , G11C29/56008 , G11C29/56016 , G11C2029/5602
摘要： It is aimed to efficiently test devices that can transfer data at a very high bit rate. A test apparatus for testing a device under test includes a capture memory that stores thereon an output pattern received from the device under test, a header detecting section that reads the output pattern from the capture memory and detects a portion matching a predetermined header pattern in the output pattern, and a judging section that judges whether the output pattern is acceptable based on a result of comparison between a pattern, in the output pattern, which starts with the portion matching the predetermined header pattern and a corresponding expected value pattern.
摘要翻译：旨在有效地测试可以以非常高的比特率传输数据的设备。一种用于测试被测设备的测试装置，包括：捕获存储器，存储从被测设备接收的输出模式;标题检测部分，从捕获存储器读取输出模式，并检测与所述捕获存储器中的预定标题模式匹配的部分; 输出模式，以及判断部，其基于从与所述预定标题图案匹配的部分开始的输出图案中的图案与对应的期望值图案之间的比较结果，判断输出图案是否可以接受。

8. 发明授权

US08145965B2 Test apparatus for testing a device under test and device for receiving a signal 有权
标题翻译：用于测试被测设备的测试装置和用于接收信号的装置
公开(公告)号：US08145965B2
公开(公告)日：2012-03-27
申请号：US12125936
申请日：2008-05-23
申请人： Kenichi Nagatani , Atsuo Sawara , Hiroshi Nakagawa
发明人： Kenichi Nagatani , Atsuo Sawara , Hiroshi Nakagawa
IPC分类号： G11C29/00 , G01R31/28 , G06F11/00
CPC分类号： G11C29/56 , G01R31/31905 , G01R31/31935 , G11C29/56008 , G11C29/56016 , G11C2029/5602
摘要： A test apparatus for testing a device under test includes a capture memory that stores thereon an output pattern received from the device under test, a header detecting section that reads the output pattern from the capture memory and detects a portion matching a predetermined header pattern in the output pattern, and a judging section that judges whether the output pattern is acceptable based on a result of comparison between a pattern, in the output pattern, which starts with the portion matching the predetermined header pattern and a corresponding expected value pattern.
摘要翻译：一种用于测试被测设备的测试装置，包括：捕获存储器，存储从被测设备接收的输出模式;标题检测部分，从捕获存储器读取输出模式，并检测与所述捕获存储器中的预定标题模式匹配的部分; 输出模式，以及判断部，其基于从与所述预定标题图案匹配的部分开始的输出图案中的图案与对应的期望值图案之间的比较结果，判断输出图案是否可以接受。

9. 发明授权

US07801205B2 Jitter injection circuit, electronics device, and test apparatus 失效
标题翻译：抖动注入电路，电子设备和测试仪器
公开(公告)号：US07801205B2
公开(公告)日：2010-09-21
申请号：US11834689
申请日：2007-08-07
申请人： Kenichi Nagatani
发明人： Kenichi Nagatani
IPC分类号： H04B3/46
CPC分类号： G01R31/31709
摘要： Provided is a jitter injection circuit that injects jitter having a predetermined amplitude to a transmission signal outputted from a transmission circuit, and inputs the resulting transmission signal to a reception circuit, the jitter injection circuit including: a retiming section that receives the transmission signal from the transmission circuit, and performs retiming on an edge timing of the received transmission signal in accordance with a given clock signal; and a jitter injection section that injects the jitter having the predetermined amplitude to the transmission signal outputted from the retiming section, and inputs the resulting transmission signal to the reception circuit.
摘要翻译：提供了一种抖动注入电路，其向从发送电路输出的发送信号注入具有预定幅度的抖动，并将所得到的发送信号输入到接收电路，所述抖动注入电路包括：重定时部，其接收来自所述发送信号的发送信号并根据给定的时钟信号对所接收的发送信号的边缘定时进行重新定时; 以及抖动注入部分，其将具有预定幅度的抖动注入到从重新定时部分输出的发送信号，并将所得到的发送信号输入到接收电路。

10. 发明申请

US20090041102A1 JITTER INJECTION CIRCUIT, ELECTRONICS DEVICE, AND TEST APPARATUS 失效
标题翻译：抖动注射电路，电子设备和测试装置
公开(公告)号：US20090041102A1
公开(公告)日：2009-02-12
申请号：US11834689
申请日：2007-08-07
申请人： KENICHI NAGATANI
发明人： KENICHI NAGATANI
IPC分类号： H04B17/00
CPC分类号： G01R31/31709
摘要： Provided is a jitter injection circuit that injects jitter having a predetermined amplitude to a transmission signal outputted from a transmission circuit, and inputs the resulting transmission signal to a reception circuit, the jitter injection circuit including: a retiming section that receives the transmission signal from the transmission circuit, and performs retiming on an edge timing of the received transmission signal in accordance with a given clock signal; and a jitter injection section that injects the jitter having the predetermined amplitude to the transmission signal outputted from the retiming section, and inputs the resulting transmission signal to the reception circuit.
摘要翻译：提供了一种抖动注入电路，其向从发送电路输出的发送信号注入具有预定幅度的抖动，并将所得到的发送信号输入到接收电路，所述抖动注入电路包括：重定时部，其接收来自所述发送信号的发送信号并根据给定的时钟信号对所接收的发送信号的边缘定时进行重新定时; 以及抖动注入部分，其将具有预定幅度的抖动注入到从重新定时部分输出的发送信号，并将所得到的发送信号输入到接收电路。

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