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1. 发明申请

US20220301137A1 IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND INSPECTION APPARATUS 有权
公开(公告)号：US20220301137A1
公开(公告)日：2022-09-22
申请号：US17697972
申请日：2022-03-18
申请人： NIDEC READ CORPORATION
发明人： Toshihide Matsukawa , Kenichi Akasaka , Hironori Nakamura , Masayuki Tsujimoto
IPC分类号： G06T7/00 , G06T5/00
摘要： An image processing unit including: a pad region extraction unit that executes pad region extraction processing of extracting a substantially rectangular pad region surrounding a plurality of pads from an image of an inspection target object; an imaginary straight line setting unit that executes imaginary straight line setting processing of setting an imaginary first straight line parallel to a side extending in an X direction of the pad region and setting an imaginary second straight line parallel to a side extending in a Y direction of the pad; and a reference point setting unit that executes reference point setting processing of setting an intersection between the first straight line and the second straight line as the reference point.

2. 发明申请

US20220178987A1 INSPECTION JIG, AND INSPECTION DEVICE 有权
公开(公告)号：US20220178987A1
公开(公告)日：2022-06-09
申请号：US17601086
申请日：2020-03-27
申请人： NIDEC READ CORPORATION
发明人： Minoru KATO , Makoto FUJINO
IPC分类号： G01R31/28 , G01R1/073 , G01R1/067
摘要： In various examples, an inspection jig includes a plate-shaped insulating member having a recess; a first board having a first electrode; and a conducting wire electrically connected to a contact terminal. The insulating member is provided with a through hole penetrating a bottom portion of the recess. One end portion of the conducting wire is disposed in the through hole. The other end of the conducting wire is connected to the first electrode.

3. 发明申请

US20220137094A1 INSPECTION JIG 有权
公开(公告)号：US20220137094A1
公开(公告)日：2022-05-05
申请号：US17432114
申请日：2020-02-20
申请人： NIDEC READ CORPORATION
发明人： Michio KAIDA
IPC分类号： G01R1/073
摘要： An inspection jig includes contact terminals and a pitch conversion unit electrically connected to the contact terminals and configured to convert a first pitch between adjacent two of the contact terminals into a second pitch different from the first pitch. The contact terminals each include a tubular body that extends in an axial direction of the contact terminal and is electrically conductive, and a conductor that is electrically conductive and has a stick shape. The tubular body includes a spring portion that has a helical shape along a peripheral surface of the tubular body. The conductor includes an uninserted portion that protrudes from the tubular body toward a first side in the axial direction, and an inserted portion that is disposed in the tubular body and is fixed to a first axial end portion of the tubular body. The pitch conversion unit includes a board portion and a protruding portion.

4. 发明申请

US20210364553A1 INSPECTION JIG, INSPECTION DEVICE, AND CONTACT TERMINAL 有权
公开(公告)号：US20210364553A1
公开(公告)日：2021-11-25
申请号：US17043733
申请日：2019-08-08
申请人： NIDEC-READ CORPORATION
发明人： Norihiro OTA , Sukkwi Kim
IPC分类号： G01R1/073 , G01R1/067
摘要： When a load necessary for inspection is applied to a cylindrical body in the axial direction thereof, an end of the first bar-like main body is located closer to the other end side of the cylindrical body than one end of a support portion in a support member that supports the body portion, an end of the second bar-like main body is located closer to one end side of the cylindrical body than the other end of the support portion, the body portion is located in the entire portion where the support portion is located, and a radial distance between the outer peripheral surface of the axial central portion of at least one of the first spring portion and the second spring portion and the support member is larger than the distance between the body portion and the support portion.

5. 发明授权

US10761654B2 Circuit board inspection device and circuit board inspection method 有权
公开(公告)号：US10761654B2
公开(公告)日：2020-09-01
申请号：US15522790
申请日：2015-08-07
申请人： NIDEC-READ CORPORATION
发明人： Tadashi Takahashi , Toshihisa Hibarino , Mutsuhiro Honda
IPC分类号： G06F3/041 , G06F3/044 , G01R31/28 , G01R27/26 , G06F3/045 , G01R27/02
摘要： A measuring process unit for executing a measuring process of, in correspondence with a plurality of combinations obtained by respectively combining a plurality of connection terminals Tx and a plurality of connection terminals Ty, and in respect of the connection terminals Tx, Ty corresponding to each of the combinations, supplying an AC voltage SA to the connection terminals Ty by means of an AC current source 2 and detecting electric current flowing in the connection terminals Tx by means of an ammeter 3, to thereby acquire currents corresponding to each of the combinations; and a calculating unit for executing a calculating process of, based on the size of the currents detected by the ammeter 3 in the measuring process and on information indicating the currents' phases, calculating capacitance and resistance values corresponding to each of the combinations.

6. 发明授权

US10760895B2 Length measurement device 有权
公开(公告)号：US10760895B2
公开(公告)日：2020-09-01
申请号：US16335267
申请日：2017-09-26
申请人： Nidec-Read Corporation
发明人： Tatsufumi Kusuda
IPC分类号： G01B11/02 , G01B11/14 , G01B11/25 , G01B21/04 , G03F9/00 , G06T1/00 , G06T7/00
摘要： A length measurement device includes: a placement table; cameras imaging images of imaging ranges including target points; first marks within the imaging ranges; a reference position storage unit storing positions of the first marks on a placement surface as first mark reference positions; an image position acquisition unit acquiring, on the basis of the imaged images of the cameras, the target image positions of the target points in the imaged images and the first mark image positions of the first marks in the imaged images; a target position acquisition unit determining positions of the target points on the placement surface on the basis of the target image positions and first mark image positions in the imaged images and the first mark reference positions on the placement surface; and a length acquisition unit determining, on the basis of positions of the target points, the length of a portion to have the length thereof measured.

7. 外观设计

USD894025S1 Electric characteristic measuring probe 有权
公开(公告)号：USD894025S1
公开(公告)日：2020-08-25
申请号：US29670517
申请日：2018-11-16
申请人： Nidec-Read Corporation , SV Probe Technology Taiwan Co., Ltd.
设计人： Michio Kaida , Huei Che Yu

8. 发明授权

US10678385B2 Inspecting apparatus 有权
公开(公告)号：US10678385B2
公开(公告)日：2020-06-09
申请号：US15680272
申请日：2017-08-18
申请人： NIDEC-READ CORPORATION
发明人： Koji Sakamoto , Toshihide Matsukawa , Koji Iwami , Shigeki Fujita , Osamu Hikita
IPC分类号： G06F3/044 , G06F11/22 , G06F3/0354 , G06F3/041
摘要： An inspection apparatus is provided with a holder configured to set an inspection target thereon, the inspection target configured to detect a contact position on the inspection target touched by a human finger; pseudo finger(s) configured to be detected as the human finger upon contact with the inspection target; a positioner configured to move the pseudo finger(s) relative to the inspection target and to change the contact position of the pseudo finger(s) relative to the inspection target; a memory configured to store, respectively, a value of a pressing force in a range of pressing forces said range including a zero pressing force for each of the pseudo finger(s) on the inspection target; a controller configured to regulate the pressing force for pseudo finger(s) of the pseudo finger(s) based on the respective value; and a sensor configured to acquire an electric signal output from the inspection target.

9. 发明授权

US10175284B2 Circuit board testing apparatus and circuit board testing method 有权
公开(公告)号：US10175284B2
公开(公告)日：2019-01-08
申请号：US14876846
申请日：2015-10-07
申请人： NIDEC-READ CORPORATION
发明人： Munehiro Yamashita
IPC分类号： G01R31/02 , G01R31/28
摘要： In a circuit board testing apparatus for performing a four-terminal measurement method on a wiring pattern formed of a plurality of wires on a circuit board, a control part connects in series contact probes to be connected to upstream-side voltage detection terminals or downstream-side voltage detection terminals, via connection terminals, allows a power supply part to apply power between the test points with which the contact probes connected in series are in contact, allows a voltage detection part to detect a voltage between the test points, and makes a determination as to conductive contact states of the contact probes with the test points, based on the detected voltage.

10. 发明申请

US20150234537A1 METHOD FOR DETECTING TOUCHED POSITION ON TOUCH PANEL, METHOD FOR INSPECTING TOUCH PANEL, AND TOUCH PANEL INSPECTING APPARATUS 审中-公开
标题翻译：用于检测触控面板上的触摸位置的方法，用于检查触摸面板的方法和触摸面板检查装置
公开(公告)号：US20150234537A1
公开(公告)日：2015-08-20
申请号：US14622965
申请日：2015-02-16
申请人： NIDEC-READ CORPORATION
发明人： Tatsufumi KUSUDA , Mutsuhiro HONDA , Yasuhito KURIHARA
IPC分类号： G06F3/041
CPC分类号： G06F3/0418 , G06F3/044 , G06F2203/04104
摘要： A method for detecting a touched position on a touch panel includes: acquiring a capacitance value detected in each sensing area of the touch panel; correcting each capacitance value, based on a correlation value table that stores therein a numerical influence to be exerted on the capacitance value in each sensing area by the capacitance value in the adjacent sensing areas, and calculating a correlation correction value for each sensing area; retrieving the maximum value from among the correlation correction values; and defining the sensing area for which the correlation correction value is the maximum value, as a maximum area, calculating a centroid position as to an area including the maximum area and the sensing areas adjacent to the maximum area, based on the correlation correction values, and acquiring the calculated centroid position as a touched position.
摘要翻译：一种用于检测触摸面板上的触摸位置的方法包括：获取在触摸面板的每个感测区域中检测的电容值; 基于相关值表，根据相关值表，在相关检测区域中存储要对每个感测区域中的电容值施加的数值影响，并计算每个感测区域的相关校正值; 从相关校正值中检索最大值; 并且将所述相关校正值作为最大值的感测区域定义为最大面积，基于所述相关校正值计算关于包括所述最大面积和与所述最大区域相邻的感测区域的区域的质心位置，并且获取所计算的重心位置作为触摸位置。

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