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    • 1. 发明授权
    • Measuring thermal properties of layered structure in situ
    • 测量原位分层结构的热性能
    • US09347898B1
    • 2016-05-24
    • US13962314
    • 2013-08-08
    • Robert E. SmithMark A. Hepokoski
    • Robert E. SmithMark A. Hepokoski
    • G01N25/18G01K17/00
    • G01N25/18
    • An in situ method for deriving the thermal properties of a layered structure represents physical layers by effective thermal layers. The method requires access to only one side of a structure and performs a series of tests wherein a periodic heat flux is applied to the surface of the structure. Each test employs a unique frequency, which is associated with an effective thermal layer of the structure. During the tests the temperature of the surface is monitored and a record of transient temperature is kept. A thermal model of effective layers is created based on the number of tests/frequencies available. The values of the applied heat fluxes are incorporated into this thermal model of effective layers. An optimization technique is used to find the thermal capacity and thermal resistance of the effective layers by best matching the predicted response to that of the measured transient temperature response.
    • 用于导出层状结构的热性质的原位方法通过有效的热层表示物理层。 该方法仅需要访问结构的一侧,并执行一系列测试,其中周期性热通量被施加到结构的表面。 每个测试采用独特的频率,其与结构的有效热层相关联。 在测试期间,监测表面的温度并保持瞬态温度记录。 基于可用的测试/频率数量创建有效层的热模型。 所应用的热通量的值被并入到有效层的热模型中。 使用优化技术通过将预测响应与测量的瞬态温度响应的预测响应最佳匹配来找到有效层的热容量和热阻。