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    • 3. 发明申请
    • SYSTEM AND METHOD OF MEASURING IRREGULARITY OF A GLASS SUBSTRATE
    • 测量玻璃基板不正常性的系统和方法
    • US20120133952A1
    • 2012-05-31
    • US13094711
    • 2011-04-26
    • Soon-Jong LeeBong-Joo WooByoung-Chan ParkSeong-Jin ChoiJae-Hoon Chung
    • Soon-Jong LeeBong-Joo WooByoung-Chan ParkSeong-Jin ChoiJae-Hoon Chung
    • G01B11/30
    • G01B11/306G01N21/896G01N2021/9513
    • A system and a method of measuring irregularity of a glass substrate using only a reflection light reflected by an upper surface of reflection lights reflected by the upper surface and a lower surface of the glass substrate are disclosed. The system includes a light source section configured to output a first light to the glass substrate and a screen. Here, the first light outputted from the light source section is reflected by an upper surface and a lower surface of the glass substrate, a first reflection light reflected by the upper surface of the glass substrate is inputted into the screen, a first line is formed on the screen in accordance with the input of the first reflection light, a second reflection light reflected by the lower surface of the glass substrate is inputted into the screen through the upper surface, a second line is formed on the screen in accordance with the input of the second reflection light, and the light source section and the screen are disposed on the basis of the glass substrate so that the lines are separated.
    • 公开了一种使用仅由反射光反射的反射光来测量玻璃基板的不规则性的系统和方法,该反射光由玻璃基板的上表面和下表面反射的反射光的上表面反射。 该系统包括被配置为将第一光输出到玻璃基板和屏幕的光源部。 这里,从光源部输出的第一光被玻璃基板的上表面和下表面反射,由玻璃基板的上表面反射的第一反射光被输入到屏幕中,形成第一线 在屏幕上根据第一反射光的输入,由玻璃基板的下表面反射的第二反射光通过上表面输入到屏幕中,根据输入在屏幕上形成第二行 的第二反射光,并且光源部分和屏幕被设置在玻璃基板的基础上,使得线分离。
    • 6. 发明授权
    • System and method of measuring irregularity of a glass substrate
    • 测量玻璃基板不规则性的系统和方法
    • US08351051B2
    • 2013-01-08
    • US13094711
    • 2011-04-26
    • Soon-Jong LeeBong-Joo WooByoung-Chan ParkSeong-Jin ChoiJae-Hoon Chung
    • Soon-Jong LeeBong-Joo WooByoung-Chan ParkSeong-Jin ChoiJae-Hoon Chung
    • G01B11/30G01N21/00
    • G01B11/306G01N21/896G01N2021/9513
    • A system and a method of measuring irregularity of a glass substrate using only a reflection light reflected by an upper surface of reflection lights reflected by the upper surface and a lower surface of the glass substrate are disclosed. The system includes a light source section configured to output a first light to the glass substrate and a screen. Here, the first light outputted from the light source section is reflected by an upper surface and a lower surface of the glass substrate, a first reflection light reflected by the upper surface of the glass substrate is inputted into the screen, a first line is formed on the screen in accordance with the input of the first reflection light, a second reflection light reflected by the lower surface of the glass substrate is inputted into the screen through the upper surface, a second line is formed on the screen in accordance with the input of the second reflection light, and the light source section and the screen are disposed on the basis of the glass substrate so that the lines are separated.
    • 公开了一种使用仅由反射光反射的反射光来测量玻璃基板的不规则性的系统和方法,该反射光由玻璃基板的上表面和下表面反射的反射光的上表面反射。 该系统包括被配置为将第一光输出到玻璃基板和屏幕的光源部。 这里,从光源部输出的第一光被玻璃基板的上表面和下表面反射,由玻璃基板的上表面反射的第一反射光被输入到屏幕中,形成第一线 在屏幕上根据第一反射光的输入,由玻璃基板的下表面反射的第二反射光通过上表面输入到屏幕中,根据输入在屏幕上形成第二行 的第二反射光,并且光源部分和屏幕被设置在玻璃基板的基础上,使得线分离。