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    • 5. 发明申请
    • ARRAY SUBSTRATE AND SHIFT REGISTER
    • 阵列基板和移位寄存器
    • US20110156997A1
    • 2011-06-30
    • US12976060
    • 2010-12-22
    • Seung Woo HANGuangliang SHANG
    • Seung Woo HANGuangliang SHANG
    • G09G3/36
    • G09G3/3677G09G3/3659G09G2310/0205G11C19/184G11C19/28
    • An array substrate and a shift register directly fabricated thereon are provided. The shift register comprises a plurality of shift register units each connected to respective one of gate lines of the array substrate. The plurality of shift register units are divided into three groups. As to any two adjacent shift register units of each group, a signal output terminal of the following shift register unit is connected to a reset signal input terminal of the preceding shift register unit, and a signal output terminal of the preceding shift register unit is connected to a start voltage timing signal input terminal of the following shift register unit. Each group of shift register units are controlled by two clock signals, and the two clock signals alternately control two adjacent shift register units of each group. Both the first shift register unit and the third shift register unit are connected to a first start voltage timing signal input terminal, and the second shift register unit is connected to a second start voltage timing signal input terminal.
    • 提供了直接制造在其上的阵列基板和移位寄存器。 移位寄存器包括多个移位寄存器单元,每个移位寄存器单元各自连接到阵列基板的相应一个栅极线。 多个移位寄存器单元被分成三组。 对于每个组的任何两个相邻移位寄存器单元,下一个移位寄存器单元的信号输出端连接到前一移位寄存器单元的复位信号输入端,并且前一移位寄存器单元的信号输出端连接 到下一个移位寄存器单元的启动电压定时信号输入端。 每组移位寄存器单元由两个时钟信号控制,两个时钟信号交替地控制每个组的两个相邻的移位寄存器单元。 第一移位寄存器单元和第三移位寄存器单元都连接到第一开始电压定时信号输入端,并且第二移位寄存器单元连接到第二启动电压定时信号输入端。
    • 6. 发明授权
    • Apparatus for measuring adhesive and frictional properties of polymer
    • 用于测量聚合物的粘合剂和摩擦性能的装置
    • US07886571B2
    • 2011-02-15
    • US11132508
    • 2005-05-19
    • Hak-joo LeeShin HurJae-hyun KimSeung-woo HanJung-yup KimKi-ho Cho
    • Hak-joo LeeShin HurJae-hyun KimSeung-woo HanJung-yup KimKi-ho Cho
    • G06K9/00G01D18/00
    • G01N19/02G01N3/42G01N19/04
    • Disclosed herein is an apparatus for measuring adhesive and frictional properties of a polymer hemisphere relative to a contact plate provided in the apparatus. The apparatus comprise a body having a movable table installed to move along an X-axis and Y-axis and a vertical column positioned at a rear side of the movable table, a sample mount provided on the movable table and having a mirror to reflect surface images of a horizontal contact plate, a head assembly located at a front side of the column and having a polymer hemisphere used to press a surface of the contact plate to implement an adhesive force test, a camera device located at a front side of the mirror to capture the surface images of the contact plate during the adhesive force test, and a control device for analyzing various data inputted thereto during the adhesive force test.
    • 本文公开了一种用于测量聚合物半球相对于设备中提供的接触板的粘合剂和摩擦性能的装置。 该装置包括:主体,其具有安装成沿着X轴和Y轴移动的可移动台和位于可移动台的后侧的垂直柱;设置在可移动台上的具有反射表面的反射镜 水平接触板的图像,位于柱的前侧的头部组件,并且具有用于按压接触板的表面以实现粘合力测试的聚合物半球,位于镜的前侧的相机装置 以在粘合力测试期间捕获接触板的表面图像,以及用于在粘合力测试期间分析输入到其中的各种数据的控制装置。