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1. 发明授权

US07714599B2 Integrated circuit burn-in test system and associated methods 有权
标题翻译：集成电路老化测试系统及相关方法
公开(公告)号：US07714599B2
公开(公告)日：2010-05-11
申请号：US11615207
申请日：2006-12-22
申请人： Riccardo Maggi , Massimo Scipioni
发明人： Riccardo Maggi , Massimo Scipioni
IPC分类号： G01R31/02
CPC分类号： G01R31/2856 , G01R31/2877
摘要： An integrated circuit burn-in test system includes an integrated circuit and a tester. The integrated circuit includes operating circuitry, a heater for heating the operating circuitry, and burn-in test circuitry for testing the operating circuitry while being heated. A package surrounds the operating circuitry, the heater and the burn-in test circuitry. The burn-in test circuitry causes the operating circuitry to operate and generate data related thereto. The tester receives data from the burn-in test circuitry. The heater may be configured within the package to heat at least one predetermined portion of the operating circuitry.
摘要翻译：集成电路老化测试系统包括集成电路和测试仪。集成电路包括操作电路，用于加热操作电路的加热器和用于在加热时测试操作电路的老化测试电路。封装包围操作电路，加热器和老化测试电路。老化测试电路使操作电路工作并产生与之相关的数据。测试仪从老化测试电路接收数据。加热器可以被配置在封装内以加热操作电路的至少一个预定部分。

2. 发明授权

US06861860B2 Integrated circuit burn-in test system and associated methods 有权
公开(公告)号：US06861860B2
公开(公告)日：2005-03-01
申请号：US10150225
申请日：2002-05-17
申请人： Riccardo Maggi , Massimo Scipioni
发明人： Riccardo Maggi , Massimo Scipioni
IPC分类号： G01R31/28 , G01R31/02
CPC分类号： G01R31/2856 , G01R31/2877
摘要： An integrated circuit burn-in test system includes an integrated circuit and a tester. The integrated circuit includes operating circuitry, a heater for heating the operating circuitry, and burn-in test circuitry for testing the operating circuitry while being heated. A package surrounds the operating circuitry, the heater and the burn-in test circuitry. The burn-in test circuitry causes the operating circuitry to operate and generate data related thereto. The tester receives data from the burn-in test circuitry. The heater may be configured within the package to heat at least one predetermined portion of the operating circuitry.

3. 发明申请

US20080231306A1 INTEGRATED CIRCUIT BURN-IN TEST SYSTEM AND ASSOCIATED METHODS 有权
标题翻译：集成电路测试系统及相关方法
公开(公告)号：US20080231306A1
公开(公告)日：2008-09-25
申请号：US11615207
申请日：2006-12-22
申请人： Riccardo Maggi , Massimo Scipioni
发明人： Riccardo Maggi , Massimo Scipioni
IPC分类号： G01R31/26 , H01L23/34
CPC分类号： G01R31/2856 , G01R31/2877
摘要： An integrated circuit burn-in test system includes an integrated circuit and a tester. The integrated circuit includes operating circuitry, a heater for heating the operating circuitry, and burn-in test circuitry for testing the operating circuitry while being heated. A package surrounds the operating circuitry, the heater and the burn-in test circuitry. The burn-in test circuitry causes the operating circuitry to operate and generate data related thereto. The tester receives data from the burn-in test circuitry. The heater may be configured within the package to heat at least one predetermined portion of the operating circuitry.
摘要翻译：集成电路老化测试系统包括集成电路和测试仪。集成电路包括操作电路，用于加热操作电路的加热器和用于在加热时测试操作电路的老化测试电路。封装包围操作电路，加热器和老化测试电路。老化测试电路使操作电路工作并产生与之相关的数据。测试仪从老化测试电路接收数据。加热器可以被配置在封装内以加热操作电路的至少一个预定部分。

4. 发明申请

US20050127932A1 Integrated circuit burn-in test system and associated methods 有权
标题翻译：集成电路老化测试系统及相关方法
公开(公告)号：US20050127932A1
公开(公告)日：2005-06-16
申请号：US11034567
申请日：2005-01-13
申请人： Riccardo Maggi , Massimo Scipioni
发明人： Riccardo Maggi , Massimo Scipioni
IPC分类号： G01R31/28 , G01R31/02
CPC分类号： G01R31/2856 , G01R31/2877
摘要： An integrated circuit burn-in test system includes an integrated circuit and a tester. The integrated circuit includes operating circuitry, a heater for heating the operating circuitry, and burn-in test circuitry for testing the operating circuitry while being heated. A package surrounds the operating circuitry, the heater and the burn-in test circuitry. The burn-in test circuitry causes the operating circuitry to operate and generate data related thereto. The tester receives data from the burn-in test circuitry. The heater may be configured within the package to heat at least one predetermined portion of the operating circuitry.
摘要翻译：集成电路老化测试系统包括集成电路和测试仪。集成电路包括操作电路，用于加热操作电路的加热器和用于在加热时测试操作电路的老化测试电路。封装包围操作电路，加热器和老化测试电路。老化测试电路使操作电路工作并产生与之相关的数据。测试仪从老化测试电路接收数据。加热器可以被配置在封装内以加热操作电路的至少一个预定部分。

5. 发明授权

US07183784B2 Integrated circuit burn-in test system and associated methods 有权
标题翻译：集成电路老化测试系统及相关方法
公开(公告)号：US07183784B2
公开(公告)日：2007-02-27
申请号：US11034567
申请日：2005-01-13
申请人： Riccardo Maggi , Massimo Scipioni
发明人： Riccardo Maggi , Massimo Scipioni
IPC分类号： G01R31/02
CPC分类号： G01R31/2856 , G01R31/2877
摘要： An integrated circuit burn-in test system includes an integrated circuit and a tester. The integrated circuit includes operating circuitry, a heater for heating the operating circuitry, and burn-in test circuitry for testing the operating circuitry while being heated. A package surrounds the operating circuitry, the heater and the burn-in test circuitry. The burn-in test circuitry causes the operating circuitry to operate and generate data related thereto. The tester receives data from the burn-in test circuitry. The heater may be configured within the package to heat at least one predetermined portion of the operating circuitry.
摘要翻译：集成电路老化测试系统包括集成电路和测试仪。集成电路包括操作电路，用于加热操作电路的加热器和用于在加热时测试操作电路的老化测试电路。封装包围操作电路，加热器和老化测试电路。老化测试电路使操作电路工作并产生与之相关的数据。测试仪从老化测试电路接收数据。加热器可以被配置在封装内以加热操作电路的至少一个预定部分。

6. 发明授权

US06513898B1 Integrated inkjet print head and manufacturing process thereof 失效
标题翻译：集成喷墨打印头及其制造工艺
公开(公告)号：US06513898B1
公开(公告)日：2003-02-04
申请号：US09103016
申请日：1998-06-23
申请人： Benedetto Vigna , Riccardo Maggi
发明人： Benedetto Vigna , Riccardo Maggi
IPC分类号： B41J29393
CPC分类号： B41J2/1603 , B41J2/125 , B41J2/14129 , B41J2/14153 , B41J2/164 , B41J2002/14354 , B41J2202/13
摘要： An inkjet print head includes an ink drop emission mini-gun and a drop emission sensor integrated in a chip of semiconductor material. The mini-gun is formed by an ink chamber and a nozzle in communication with the ink chamber and the drop emission sensor includes a resistive element arranged in a position adjacent to the ink chamber. The resistance of the resistive element depends on the pressure exerted thereon, so that when the mini-gun emits an ink drop, it is subjected to a recoil movement which causes a change of pressure and hence of resistance in the resistive element; this change in resistance may be detected through suitable circuitry to identify whether and when a drop of ink has been emitted.
摘要翻译：喷墨打印头包括集成在半导体材料芯片中的墨滴发射微型枪和液滴发射传感器。微型枪由墨水室和与墨水室连通的喷嘴形成，并且液滴发射传感器包括布置在与墨水腔相邻的位置的电阻元件。电阻元件的电阻取决于施加在其上的压力，使得当微型枪发射墨滴时，其受到反冲运动，其导致电阻元件中的压力变化并因此导致电阻的变化; 可以通过合适的电路来检测电阻的这种变化，以识别是否和何时已经发射一滴墨水。

7. 发明授权

US06215292B1 Method and device for generating an output current 有权
标题翻译：用于基于具有全数指数的输入电流产生输出电流的方法和装置
公开(公告)号：US06215292B1
公开(公告)日：2001-04-10
申请号：US09382244
申请日：1999-08-25
申请人： Riccardo Maggi , Adam Ghozeil
发明人： Riccardo Maggi , Adam Ghozeil
IPC分类号： G05F316
CPC分类号： H03F3/345 , G05F3/267
摘要： A power rising electronic device receives an input current and supplies an output current that is a function of a power of the input current having a relative whole-number exponent. The power rising electronic device includes a plurality of diodes equal to an absolute value of the relative whole-number exponent. The plurality of diodes are connected in series with one another to produce from the input current an input voltage that is a logarithmic function of a power of the input current. The electronic device further includes an output junction element, and a circuit for applying a voltage that is a function of the input voltage to the output junction element for producing a current that is an exponential function of the voltage applied thereto. The output current of the power rising electronic device is derived from the current produced in the output junction element.
摘要翻译：上电电子设备接收输入电流并提供作为具有相对全数指数的输入电流的功率的函数的输出电流。功率提升电子器件包括等于相对全数指数的绝对值的多个二极管。多个二极管彼此串联连接以从输入电流产生作为输入电流的功率的对数函数的输入电压。电子设备还包括输出结元件，以及用于将作为输入电压的函数的电压施加到输出结元件以产生作为施加到其的电压的指数函数的电流的电路。功率上升电子器件的输出电流是从在输出端元件中产生的电流导出的。

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