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    • 2. 发明授权
    • On-chip variation, speed and power regulator
    • 片内变化,速度和功率调节器
    • US08315830B2
    • 2012-11-20
    • US11970597
    • 2008-01-08
    • Richard P. MartinRichard MuscavageScott A. Segan
    • Richard P. MartinRichard MuscavageScott A. Segan
    • G06F11/30G06F11/00
    • G06F1/3203G06F1/324Y02D10/126
    • Operational speed of an integrated circuit chip is measured using one or more speed measurement elements, such as ring oscillators, disposed at various regions of the chip. Each speed measuring element can include several ring oscillators, each corresponding to a different technology threshold voltage. The speed measurement data collected from the speed measurement elements can be used to determine on-chip variation (OCV). Circuitry either on the chip itself or, alternatively, external to the chip can adjust a chip operational parameter, such as core voltage or clock speed, in response to the speed measurement data. Speed measurement data can be read out of the chip through JTAG pins or an interface to an external host.
    • 使用设置在芯片的各个区域的一个或多个速度测量元件(例如环形振荡器)测量集成电路芯片的操作速度。 每个速度测量元件可以包括几个环形振荡器,每个环形振荡器对应于不同的技术阈值电压。 从速度测量元件收集的速度测量数据可用于确定片上变化(OCV)。 芯片本身或芯片外部的电路可以根据速度测量数据调整芯片工作参数,如核心电压或时钟速度。 速度测量数据可以通过JTAG引脚或与外部主机的接口读出芯片。
    • 3. 发明申请
    • ON-CHIP VARIATION, SPEED AND POWER REGULATOR
    • 片上变速,速度和功率调节器
    • US20090177442A1
    • 2009-07-09
    • US11970597
    • 2008-01-08
    • Richard P. MartinRichard MuscavageScott A. Segan
    • Richard P. MartinRichard MuscavageScott A. Segan
    • G06F1/00
    • G06F1/3203G06F1/324Y02D10/126
    • Operational speed of an integrated circuit chip is measured using one or more speed measurement elements, such as ring oscillators, disposed at various regions of the chip. Each speed measuring element can include several ring oscillators, each corresponding to a different technology threshold voltage. The speed measurement data collected from the speed measurement elements can be used to determine on-chip variation (OCV). Circuitry either on the chip itself or, alternatively, external to the chip can adjust a chip operational parameter, such as core voltage or clock speed, in response to the speed measurement data. Speed measurement data can be read out of the chip through JTAG pins or an interface to an external host.
    • 使用设置在芯片的各个区域的一个或多个速度测量元件(例如环形振荡器)测量集成电路芯片的操作速度。 每个速度测量元件可以包括几个环形振荡器,每个环形振荡器对应于不同的技术阈值电压。 从速度测量元件收集的速度测量数据可用于确定片上变化(OCV)。 芯片本身或芯片外部的电路可以根据速度测量数据调整芯片工作参数,如核心电压或时钟速度。 速度测量数据可以通过JTAG引脚或与外部主机的接口读出芯片。
    • 5. 发明授权
    • Memory aliasing method and apparatus
    • 存储器混叠方法和装置
    • US06438672B1
    • 2002-08-20
    • US09327157
    • 1999-06-03
    • Frederick Harrison FischerVladimir SindalovskyScott A. Segan
    • Frederick Harrison FischerVladimir SindalovskyScott A. Segan
    • G06F1200
    • G06F12/0638G06F12/0862
    • A flexible memory overlaying apparatus and method stores repeatedly referenced information, e.g, common global variables, common code segments, interrupt service routines, and/or any other user or system definable information, in spare addressable circuits accessed by a memory aliasing or overlaying module. The memory aliasing module monitors (or snoops) memory access by a processor to redirect access to certain appropriate addressable circuits to provide faster access to the information than would be available in an access made from main memory. The memory overlaying apparatus and method provides an efficient context switching, e.g., during an interrupt, enables a reduction in the size of instruction code requirements, and helps avoid the occurrences of cache misses, and/or thrashing between cached pages.
    • 灵活的存储器重叠装置和方法在由存储器混叠或覆盖模块访问的备用可寻址电路中重复引用信息,例如公共全局变量,公共代码段,中断服务程序和/或任何其他用户或系统可定义信息。 存储器混叠模块通过处理器监视(或窥探)存储器访问以将访问重定向到某些适当的可寻址电路,以提供比从主存储器进行的访问中可用的信息更快的访问。 存储器重叠装置和方法提供了有效的上下文切换,例如在中断期间,能够减少指令代码要求的大小,并且有助于避免高速缓存未命中的发生和/或缓存的页面之间的抖动。
    • 6. 发明授权
    • Edge signal restoration circuit and method
    • 边沿信号恢复电路及方法
    • US5945850A
    • 1999-08-31
    • US963063
    • 1997-11-03
    • Scott A. SeganRichard Muscavage
    • Scott A. SeganRichard Muscavage
    • H03K5/12H03K5/1534H03K5/19
    • H03K5/1534H03K5/12
    • An edge signal restoration circuit and method to enhance an edge of a signal decreases a rise and fall time of a propagating signal during transitions between logic states. The edge signal restoration circuit includes a first circuit to detect an edge of an input signal and to output a detection signal, and a second circuit to drive a next state of the input signal in response to the detection signal at approximately the same time as the first circuit detects the edge of the input signal. The edge signal restoration method detects a transition of the signal between a current state and a next state, and drives the next state onto the signal during its transition to that next state.
    • 用于增强信号边沿的边缘信号恢复电路和方法在逻辑状态之间的转换期间降低了传播信号的上升和下降时间。 边沿信号恢复电路包括:第一电路,用于检测输入信号的边沿并输出检测信号;以及第二电路,用于响应于大致相同的时间响应于检测信号来驱动输入信号的下一个状态 第一电路检测输入信号的边沿。 边缘信号恢复方法检测信号在当前状态和下一状态之间的转变,并且在转换到下一状态期间将下一状态驱动到该信号上。