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1. 发明授权

US07797601B2 Slack-based transition-fault testing 有权
标题翻译：基于松弛的过渡故障测试
公开(公告)号：US07797601B2
公开(公告)日：2010-09-14
申请号：US12469820
申请日：2009-05-21
申请人： Rohit Kapur , Tom W. Williams , Cyrus Hay
发明人： Rohit Kapur , Tom W. Williams , Cyrus Hay
IPC分类号： G01R31/28 , G01R31/30 , G01R31/26 , G11B20/20 , G06F9/45
CPC分类号： G01R31/31725
摘要： A system that generates test patterns for detecting transition faults in an integrated circuit (IC). During operation, the system receives slack times for each net in the IC. Note that a slack time for a net is the minimum amount of delay that the given net can tolerate before violating a timing constraint. For each possible transition fault in the IC, the system uses the slack times for nets in the IC to generate a test pattern which exposes the transition fault by producing a transition that propagates along the longest path to the transition fault.
摘要翻译：一种生成用于检测集成电路（IC）中的过渡故障的测试模式的系统。在操作期间，系统为IC中的每个网络收到松弛时间。请注意，网络的松弛时间是给定网络在违反时序约束之前可以容忍的最小延迟时间。对于IC中的每个可能的过渡故障，系统使用IC中的网络的松弛时间来产生测试模式，该测试模式通过产生沿着最长路径传播到转换故障的转变来暴露过渡故障。

2. 发明申请

US20090235133A1 SLACK-BASED TRANSITION-FAULT TESTING 有权
标题翻译：基于SLACK的过渡故障测试
公开(公告)号：US20090235133A1
公开(公告)日：2009-09-17
申请号：US12469820
申请日：2009-05-21
申请人： Rohit Kapur , Tom W. Williams , Cyrus Hay
发明人： Rohit Kapur , Tom W. Williams , Cyrus Hay
IPC分类号： G01R31/28
CPC分类号： G01R31/31725
摘要： A system that generates test patterns for detecting transition faults in an integrated circuit (IC). During operation, the system receives slack times for each net in the IC. Note that a slack time for a net is the minimum amount of delay that the given net can tolerate before violating a timing constraint. For each possible transition fault in the IC, the system uses the slack times for nets in the IC to generate a test pattern which exposes the transition fault by producing a transition that propagates along the longest path to the transition fault.
摘要翻译：一种生成用于检测集成电路（IC）中的过渡故障的测试模式的系统。在操作期间，系统为IC中的每个网络收到松弛时间。请注意，网络的松弛时间是给定网络在违反时序约束之前可以容忍的最小延迟时间。对于IC中的每个可能的过渡故障，系统使用IC中的网络的松弛时间来产生测试模式，该测试模式通过产生沿着最长路径传播到转换故障的转变来暴露过渡故障。

3. 发明授权

US07546500B2 Slack-based transition-fault testing 有权
标题翻译：基于松弛的过渡故障测试
公开(公告)号：US07546500B2
公开(公告)日：2009-06-09
申请号：US11366679
申请日：2006-03-02
申请人： Rohit Kapur , Tom W. Williams , Cyrus Hay
发明人： Rohit Kapur , Tom W. Williams , Cyrus Hay
IPC分类号： G01R31/28
CPC分类号： G01R31/31725
摘要： A system that generates test patterns for detecting transition faults in an integrated circuit (IC). During operation, the system receives slack times for each net in the IC. Note that a slack time for a net is the minimum amount of delay that the given net can tolerate before violating a timing constraint. For each possible transition fault in the IC, the system uses the slack times for nets in the IC to generate a test pattern which exposes the transition fault by producing a transition that propagates along the longest path to the transition fault.
摘要翻译：一种生成用于检测集成电路（IC）中的过渡故障的测试模式的系统。在操作期间，系统为IC中的每个网络收到松弛时间。请注意，网络的松弛时间是给定网络在违反时序约束之前可以容忍的最小延迟时间。对于IC中的每个可能的过渡故障，系统使用IC中的网络的松弛时间来产生测试模式，该测试模式通过产生沿着最长路径传播到转换故障的转变来暴露过渡故障。

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