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1. 发明申请

US20080270854A1 SYSTEM AND METHOD FOR RUNNING TEST AND REDUNDANCY ANALYSIS IN PARALLEL 审中-公开
标题翻译：并行运行测试和冗余分析的系统和方法
公开(公告)号：US20080270854A1
公开(公告)日：2008-10-30
申请号：US11739599
申请日：2007-04-24
申请人： Kristopher Kopel
发明人： Kristopher Kopel
IPC分类号： G11C29/52
CPC分类号： G11C29/56 , G11C29/56004 , G11C29/56008 , G11C29/72
摘要： A memory redundancy analyzing apparatus having a tester, a queue, and a redundancy analyzer is provided. The tester includes testing portions for different types of fails, and each of the testing portions performs multiple tests on the memory locations and outputs fail information for at least a part of the memory device. The queue stores the fail information. The redundancy analyzer processes the fails using the fail information and produces a plurality of repair solutions. The types of fails include must fails and sparse fails. The fail information is transmitted to the queue, and the fail information includes at least a part of the fail information for the entire memory device. The tester can operate asynchronously from the redundancy analyzer.
摘要翻译：提供具有测试器，队列和冗余分析器的存储器冗余分析设备。测试器包括用于不同类型的故障的测试部分，并且每个测试部分对存储器位置执行多个测试，并输出至少一部分存储器设备的故障信息。队列存储失败信息。冗余分析器使用失败信息处理故障并产生多个修复解决方案。失败的类型包括必须失败，稀疏失败。故障信息被发送到队列，并且故障信息包括整个存储设备的故障信息的至少一部分。测试仪可以从冗余分析仪异步运行。

2. 发明申请

US20090265588A1 SYSTEM AND METHOD FOR RUNNING TEST AND REDUNDANCY ANALYSIS IN PARALLEL 有权
标题翻译：并行运行测试和冗余分析的系统和方法
公开(公告)号：US20090265588A1
公开(公告)日：2009-10-22
申请号：US12490657
申请日：2009-06-24
申请人： Kristopher Kopel
发明人： Kristopher Kopel
IPC分类号： G11C29/00 , G06F11/16
CPC分类号： G11C29/56 , G11C29/56004 , G11C29/56008 , G11C29/72
摘要： A memory redundancy analyzing apparatus having a tester, a queue, and a redundancy analyzer is provided. The tester includes testing portions for different types of fails, and each of the testing portions performs multiple tests on the memory locations and outputs fail information for at least a part of the memory device. The queue stores the fail information. The redundancy analyzer processes the fails using the fail information and produces a plurality of repair solutions. The types of fails include must fails and sparse fails. The fail information is transmitted to the queue, and the fail information includes at least a part of the fail information for the entire memory device. The tester can operate asynchronously from the redundancy analyzer.
摘要翻译：提供具有测试器，队列和冗余分析器的存储器冗余分析设备。测试器包括用于不同类型的故障的测试部分，并且每个测试部分对存储器位置执行多个测试，并输出至少一部分存储器设备的故障信息。队列存储失败信息。冗余分析器使用失败信息处理故障并产生多个修复解决方案。失败的类型包括必须失败，稀疏失败。故障信息被发送到队列，并且故障信息包括整个存储设备的故障信息的至少一部分。测试仪可以从冗余分析仪异步运行。

3. 发明授权

US08086916B2 System and method for running test and redundancy analysis in parallel 有权
标题翻译：并行运行测试和冗余分析的系统和方法
公开(公告)号：US08086916B2
公开(公告)日：2011-12-27
申请号：US12490657
申请日：2009-06-24
申请人： Kristopher Kopel
发明人： Kristopher Kopel
IPC分类号： G11C29/00
CPC分类号： G11C29/56 , G11C29/56004 , G11C29/56008 , G11C29/72
摘要： A memory redundancy analyzing apparatus having a tester, a queue, and a redundancy analyzer is provided. The tester includes testing portions for different types of fails, and each of the testing portions performs multiple tests on the memory locations and outputs fail information for at least a part of the memory device. The queue stores the fail information. The redundancy analyzer processes the fails using the fail information and produces a plurality of repair solutions. The types of fails include must fails and sparse fails. The fail information is transmitted to the queue, and the fail information includes at least a part of the fail information for the entire memory device. The tester can operate asynchronously from the redundancy analyzer.
摘要翻译：提供具有测试器，队列和冗余分析器的存储器冗余分析设备。测试器包括用于不同类型的故障的测试部分，并且每个测试部分对存储器位置执行多个测试，并输出至少一部分存储器设备的故障信息。队列存储失败信息。冗余分析器使用失败信息处理故障并产生多个修复解决方案。失败的类型包括必须失败，稀疏失败。故障信息被发送到队列，并且故障信息包括整个存储设备的故障信息的至少一部分。测试仪可以从冗余分析仪异步运行。

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