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    • 9. 发明授权
    • System and method for recovery from memory errors in a medical device
    • 用于从医疗设备中的内存错误中恢复的系统和方法
    • US08452403B2
    • 2013-05-28
    • US12911318
    • 2010-10-25
    • Kenneth P. HoymeAaron Larson
    • Kenneth P. HoymeAaron Larson
    • A61N1/00
    • A61N1/08G06F11/073G06F11/0736G06F11/076
    • A system comprising an implantable medical device that comprises a memory circuit, a radiation detector circuit configured to detect a condition correlative to a high-energy radiation level that exceeds a background radiation level, and a controller circuit. The control circuit checks memory locations for errors using a first rate of error checking per time period during a normal operation mode and, in response to the radiation detector circuit indicating a high-energy radiation level, initiates a memory scrubbing mode, wherein the memory scrubbing mode has an increased rate of error checking substantially all memory locations per time period in the memory circuit to check for any errors and correct any such errors.
    • 一种包括可植入医疗装置的系统,包括存储器电路,被配置为检测与超过背景辐射水平的高能量辐射水平相关的状况的辐射检测器电路和控制器电路。 控制电路在正常操作模式期间使用每个时间周期的第一误差检验速率来检查存储器位置,并且响应于指示高能量辐射水平的辐射检测器电路,启动存储器擦除模式,其中存储器擦除 模式在存储器电路中每个时间周期的基本上所有存储器位置的错误检测率都增加,以检查任何错误并纠正任何这样的错误。