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    • 1. 发明授权
    • Communication system for frequency shift keying signal
    • 通讯系统用于频移键控信号
    • US08405536B2
    • 2013-03-26
    • US13329751
    • 2011-12-19
    • Ting-Yuan ChengJin-Lien LinShih-Hsien Yang
    • Ting-Yuan ChengJin-Lien LinShih-Hsien Yang
    • H03M1/12
    • H04L27/122
    • A communication system includes a time-to-digital converter, a digital low-pass filter, and a digital signal processor. The time-to-digital converter receives an in-phase signal of a frequency-shift keying signal and to generate a digital signal according to the in-phase signal. The digital low-pass filter receives the digital signal and to generate a filtered signal including N continuous words according to the digital signal. The digital signal processor divides up the N continuous words into N/2 word sets in order, wherein each of the N/2 word sets includes a first word and a second word, and if a difference between the first word and the second word meets a predetermined condition, the digital signal processor generates an output data and an output clock according to all the first words and the second words that have difference which meets the predetermined condition.
    • 通信系统包括时间 - 数字转换器,数字低通滤波器和数字信号处理器。 时间 - 数字转换器接收频移键控信号的同相信号,并根据同相信号产生数字信号。 数字低通滤波器接收数字信号并根据数字信号产生包括N个连续字的滤波信号。 数字信号处理器按顺序将N个连续字分成N / 2个字组,其中N / 2个字组中的每一个包括第一个字和第二个字,并且如果第一个字和第二个字之间的差值满足 在预定条件下,数字信号处理器根据满足预定条件的所有第一个字和第二个字产生一个输出数据和一个输出时钟。
    • 4. 发明申请
    • Method to access storage device through universal serial bus
    • 通过通用串行总线访问存储设备的方法
    • US20070283095A1
    • 2007-12-06
    • US11447571
    • 2006-06-06
    • Chi-Tung ChangShih-Hsien YangChing-Wen Wang
    • Chi-Tung ChangShih-Hsien YangChing-Wen Wang
    • G06F12/00
    • G06F3/0656G06F3/0613G06F3/0679
    • A method to access storage device through universal serial bus (USB) is disclosed in the present invention. The storage device includes a flash controller and a flash memory. The method includes: (1)connecting the storage device to a USB interface of an electronic device such as a computer; (2)transferring a plurality of access (reading/writing) instructions to a flash controller from the electronic device;(3)deciding which data needed to be temporarily saved in a flash random access memory and the priority order of the access instructions according to a mapping table of a flash file system by the flash controller; (4)writing the data temporarily saved in the flash random access memory into the flash memory according to the priority order by the flash controller. The method can enhance the operation efficiency of the storage device.
    • 在本发明中公开了一种通过通用串行总线(USB)访问存储设备的方法。 存储设备包括闪存控制器和闪存。 该方法包括:(1)将存储设备连接到诸如计算机的电子设备的USB接口; (2)从电子设备向闪存控制器传送多个访问(读/写)指令;(3)根据闪存控制器的闪存随机存取存储器中的哪些数据和访问指令的优先级顺序 闪存控制器的闪存文件系统的映射表; (4)根据闪存控制器的优先级顺序将临时保存在闪存随机存取存储器中的数据写入闪速存储器。 该方法可以提高存储设备的运行效率。
    • 5. 发明授权
    • Method of erasing non-volatile memory data
    • 擦除非易失性存储器数据的方法
    • US06847557B2
    • 2005-01-25
    • US10248499
    • 2003-01-24
    • Shih-Hsien Yang
    • Shih-Hsien Yang
    • G11C16/04G11C16/14H01L21/8239
    • G11C16/14
    • A method of erasing non-volatile memory data. The erasing method includes applying a first voltage to a substrate, applying a second voltage to a control gate and setting both source terminal and drain terminal to a floating state during a first time interval so that F-N tunneling can be utilized to carry out an erasing operation. In a second time interval, the control gate voltage is changed from the first voltage applied to a third voltage. In a third time interval, the substrate voltage is changed from the second voltage to 0 volt to prevent over-erasure of the non-volatile memory. The second voltage and the first voltage are in reverse bias. Similarly, the third voltage and the first voltage are also in reverse bias.
    • 一种擦除非易失性存储器数据的方法。 擦除方法包括向基板施加第一电压,向控制栅极施加第二电压,并且在第一时间间隔期间将源极端子和漏极端子设置为浮置状态,使得可以利用FN隧道来执行擦除操作 。 在第二时间间隔中,控制栅极电压从施加到第三电压的第一电压变化。 在第三时间间隔中,衬底电压从第二电压变为0伏,以防止非易失性存储器的过度擦除。 第二电压和第一电压处于反向偏置。 类似地,第三电压和第一电压也是反向偏压。
    • 7. 发明授权
    • Layout modification method and system
    • 布局修改方法和系统
    • US08826195B2
    • 2014-09-02
    • US13530164
    • 2012-06-22
    • Meng-Xiang LeeLi-Chung HsuShih-Hsien YangHo Che YuKing-Ho TamChung-Hsing Wang
    • Meng-Xiang LeeLi-Chung HsuShih-Hsien YangHo Che YuKing-Ho TamChung-Hsing Wang
    • G06F17/50
    • G06F17/5081G06F17/5031G06F2217/02G06F2217/78G06F2217/84
    • A method comprises providing a non-transitory, machine-readable storage medium storing a partial netlist of at least a portion of a previously taped-out integrated circuit (IC) layout, representing a set of photomasks for fabricating an IC having the IC layout such that the IC meets a first specification value. A computer identifies a proper subset of a plurality of first devices in the IC layout, such that replacement of the proper subset of the first devices by second devices in a revised IC layout satisfies a second specification value different from the first specification value. At least one layout mask is generated and stored in at least one non-transitory machine readable storage medium, accessible by a tool for forming at least one additional photomask, such that the set of photomasks and the at least one additional photomask are usable to fabricate an IC according to the revised IC layout.
    • 一种方法包括提供一种非暂时的机器可读存储介质,其存储至少部分先前采集的集成电路(IC)布局的部分网表,其表示用于制造具有IC布局的IC的一组光掩模, 该IC满足第一规格值。 计算机识别IC布局中的多个第一设备的正确子集,使得经修订的IC布局中的第二设备对第一设备的正确子集的替换满足与第一规范值不同的第二规范值。 至少一个布局掩模被生成并存储在至少一个非暂时机器可读存储介质中,可由用于形成至少一个附加光掩模的工具访问,使得该组光掩模和至少一个附加光掩模可用于制造 一个IC根据修订的IC布局。
    • 8. 发明申请
    • Method and apparatus for measuring brightness
    • 测量亮度的方法和装置
    • US20060114451A1
    • 2006-06-01
    • US11130090
    • 2005-05-17
    • Chung-Wei WangShih-Hsien Yang
    • Chung-Wei WangShih-Hsien Yang
    • G01J1/42
    • G01J1/42G01J1/32G01J2001/4247
    • An apparatus for measuring brightness transmitted by a light-emitting display unit of a laser telescope and observed by the user's eyes comprises a focusing unit (11), a sensor unit (12), a processing unit (13) and a display unit (14). A method of measuring brightness includes the steps of: providing a constant color temperature to simulate the external light; providing a tool platform and locating the apparatus for measuring brightness and the laser telescope under test thereon; further providing a light-impermeable cover to cover the laser telescope and the apparatus for avoiding the external light interfering with the measurement of brightness; then turning on the laser telescope and enabling it to range; picking up the light of a reticle and a measured value transmitted from the light-emitting display unit by means of the apparatus for measuring brightness; and at last, displaying the measured value on the display unit of said apparatus for measuring brightness.
    • 用于测量由激光望远镜的发光显示单元传输并由用户观察到的亮度的设备包括聚焦单元(11),传感器单元(12),处理单元(13)和显示单元(14) )。 测量亮度的方法包括以下步骤:提供恒定的色温以模拟外部光; 提供工具平台和定位用于测量亮度的设备和被测试的激光望远镜; 进一步提供不透光的盖以覆盖激光望远镜和设备,用于避免外部光线干扰亮度的测量; 然后打开激光望远镜,使其能够射程; 通过用于测量亮度的装置拾取掩模版的光和从发光显示单元发送的测量值; 并且最后在所述用于测量亮度的装置的显示单元上显示测量值。
    • 10. 发明授权
    • Testing method for buried strap and deep trench leakage current
    • 掩埋带和深沟漏电流测试方法
    • US06377067B1
    • 2002-04-23
    • US09495753
    • 2000-02-01
    • Shih-Hsien YangChuan-Jane Chao
    • Shih-Hsien YangChuan-Jane Chao
    • G01R3126
    • G01R31/2621
    • A method for measuring both buried strap and deep trench leakage currents in DRAM cell capacitors. By keeping the voltages on both plates of the capacitor equal, the buried strap leakage current (IBS) may be isolated and measured. A range of voltages is applied to a terminal of an associated transistor to obtain a corresponding range of buried strap leakage currents. An unequal voltage is next applied across the capacitor, and a total leakage current is measured. By applying a known potential to a substrate of the transistor during this total leakage current measurement, the associated IBS may be determined. Next, the IBS is subtracted from the measured total leakage current to obtain the deep trench leakage current (IDT).
    • 一种用于测量DRAM单元电容器中的埋藏带和深沟漏电流的方法。 通过保持电容器的两个电压相等,可以隔离和测量掩埋带漏电流(IBS)。 将一定范围的电压施加到相关联的晶体管的端子,以获得掩埋带泄漏电流的对应范围。 接着在电容器两端施加不等电压,并测量总泄漏电流。 通过在该总泄漏电流测量期间将已知电位施加到晶体管的衬底,可以确定相关联的IBS。 接下来,从测量的总泄漏电流中减去IBS以获得深沟漏电流(IDT)。