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    • 2. 发明授权
    • Rotating beam method and system for measuring part edges and openings
    • 旋转梁法和测量零件边缘和开口的系统
    • US06610992B1
    • 2003-08-26
    • US09908783
    • 2001-07-18
    • Donald MacaulayRobert MacaulayGeorge Macaulay
    • Donald MacaulayRobert MacaulayGeorge Macaulay
    • G01N2186
    • G01N21/894G01B11/00G01B11/002G01B11/005G01B11/24G01N21/88
    • A dual beam concentric polar axis scanning machine for allowing flat parts to be easily scanned and measured. Flat shaped parts are placed on a glass datum type part support surface. The dual beam laser type scanners are positioned on a motion stage beneath the part support surface and move in the x and y planes parallel to the part support surface. Detectors above the surface receive the beams and move in unison with the scanners. Initially, the beams trace the external outline of the part and measure all grooves, side indentations and the like. Next, the beams pass over the surface of the part locating and mapping the locations of any openings therethrough. Finally, the beams trace perimeter edges of each of the openings for their measurements. The dual beams include an outer rotating beam also referred to as a forward looking beam, and an inner rotating beam where the forward looking beam restricts the inner a beam to continuously and consistently measure the exterior side edges of the part, the opening locations in the part, and the side edges of the openings of the part.
    • 双光束同轴极轴扫描机,可轻松扫描和测量平面部件。 扁平形部件放置在玻璃基准部件支撑表面上。 双光束激光型扫描仪位于部件支撑表面下方的运动台上,并且在x和y平面上平行于部件支撑表面移动。 表面上的探测器接收光束并与扫描仪一致移动。 最初,梁跟踪零件的外部轮廓并测量所有凹槽,侧面凹痕等。 接下来,光束通过部件的表面定位并映射任何开口的位置。 最后,光束跟踪每个开口的周边边缘进行测量。 双梁包括也称为前视梁的外旋转梁和内旋转梁,其中前视梁限制梁的内部连续且一致地测量部件的外侧边缘,开口位置在 部分和部分的开口的侧边缘。
    • 3. 发明授权
    • Determining and exporting K-factors and bend allowance based on measured bend radius
    • 基于测量的弯曲半径确定和导出K因子和弯曲余量
    • US08683834B1
    • 2014-04-01
    • US12837768
    • 2010-07-16
    • Robert Macaulay
    • Robert Macaulay
    • B21C51/00B21D5/02
    • B21D5/006B21D5/004
    • The present disclosure is directed to systems and methods for determining and calibrating a K-factor for material and to methods and systems for calibrating forming devices, forming device controls, and/or forming device components. The disclosed systems and methods can dynamically provide exact and calibrated values for the parameters needed to produce correct and accurate flat patterns based on any type of material or any tooling combination. As such, the systems and methods of the present disclosure can be used to achieve a first run perfect or near-perfect part capability that does not currently exist.
    • 本公开涉及用于确定和校准材料的K因子的系统和方法以及用于校准成形装置,形成装置控制和/或形成装置部件的方法和系统。 所公开的系统和方法可以动态地为基于任何类型的材料或任何工具组合产生正确和准确的平面图案所需的参数动态地提供精确和校准的值。 因此,本公开的系统和方法可以用于实现当前不存在的第一运行完美或接近完美的部件能力。
    • 4. 发明授权
    • Flash error correction
    • 闪光灯纠错
    • US08140939B2
    • 2012-03-20
    • US11913259
    • 2006-07-06
    • Morgan ColmerRobert Macaulay
    • Morgan ColmerRobert Macaulay
    • G11C29/00
    • G06F11/1068
    • A data processing device for detecting and correcting data errors of a re-writable memory via an error correction algorithm. In one embodiment, the data processing device includes a coding unit implemented in hardware and an error correction unit implemented in software. In one embodiment, the coding unit is capable receiving a first set of data to be written to the memory and processing that data in accordance with an error correction algorithm to form a second set of data. The second set of data may be output to memory. In one embodiment, the coding unit receives data from the memory and processes that data in accordance with the error correction algorithm to determine whether the data contains an error. In one embodiment, the error correction unit receives data that contains an error and produces corrected data via an error correction algorithm. The corrected data may be output to the memory.
    • 一种用于通过纠错算法检测和校正可重写存储器的数据错误的数据处理装置。 在一个实施例中,数据处理装置包括以硬件实现的编码单元和以软件实现的纠错单元。 在一个实施例中,编码单元能够接收要写入存储器的第一组数据并根据纠错算法处理该数据以形成第二组数据。 第二组数据可以被输出到存储器。 在一个实施例中,编码单元从存储器接收数据并根据纠错算法处理该数据以确定数据是否包含错误。 在一个实施例中,纠错单元接收包含错误的数据,并通过纠错算法产生校正数据。 校正的数据可以被输出到存储器。
    • 5. 发明申请
    • Flash Error Correction
    • 闪光灯错误更正
    • US20080235560A1
    • 2008-09-25
    • US11913259
    • 2006-07-06
    • Morgan ColmerRobert Macaulay
    • Morgan ColmerRobert Macaulay
    • G06F11/10
    • G06F11/1068
    • A data processing device for detecting and correcting data errors of a re-writable memory via an error correction algorithm. In one embodiment, the data processing device includes a coding unit implemented in hardware and an error correction unit implemented in software. In one embodiment, the coding unit is capable receiving a first set of data to be written to the memory and processing that data in accordance with an error correction algorithm to form a second set of data. The second set of data may be output to memory. In one embodiment, the coding unit receives data from the memory and processes that data in accordance with the error correction algorithm to determine whether the data contains an error. In one embodiment, the error correction unit receives data that contains an error and produces corrected data via an error correction algorithm. The corrected data may be output to the memory.
    • 一种用于通过纠错算法检测和校正可重写存储器的数据错误的数据处理装置。 在一个实施例中,数据处理装置包括以硬件实现的编码单元和以软件实现的纠错单元。 在一个实施例中,编码单元能够接收要写入存储器的第一组数据并根据纠错算法处理该数据以形成第二组数据。 第二组数据可以被输出到存储器。 在一个实施例中,编码单元从存储器接收数据并根据纠错算法处理该数据以确定数据是否包含错误。 在一个实施例中,纠错单元接收包含错误的数据,并通过纠错算法产生校正数据。 校正的数据可以被输出到存储器。
    • 7. 发明授权
    • Determining, calibrating, and exporting K-factors and bend allowance
    • 确定,校准和导出K因子和弯曲余量
    • US09108237B1
    • 2015-08-18
    • US14228696
    • 2014-03-28
    • Robert Macaulay
    • Robert Macaulay
    • B21D5/00
    • B21D5/006B21D5/004
    • The present disclosure is directed to systems and methods for determining and calibrating a K-factor for material and to methods and systems for calibrating forming devices, forming device controls, and/or forming device components. The disclosed systems and methods can dynamically provide exact and calibrated values for the parameters needed to produce correct and accurate flat patterns based on any type of material or any tooling combination. As such, the systems and methods of the present disclosure can be used to achieve a first run perfect or near-perfect part capability that does not currently exist.
    • 本公开涉及用于确定和校准材料的K因子的系统和方法以及用于校准成形装置,形成装置控制和/或形成装置部件的方法和系统。 所公开的系统和方法可以动态地为基于任何类型的材料或任何工具组合产生正确和准确的平面图案所需的参数动态地提供精确和校准的值。 因此,本公开的系统和方法可以用于实现当前不存在的第一运行完美或接近完美的部件能力。