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1. 发明授权

US10438340B2 Automatic optical inspection system and operating method thereof 有权
公开(公告)号：US10438340B2
公开(公告)日：2019-10-08
申请号：US15726402
申请日：2017-10-06
申请人： Test Research, Inc.
发明人： Kuang-Pu Wen , Wen-Ming Wu , Chun-Yen Huang
IPC分类号： G06T7/00 , H04N5/247 , G01N21/88 , G01N21/956 , G01N21/95 , G01N21/84
摘要： An automatic optical inspection system includes a first AOI machine and a second AOI machine, and the second AOI machine is electrically connected to the first AOI machine. The first AOI machine is configured to use a first resolution to inspect an object, so as to detect a possible defective region(s) of the object. The second AOI machine is configured to use a second resolution higher than the first resolution of the first AOI machine to inspect within the possible defective region(s) only, so as to detect whether there is/are any defect(s) within the possible defective region(s) of the object.

2. 发明申请

US20180276811A1 AUTOMATIC OPTICAL INSPECTION SYSTEM AND OPERATING METHOD THEREOF 审中-公开
公开(公告)号：US20180276811A1
公开(公告)日：2018-09-27
申请号：US15726402
申请日：2017-10-06
申请人： Test Research, Inc.
发明人： Kuang-Pu WEN , Wen-Ming WU , Chun-Yen HUANG
IPC分类号： G06T7/00 , G01N21/95 , G01N21/956 , H04N5/247
CPC分类号： G06T7/0008 , G01N21/8851 , G01N21/9501 , G01N21/956 , G01N2021/845 , G01N2021/8867 , G01N2021/9513 , G01N2021/95638 , G01N2201/0484 , G06T2207/30141 , G06T2207/30148 , H04N5/247
摘要： An automatic optical inspection system includes a first AOI machine and a second AOI machine, and the second AOI machine is electrically connected to the first AOI machine. The first AOI machine is configured to use a first resolution to inspect an object, so as to detect a possible defective region(s) of the object. The second AOI machine is configured to use a second resolution higher than the first resolution of the first AOI machine to inspect within the possible defective region(s) only, so as to detect whether there is/are any defect(s) within the possible defective region(s) of the object.

3. 发明申请

US20170186150A1 OPTICAL INSPECTION APPARATUS 审中-公开
公开(公告)号：US20170186150A1
公开(公告)日：2017-06-29
申请号：US14983470
申请日：2015-12-29
申请人： Test Research, Inc.
发明人： Yeong-Feng Wang
IPC分类号： G06T7/00 , G02B5/20 , G02B27/10 , H04N5/225 , G02B27/14
CPC分类号： G06T7/0006 , G02B5/20 , G02B21/0016 , G02B21/084 , G02B27/1006 , G02B27/141 , G06T2207/30148 , H04N5/2254 , H04N5/2256
摘要： An optical inspection apparatus includes a dichroic mirror, a first light source, and a first image capturing device. The dichroic mirror has a first side and a second side opposite to the first side. The dichroic mirror transmits a first light beam and reflects a second light beam. The wavelength of the second light beam is different from the wavelength of the first light beam. The first light source is disposed at the first side of the dichroic mirror and is configured to provide the first light beam to pass through the dichroic mirror. The first image capturing device is disposed at the second side of the dichroic mirror and is configured to detect the second light beam reflected from the dichroic mirror.

4. 发明授权

US09686517B2 Optical system and image compensating method of optical apparatus 有权
公开(公告)号：US09686517B2
公开(公告)日：2017-06-20
申请号：US14570258
申请日：2014-12-15
申请人： Test Research, Inc.
发明人： Liang-Pin Yu , Chih-Tien Tsai , Yeong-Feng Wang
IPC分类号： G03B21/14 , H04N9/31 , G02B13/16 , G02B27/12 , G02B26/08 , G03B17/54
CPC分类号： H04N9/3105 , G02B13/16 , G02B26/0833 , G02B27/0025 , G02B27/022 , G02B27/12 , G03B17/54 , G03B21/142 , G03B21/147 , G06K9/20 , H04N9/317 , H04N9/3185
摘要： An optical system includes an optical apparatus. The optical apparatus is for projecting a first projection image to a plane or detecting a first detected image of the plane. The optical apparatus includes a first image device, and a lens group. The first image device has an image surface having an image center. The lens group is disposed between the first image device and the plane and has a lens axis surface and an optic center. The optic center and the image center form a connection line. The plane has a tangent surface to an intersecting point of the connection line. The lens axis surface, the tangent surface, and an extension surface of the image surface substantially intersect at a straight line.

5. 发明授权

US09423242B2 Board-warping measuring apparatus and board-warping measuring method thereof 有权
标题翻译：板翘曲测量装置及其板翘曲测量方法
公开(公告)号：US09423242B2
公开(公告)日：2016-08-23
申请号：US14694421
申请日：2015-04-23
申请人： Test Research, Inc.
发明人： Liang-Pin Yu , Ying-Lin Pan , Chi-Yang Lin
IPC分类号： G01B11/14 , G01B11/16 , G01B11/25
CPC分类号： G01B11/167 , G01B11/2504 , G01B11/2513 , G01B11/306
摘要： A board-warping measuring method is configured to measure a device under test. The device under test is disposed on a measuring carrier. The board-warping measuring method includes: projecting a pattern onto the device under test, wherein the pattern includes plural reference points; capturing a measurement image by an image-capturing module when the pattern is projected onto the device under test, wherein the measurement image includes plural measurement points respectively corresponding to the reference points; calculating a position of each of the measurement points in the measurement image by utilizing a transfer function corresponding to each of the reference points to obtain position heights of the device under test corresponding to the measurement points; and compensating for board warping of the device under test based on the position heights of the device under test corresponding to the measurement points.
摘要翻译：板翘曲测量方法被配置为测量被测设备。被测设备设置在测量载体上。板翘曲测量方法包括：将图案投影到被测设备上，其中图案包括多个参考点; 当图案被投影到被测设备上时，通过图像捕获模块捕获测量图像，其中测量图像包括分别对应于参考点的多个测量点; 通过利用与每个参考点相对应的传递函数来计算测量图像中的每个测量点的位置，以获得对应于测量点的被测设备的位置高度; 并基于被测设备的位置高度对应于测量点来补偿被测设备的板翘曲。

6. 发明申请

US20160173836A1 OPTICAL SYSTEM AND IMAGE COMPENSATING METHOD OF OPTICAL APPARATUS 有权
标题翻译：光学装置的光学系统和图像补偿方法
公开(公告)号：US20160173836A1
公开(公告)日：2016-06-16
申请号：US14570258
申请日：2014-12-15
申请人： Test Research, Inc.
发明人： Liang-Pin YU , Chih-Tien TSAI , Yeong-Feng WANG
IPC分类号： H04N9/31 , G02B27/12 , H04N5/225 , G03B21/14 , H04N5/232 , G02B13/16 , G02B26/08
CPC分类号： H04N9/3105 , G02B13/16 , G02B26/0833 , G02B27/0025 , G02B27/022 , G02B27/12 , G03B17/54 , G03B21/142 , G03B21/147 , G06K9/20 , H04N9/317 , H04N9/3185
摘要： An optical system includes an optical apparatus. The optical apparatus is for projecting a first projection image to a plane or detecting a first detected image of the plane. The optical apparatus includes a first image device, and a lens group. The first image device has an image surface having an image center. The lens group is disposed between the first image device and the plane and has a lens axis surface and an optic center. The optic center and the image center form a connection line. The plane has a tangent surface to an intersecting point of the connection line. The lens axis surface, the tangent surface, and an extension surface of the image surface substantially intersect at a straight line.
摘要翻译：光学系统包括光学装置。光学设备用于将第一投影图像投影到平面或检测第一检测到的平面图像。光学装置包括第一图像装置和透镜组。第一图像装置具有具有图像中心的图像表面。透镜组设置在第一图像装置和平面之间，并且具有透镜轴表面和光学中心。光学中心和图像中心形成连接线。平面具有与连接线的相交点的切面。透镜轴表面，切面和图像表面的延伸表面基本上以直线相交。

7. 发明申请

US20040150714A1 Optical-enhanced apparatus and method for illuminating printed circuit boards for inspection 审中-公开
标题翻译：用于照明印刷电路板进行检查的光学增强装置和方法
公开(公告)号：US20040150714A1
公开(公告)日：2004-08-05
申请号：US10611198
申请日：2003-07-01
申请人： Test Research, Inc.
发明人： Don Lin
IPC分类号： H04N007/18
CPC分类号： G01N21/95684 , G01N21/8806 , G01N21/95607
摘要： The apparatus includes: an illumination system having a planar printed circuit board, and a plurality of light producing elements mounted on the planar printed circuit board and divided into at least one area, a control system, wherein the light producing elements can be selected from at least one area and lighted to illuminate by the control system, and a flat thin lens system in front of and connected to the illumination system to focus the lights emitted from the light producing elements onto any position of the printed circuit board. The method applied to proposed apparatus includes steps of: (a) choosing a position, (b) setting the illumination conditions, (c) producing the required illumination through focusing the lights on the chosen position, (d) recording the image of chosen position, (e) displaying the image, (f) comparing the recording image with the referencing image, and (g) making a record of comparison.
摘要翻译：该装置包括：具有平面印刷电路板的照明系统和安装在平面印刷电路板上并分成至少一个区域的多个发光元件，控制系统，其中可以从至少一个区域并通过控制系统照亮并照亮，以及在照明系统前面并连接到照明系统上的平坦薄透镜系统，以将从发光元件发射的光聚焦到印刷电路板的任何位置。应用于所提出的装置的方法包括以下步骤：（a）选择位置，（b）设置照明条件，（c）通过将光聚焦在所选位置上产生所需照明，（d）记录选定位置的图像（e）显示图像，（f）将记录图像与参考图像进行比较，和（g）进行比较记录。

8. 发明授权

US10600174B2 Optical inspection apparatus 有权
公开(公告)号：US10600174B2
公开(公告)日：2020-03-24
申请号：US14983470
申请日：2015-12-29
申请人： Test Research, Inc.
发明人： Yeong-Feng Wang
IPC分类号： H04N9/47 , G06T7/00 , H04N5/225 , G02B5/20 , G02B27/10 , G02B27/14
摘要： An optical inspection apparatus includes a dichroic mirror, a first light source, and a first image capturing device. The dichroic mirror has a first side and a second side opposite to the first side. The dichroic mirror transmits a first light beam and reflects a second light beam. The wavelength of the second light beam is different from the wavelength of the first light beam. The first light source is disposed at the first side of the dichroic mirror and is configured to provide the first light beam to pass through the dichroic mirror. The first image capturing device is disposed at the second side of the dichroic mirror and is configured to detect the second light beam reflected from the dichroic mirror.

9. 发明授权

US09841387B2 Inspection method and device 有权
公开(公告)号：US09841387B2
公开(公告)日：2017-12-12
申请号：US14986718
申请日：2016-01-03
申请人： Test Research, Inc.
发明人： Liang-Pin Yu , Chia-Ho Yen , Hao-Kai Chou , Chun-Ti Chen , Meng-Kun Lee
IPC分类号： G06K9/00 , G01N23/04 , G01B15/04
CPC分类号： G01N23/04 , G01B15/04 , G01B2210/56 , G06K9/00
摘要： An inspection method is provided herein. The inspection method is adapted for an inspection device. The inspection method includes: optically scanning an examining target for generating a scanned image; reconstructing the scanned image for a reconstructed volume; adjusting a slicing direction associated with the examining target for slicing the reconstructed volume into a sliced image; inspecting the sliced image for analyzing one or more features of the examining target; and outputting an inspection result of the examining target.

10. 发明授权

US09838612B2 Inspecting device and method for inspecting inspection target 有权
公开(公告)号：US09838612B2
公开(公告)日：2017-12-05
申请号：US14797188
申请日：2015-07-13
申请人： Test Research, Inc.
发明人： Yeong-Feng Wang , Kuang-Pu Wen
IPC分类号： H04N7/18 , H04N5/235 , G01N21/88 , H04N5/225 , G06T7/00
CPC分类号： H04N5/2354 , G01N21/8806 , G01N2021/8845 , G01N2201/061 , G06T7/0004 , G06T2207/30141 , H04N5/2256
摘要： An inspecting device for inspecting an inspection target is provided. The inspecting device includes a mono-color image-retrieving module, illuminating modules and a control module. The mono-color image-retrieving module is disposed above the inspection target with an optical axis orienting toward the inspection target. Each of the illuminating modules includes light-emitting elements of different colors. The control module controls the illuminating modules to sequentially generate illuminating lights both in an order of different colors and different incident angles to further control the mono-color image-retrieving module to sequentially retrieve mono-color images each in response to one illumination of the illuminating lights. The control module performs an inspection of the inspection target based on the mono-color images.

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