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    • 1. 发明授权
    • Substrate for magnetic disk and magnetic disk
    • 基板用于磁盘和磁盘
    • US08734967B2
    • 2014-05-27
    • US13001984
    • 2009-06-29
    • Kouji KitsunaiHiroshi TakedaYukari Senda
    • Kouji KitsunaiHiroshi TakedaYukari Senda
    • G11B5/71G11B5/706G11B15/12
    • G11B5/7315C03C3/083G11B5/82G11B20/1816G11B2220/2516Y10T428/21
    • The shape and number of surface defects are controlled so that the occurrence of failure is suppressed in an HDD device in which a magnetic head with a very small flying height, such as a DFH head, is mounted.A magnetic disk substrate is characterized in that when laser light with a wavelength of 405 nm and a laser power of 25 mW is irradiated with a spot size of 5 μm and scattered light from the substrate is detected, the number of defects detected to have a size of 0.1 μm to not more than 0.3 μm is less than 50 per 24 cm2 and, with respect to the defects, there is no defect in which, in a bearing curve obtained by a bearing curve plot method using an atomic force microscope, a portion from an apex of the defect to 45% thereof is located in an area of defect height higher than a virtual line connecting from the apex of the defect to 45% thereof.
    • 控制表面缺陷的形状和数量,使得在安装有诸如DFH头的飞行高度非常小的磁头的HDD装置中,可以抑制故障的发生。 磁盘基板的特征在于,当以5μm的点尺寸照射波长为405nm,激光功率为25mW的激光,并检测到来自基板的散射光时,检测出具有 0.1μm〜0.3μm的尺寸小于每24cm 2的50个,对于缺陷,没有缺陷,在通过使用原子力显微镜的轴承曲线绘图法得到的轴承曲线中, 从缺陷的顶点到其45%的部分位于高于从缺陷的顶点连接到其缺陷的虚拟线的缺陷高度的45%的区域中。
    • 2. 发明申请
    • SUBSTRATE FOR MAGNETIC DISK AND MAGNETIC DISK
    • 磁盘和磁盘基板
    • US20110109994A1
    • 2011-05-12
    • US13001984
    • 2009-06-29
    • Kouji KitsunaiHiroshi TakedaYukari Senda
    • Kouji KitsunaiHiroshi TakedaYukari Senda
    • G11B5/82G11B5/706
    • G11B5/7315C03C3/083G11B5/82G11B20/1816G11B2220/2516Y10T428/21
    • The shape and number of surface defects are controlled so that the occurrence of failure is suppressed in an HDD device in which a magnetic head with a very small flying height, such as a DFH head, is mounted.A magnetic disk substrate is characterized in that when laser light with a wavelength of 405 nm and a laser power of 25 mW is irradiated with a spot size of 5 μm and scattered light from the substrate is detected, the number of defects detected to have a size of 0.1 μm to not more than 0.3 μm is less than 50 per 24 cm2 and, with respect to the defects, there is no defect in which, in a bearing curve obtained by a bearing curve plot method using an atomic force microscope, a portion from an apex of the defect to 45% thereof is located in an area of defect height higher than a virtual line connecting from the apex of the defect to 45% thereof.
    • 控制表面缺陷的形状和数量,使得在安装有诸如DFH头的飞行高度非常小的磁头的HDD装置中,可以抑制故障的发生。 磁盘基板的特征在于,当以5μm的点尺寸照射波长为405nm,激光功率为25mW的激光,并检测到来自基板的散射光时,检测出具有 0.1μm〜0.3μm的尺寸小于每24cm 2的50个,对于缺陷,没有缺陷,在通过使用原子力显微镜的轴承曲线绘图法得到的轴承曲线中, 从缺陷的顶点到其45%的部分位于高于从缺陷的顶点连接到其缺陷的虚拟线的缺陷高度的45%的区域中。