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1. 发明授权

US08008940B2 Circuit board test system and test method 失效
标题翻译：电路板测试系统和测试方法
公开(公告)号：US08008940B2
公开(公告)日：2011-08-30
申请号：US12379359
申请日：2009-02-19
申请人： Nobuyuki Takase
发明人： Nobuyuki Takase
IPC分类号： G01R31/26
CPC分类号： G01R31/31905
摘要： A circuit board system is adapted to check a DUT (Device Under Test) and a communication device on a DUT board, check the connection between DUT and communication device and check connections of parts mounted on DUT board. The system, which tests a circuit board used when a DUT is tested using a tester, has a socket into which DUT is removably inserted; a communication device mounted thereon; first wires electrically connecting first signal terminals of DUT and the tester; and second wires electrically connecting second signal terminals of DUT, which are not electrically connected to the first signal terminals, and signal terminals of the communication device. A shorting board is inserted into the socket in place of DUT when the circuit board is tested, the shorting board having short-circuit wires electrically connecting the first wires and the second wires.
摘要翻译：电路板系统适用于检查DUT（被测设备）和DUT板上的通信设备，检查DUT和通信设备之间的连接，并检查安装在DUT板上的部件的连接。当使用测试仪测试DUT时，测试使用的电路板的系统具有可插入DUT的插座; 安装在其上的通信装置; 第一根电线将DUT的第一个信号端子与测试仪电连接; 以及电连接DUT的未与第一信号端子电连接的第二信号端子和通信装置的信号端子的第二导线。当测试电路板时，短路板插入插座代替DUT，短路板具有电连接第一线和第二线的短路线。

2. 发明申请

US20090267628A1 Circuit board test system and test method 失效
标题翻译：电路板测试系统和测试方法
公开(公告)号：US20090267628A1
公开(公告)日：2009-10-29
申请号：US12379359
申请日：2009-02-19
申请人： Nobuyuki Takase
发明人： Nobuyuki Takase
IPC分类号： G01R31/02
CPC分类号： G01R31/31905
摘要： A circuit board system is adapted to check a DUT (Device Under Test) and a communication device on a DUT board, check the connection between DUT and communication device and check connections of parts mounted on DUT board. The system, which tests a circuit board used when a DUT is tested using a tester, has a socket into which DUT is removably inserted; a communication device mounted thereon; first wires electrically connecting first signal terminals of DUT and the tester; and second wires electrically connecting second signal terminals of DUT, which are not electrically connected to the first signal terminals, and signal terminals of the communication device. A shorting board is inserted into the socket in place of DUT when the circuit board is tested, the shorting board having short-circuit wires electrically connecting the first wires and the second wires.
摘要翻译：电路板系统适用于检查DUT（被测设备）和DUT板上的通信设备，检查DUT和通信设备之间的连接，并检查安装在DUT板上的部件的连接。当使用测试仪测试DUT时，测试使用的电路板的系统具有可插入DUT的插座; 安装在其上的通信装置; 第一根电线将DUT的第一个信号端子与测试仪电连接; 以及电连接DUT的未与第一信号端子电连接的第二信号端子和通信装置的信号端子的第二导线。当测试电路板时，短路板插入插座代替DUT，短路板具有电连接第一线和第二线的短路线。

3. 发明授权

US07473327B2 Wear-resistant aluminum alloy excellent in caulking property and extruded product made thereof 有权
标题翻译：耐咬合性优良的耐磨铝合金和由其制成的挤压制品
公开(公告)号：US07473327B2
公开(公告)日：2009-01-06
申请号：US10812406
申请日：2004-03-26
申请人： Nobuyuki Takase , Nobuyuki Higashi , Kazuhiro Nishikawa
发明人： Nobuyuki Takase , Nobuyuki Higashi , Kazuhiro Nishikawa
IPC分类号： C22C21/02
CPC分类号： C22C21/02
摘要： A wear-resistant aluminum alloy improved in wear resistance (or viscosity), including: 0.1 to 0.39 wt % of Mg, 3.0 to 6.0 wt % of Si, 0.01 to 0.5 wt % of Cu, 0.01 to 0.5 wt % of Fe, 0.01 to 0.5 wt % of Mn, 0.01 to 0.5 wt % of Cr, and the remainder being Al and unavoidable impurities; and an extruded product using the aluminum alloy.
摘要翻译：耐磨铝合金的耐磨性（或粘度）提高，包括：0.1〜0.39重量％的Mg，3.0〜6.0重量％的Si，0.01〜0.5重量％的Cu，0.01〜0.5重量％的Fe，0.01 至0.5重量％的Mn，0.01至0.5重量％的Cr，其余为Al和不可避免的杂质; 以及使用该铝合金的挤出产品。

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