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    • 7. 发明授权
    • Method and apparatus for adjusting characteristics of multi electron source
    • 调整多电子源特性的方法和装置
    • US06661179B2
    • 2003-12-09
    • US10227346
    • 2002-08-26
    • Shuji AokiTakahiro Oguchi
    • Shuji AokiTakahiro Oguchi
    • G09G310
    • G09G3/006G09G3/22G09G2320/0285
    • A method for adjusting electron emitting characteristics of a multi-electron source having plural electron emitting devices disposed on a substrate. The method comprises measuring electron emission characteristics of the devices and setting a characteristic adjustment target value. Plural characteristic shift voltages having discrete values are applied to some of the devices, electron emission characteristics of each of these devices are measured, and a characteristic adjustment table is generated for each characteristics shift voltage value according to change rates of these measured characteristics. A predetermined characteristics shift voltage value is selected based on the corresponding table, and that voltage is applied to the devices to cause their characteristics to shift towards the target value. A change in the electron emission characteristics is monitored to revise the characteristics shift condition.
    • 一种用于调整具有设置在基板上的多个电子发射器件的多电子源的电子发射特性的方法。 该方法包括测量器件的电子发射特性并设定特性调整目标值。 将具有离散值的多个特征偏移电压施加到一些器件,测量这些器件中的每一个的电子发射特性,并且根据这些测量特性的变化率为每个特性移位电压值产生特性调整表。 基于对应的表选择预定特性偏移电压值,并且该电压被施加到器件以使其特性向目标值移动。 监测电子发射特性的变化,以改变特性偏移条件。