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    • 2. 发明授权
    • Semiconductor booster circuit having cascaded MOS transistors
    • 具有级联MOS晶体管的半导体升压电路
    • US07102422B1
    • 2006-09-05
    • US08423089
    • 1995-04-18
    • Kikuzo SawadaYoshikazu Sugawara
    • Kikuzo SawadaYoshikazu Sugawara
    • G05F3/02
    • H02M3/073H02M2003/075H02M2003/076H02M2003/078
    • The semiconductor booster circuit includes a plurality of stages, each of which has a MOS transistor and two capacitors. The MOS transistor, having a drain, a source and a gate, is formed in a well of a substrate portion. One capacitor has a terminal connected to the drain of the MOS transistor, while the other capacitor has a terminal connected to the gate of the MOS transistor. A first clock signal generating means generate a first clock signal via another terminal of one capacitor. A second clock signal generating mean s generate a second clock signal, with a larger amplitude than a power supply voltage, via another terminal of another capacitor. The plurality of stages are cascaded together, and in each of the stages the source of the MOS transistor is electrically connected to the well in which the transistor is formed, while the wells are electrically insulated from each other.
    • 半导体升压电路包括多个级,其中每一级具有MOS晶体管和两个电容器。 具有漏极,源极和栅极的MOS晶体管形成在衬底部分的阱中。 一个电容器具有连接到MOS晶体管的漏极的端子,而另一个电容器具有连接到MOS晶体管的栅极的端子。 第一时钟信号发生装置经由一个电容器的另一个端子产生第一时钟信号。 第二时钟信号产生装置s通过另一个电容器的另一端产生具有比电源电压更大的振幅的第二时钟信号。 多个级级联在一起,并且在每个级中,MOS晶体管的源极电连接到形成晶体管的阱,而阱彼此电绝缘。
    • 3. 发明授权
    • Non-volatile semiconductor memory device
    • 非易失性半导体存储器件
    • US5557572A
    • 1996-09-17
    • US307251
    • 1994-09-16
    • Kikuzo SawadaHiroshi Mawatari
    • Kikuzo SawadaHiroshi Mawatari
    • G11C16/10G11C16/16G11C7/00G11C11/34
    • G11C16/10G11C16/16
    • An electrically alterable non-volatile semiconductor memory device includes a plurality of electrically alterable memory cells arranged in columns and rows, a decoder circuit which selects at least one of the plurality of memory cells and does not select others, a writing circuit for writing a selected data in the selected memory cell through the decoder circuit, a reading circuit for reading a data stored in the selected memory cell through the decoder circuit, a comparing circuit for holding the data stored in the selected memory cell and data to be written in the memory cell and comparing both the data with each other, a judging circuit for judging whether the stored data in the selected memory cell is required to be altered or not on the basis of the comparison result of the comparing circuit, and an alteration control circuit for performing altering of the data of the memory cell when stored data is required to be altered on the basis of the judgment result of the judging circuit.
    • 一种电可更改的非易失性半导体存储器件包括以列和行排列的多个电可更改的存储单元,选择多个存储单元中的至少一个并且不选择其它存储单元的解码器电路,用于写入所选择的写入电路 通过解码器电路在所选择的存储单元中的数据,用于通过解码器电路读取存储在所选存储单元中的数据的读取电路,用于保存存储在所选存储单元中的数据和要写入存储器的数据的比较电路 并且比较两个数据;判断电路,用于根据比较电路的比较结果来判断所选择的存储单元中存储的数据是否需要改变;以及变更控制电路,用于执行 当存储数据需要根据判断电路的判断结果进行改变时,更改存储器单元的数据。
    • 5. 发明授权
    • Non-volatile semiconductor memory device and a method of using the same
    • 非挥发性半导体存储器件及其使用方法
    • US5491656A
    • 1996-02-13
    • US231684
    • 1994-04-25
    • Kikuzo Sawada
    • Kikuzo Sawada
    • G11C16/10G11C16/16G11C11/34
    • G11C16/16G11C16/10
    • An electrically alterable non-volatile semiconductor memory. The memory cells are formed in a matrix of columns and rows. A row decoder and column decoder are provided to select one of the row lines and column lines. Mode selection means are provided for selecting a writing mode, a first erasing mode for erasing a row of memory cells, a second erasing mode for erasing a selected memory cell on a bit basis, and a reading mode for reading the contents of each memory cell. The individual erasing modes reduce the overall power consumption of the device, while permitting block erasing as well as individual cell erasing.
    • 电可变非易失性半导体存储器。 存储单元以列和行的矩阵形成。 提供行解码器和列解码器以选择行线和列线之一。 模式选择装置被提供用于选择写入模式,用于擦除一行存储单元的第一擦除模式,用于以位为单位擦除所选择的存储单元的第二擦除模式和用于读取每个存储单元的内容的读取模式 。 单独的擦除模式降低了设备的总体功耗,同时允许块擦除以及单独的单元擦除。
    • 8. 发明授权
    • Non-volatile semiconductor memory device capable of storing multi-value
data in each memory cell
    • 能够在每个存储单元中存储多值数据的非易失性半导体存储器件
    • US5412601A
    • 1995-05-02
    • US112997
    • 1993-08-30
    • Kikuzo SawadaToshio Wada
    • Kikuzo SawadaToshio Wada
    • G11C11/56
    • G11C11/5642G11C11/5621G11C11/5628G11C11/5635G11C19/00G11C2211/5642G11C8/04
    • An electrically erasable non-volatile semiconductor memory device comprising a plurality of row lines and column lines, a plurality of memory cells connected in a matrix to the plurality of row lines and column lines, a selection circuit for selecting a desired one of the plurality of memory cells, and write-control circuit for writing data into the plurality of memory cells. The write-control circuit is adapted to preset at least four voltage signals having different voltage values, and to select one of four voltage signals according to a data signal externally applied thereto and applying the selected voltage signal to the selected memory cell. Also included is read-control circuit for reading out data written into the selected memory cell and converting the data read-out from the selected memory cell into a data signal corresponding to one of the four voltage signals.
    • 一种电可擦除非易失性半导体存储器件,包括多条行线和列线,多个存储单元,以矩阵方式连接到多条行线和列线;选择电路,用于选择多条行 存储单元和用于将数据写入多个存储单元的写控制电路。 写入控制电路适于预置具有不同电压值的至少四个电压信号,并且根据从外部施加的数据信号选择四个电压信号中的一个,并将所选择的电压信号施加到所选存储单元。 还包括用于读出写入所选择的存储单元中的数据并将从所选存储单元读出的数据转换成与四个电压信号之一相对应的数据信号的读控制电路。