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1. 发明授权

US08266485B2 Test mode soft reset circuitry and methods 有权
标题翻译：测试模式软复位电路和方法
公开(公告)号：US08266485B2
公开(公告)日：2012-09-11
申请号：US13159311
申请日：2011-06-13
申请人： Baojing Liu , Matt Davidson , Vladimir Kovalev
发明人： Baojing Liu , Matt Davidson , Vladimir Kovalev
IPC分类号： G01R31/28 , G06F11/00
CPC分类号： G06F11/267 , G01R31/318555
摘要： A soft-function trigger state machine includes state machine logic defined to use a scan-in waveform to sample a scan-clock waveform to obtain a sampled data pattern. The state machine logic is defined to compare the sampled data pattern to a soft action pattern to determine whether the sampled data pattern matches the soft action pattern. The state machine logic is also defined to trigger an action associated with the soft action pattern when the sampled data pattern matches the soft action pattern.
摘要翻译：软功能触发状态机包括定义为使用扫描波形采样扫描时钟波形以获得采样数据模式的状态机逻辑。定义状态机逻辑以将采样数据模式与软动作模式进行比较，以确定采样数据模式是否与软操作模式匹配。当采样数据模式与软动作模式匹配时，状态机逻辑也被定义为触发与软动作模式相关联的动作。

2. 发明授权

US07962819B2 Test mode soft reset circuitry and methods 有权
标题翻译：测试模式软复位电路和方法
公开(公告)号：US07962819B2
公开(公告)日：2011-06-14
申请号：US12019534
申请日：2008-01-24
申请人： Baojing Liu , Matt Davidson , Vladimir Kovalev
发明人： Baojing Liu , Matt Davidson , Vladimir Kovalev
IPC分类号： G01R31/28 , G06F11/00
CPC分类号： G06F11/267 , G01R31/318555
摘要： An integrated circuit chip includes a scan-in pin, a scan clock pin, and a test controller. The scan-in pin and the scan clock pin receive a test program for the type of test mode and a soft-reset pattern. A state machine is configured to direct sampling of a scan clock waveform provided through the scan clock pin as dictated by transitions of a scan-in waveform provided through the scan-in pin. The state machine identifies a bit match from the sampled scan clock waveform upon executing the soft-reset pattern. The identified bit match triggers a soft reset which eliminates the need for an extra reset pin, when testing in scan mode.
摘要翻译：集成电路芯片包括扫描引脚，扫描时钟引脚和测试控制器。扫描引脚和扫描时钟引脚接收测试模式类型和软复位模式的测试程序。状态机被配置为直接对通过扫描时钟引脚提供的扫描时钟波形进行采样，如通过扫描引脚提供的扫描波形的转换所指示的。执行软复位模式时，状态机从采样的扫描时钟波形中识别位匹配。识别的位匹配触发软复位，在扫描模式下进行测试时，无需额外的复位引脚。

3. 发明申请

US20090193305A1 TEST MODE SOFT RESET CIRCUITRY AND METHODS 有权
标题翻译：测试模式软复位电路和方法
公开(公告)号：US20090193305A1
公开(公告)日：2009-07-30
申请号：US12019534
申请日：2008-01-24
申请人： Baojing Liu , Matt Davidson , Vladimir Kovalev
发明人： Baojing Liu , Matt Davidson , Vladimir Kovalev
IPC分类号： G01R31/28 , G06F11/25
CPC分类号： G06F11/267 , G01R31/318555
摘要： An integrated circuit chip having testing logic for testing circuitry of the integrated circuit chip is provided. The integrated circuit chip includes at least a scan-in pin, a scan clock pin, and a test controller. The test controller has test mode registers for storing a type of test mode to be executed, and the test controller accepting signals from the scan-in pin and the scan clock pin. The scan-in pin and the scan clock pin receiving a test program for the type of test mode and a soft-reset pattern. Also included is a state machine logic that is part of the integrated circuit chip. The state machine logic, during execution of the test program, being configured to direct sampling of a scan clock waveform provided through the scan clock pin as dictated by transitions of a scan-in waveform provided through the scan-in pin. The sampling by the state machine circuitry identifying a bit match from the sampled scan clock waveform upon executing the soft-reset pattern. The identified bit match triggering a soft reset by updating the test mode registers of the test controller. The soft reset therefore eliminates the need for an extra reset pin, when testing in scan mode. The communication channel defined through the use of the scan-in and scan clock pins can be used to trigger other soft actions.
摘要翻译：提供具有用于集成电路芯片的测试电路的测试逻辑的集成电路芯片。集成电路芯片至少包括扫描引脚，扫描时钟引脚和测试控制器。测试控制器具有用于存储要执行的测试模式类型的测试模式寄存器，并且测试控制器接受来自扫描引脚和扫描时钟引脚的信号。扫描引脚和扫描时钟引脚接收测试模式类型的测试程序和软复位模式。还包括作为集成电路芯片的一部分的状态机逻辑。在执行测试程序期间，状态机逻辑被配置为直接通过扫描时钟引脚提供的扫描时钟波形的采样，如通过扫描引脚提供的扫描波形的转变所指示的。在执行软复位模式时，由状态机电路进行采样，从采样的扫描时钟波形中识别位匹配。所识别的位匹配通过更新测试控制器的测试模式寄存器来触发软复位。因此，在扫描模式下进行测试时，软复位不需要额外的复位引脚。通过使用扫描和扫描时钟引脚定义的通信通道可用于触发其他软操作。

4. 发明申请

US20110246844A1 Test Mode Soft Reset Circuitry and Methods 有权
标题翻译：测试模式软复位电路和方法
公开(公告)号：US20110246844A1
公开(公告)日：2011-10-06
申请号：US13159311
申请日：2011-06-13
申请人： Baojing Liu , Matt Davidson , Vladimir Kovalev
发明人： Baojing Liu , Matt Davidson , Vladimir Kovalev
IPC分类号： G01R31/3177 , G06F11/25
CPC分类号： G06F11/267 , G01R31/318555
摘要： A soft-function trigger state machine includes state machine logic defined to use a scan-in waveform to sample a scan-clock waveform to obtain a sampled data pattern. The state machine logic is defined to compare the sampled data pattern to a soft action pattern to determine whether the sampled data pattern matches the soft action pattern. The state machine logic is also defined to trigger an action associated with the soft action pattern when the sampled data pattern matches the soft action pattern.
摘要翻译：软功能触发状态机包括定义为使用扫描波形采样扫描时钟波形以获得采样数据模式的状态机逻辑。定义状态机逻辑以将采样数据模式与软动作模式进行比较，以确定采样数据模式是否与软操作模式匹配。当采样数据模式与软动作模式匹配时，状态机逻辑也被定义为触发与软动作模式相关联的动作。

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