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1. 发明授权

US08390816B2 Method for attenuated total reflection far ultraviolet spectroscopy and an apparatus for measuring concentrations therewith 失效
标题翻译：衰减全反射远紫外光谱法及其浓度测定装置
公开(公告)号：US08390816B2
公开(公告)日：2013-03-05
申请号：US12921066
申请日：2009-03-03
申请人： Noboru Higashi , Naomi Kariyama , Akifumi Ikehata
发明人： Noboru Higashi , Naomi Kariyama , Akifumi Ikehata
IPC分类号： G01N21/47 , G01N21/55
CPC分类号： G01N21/33 , G01N21/552
摘要： In far ultraviolet spectroscopy using attenuated total reflection, total reflection light is measured by using evanescent waves of total reflection light. The penetration depth thereof is equal to or larger than 150 nm in a wavelength range in the far ultraviolet range wherein the penetration depth depends on a wavelength of the far ultraviolet light, refractive index of an object to be measured, refractive index of optical material of the probe and incident angle of the far ultraviolet light at an interface between the probe and the object. The attenuated total reflection probe is made of an optical material selected so as to have the penetration depth equal to or higher than 150 nm in far ultraviolet wavelength range, and the probe makes contact with the object to be measured at the interface, and the far ultraviolet light is incident on the interface at incident angle larger than critical angle in the wavelength range so as to have the penetration depth equal to or higher than 150 nm. The total reflection light from the interface is measured, and absorbance of the object to be measured is determined.
摘要翻译：在使用衰减全反射的远紫外光谱中，通过使用全反射光的消逝波来测量全反射光。其穿透深度在远紫外范围的波长范围内等于或大于150nm，其中穿透深度取决于远紫外光的波长，待测物体的折射率，光学材料的折射率探针和探针与物体之间的界面处的远紫外光的探测和入射角。衰减的全反射探针由选择的光学材料制成，以便在远紫外线波长范围内具有等于或高于150nm的穿透深度，并且探针在界面处与待测量的物体接触，并且远紫外光以大于临界角的入射角入射在界面上，使其具有等于或高于150nm的穿透深度。测定界面的全反射光，测定被测定物的吸光度。

2. 发明申请

US20110013193A1 METHOD FOR ATTENUATED TOTAL REFLECTION FAR ULTRAVIOLET SPECTROSCOPY AND AN APPARATUS FOR MEASURING CONCENTRATIONS THEREWITH 失效
标题翻译：衰减总反射法超紫外光谱的方法和用于测量浓度的装置
公开(公告)号：US20110013193A1
公开(公告)日：2011-01-20
申请号：US12921066
申请日：2009-03-03
申请人： Noboru Higashi , Naomi Kariyama , Akifumi Ikehata
发明人： Noboru Higashi , Naomi Kariyama , Akifumi Ikehata
IPC分类号： G01N21/47
CPC分类号： G01N21/33 , G01N21/552
摘要： In far ultraviolet spectroscopy using attenuated total reflection, total reflection light is measured by using evanescent waves of total reflection light. The penetration depth thereof is equal to or larger than 150 nm in a wavelength range in the far ultraviolet range wherein the penetration depth depends on a wavelength of the far ultraviolet light, refractive index of an object to be measured, refractive index of optical material of the probe and incident angle of the far ultraviolet light at an interface between the probe and the object. The attenuated total reflection probe is made of an optical material selected so as to have the penetration depth equal to or higher than 150 nm in far ultraviolet wavelength range, and the probe makes contact with the object to be measured at the interface, and the far ultraviolet light is incident on the interface at incident angle larger than critical angle in the wavelength range so as to have the penetration depth equal to or higher than 150 nm. The total reflection light from the interface is measured, and absorbance of the object to be measured is determined.
摘要翻译：在使用衰减全反射的远紫外光谱中，通过使用全反射光的消逝波来测量全反射光。其穿透深度在远紫外范围的波长范围内等于或大于150nm，其中穿透深度取决于远紫外光的波长，待测物体的折射率，光学材料的折射率探针和探针与物体之间的界面处的远紫外光的探测和入射角。衰减的全反射探针由在远紫外波长范围内具有等于或大于150nm的穿透深度选择的光学材料制成，并且探针在界面处与被测量物体接触，远紫外光以大于临界角的入射角入射在界面上，使其具有等于或高于150nm的穿透深度。测定界面的全反射光，测定被测定物的吸光度。

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