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    • 7. 发明授权
    • Integrated circuit device having an internal state monitoring function
    • 具有内部状态监视功能的集成电路装置
    • US06996754B1
    • 2006-02-07
    • US09672223
    • 2000-09-27
    • Yun-Sang Lee
    • Yun-Sang Lee
    • G01R31/28
    • G11C29/48G11C29/1201
    • An integrated circuit device for testing is disclosed. The device includes a plurality of internal circuits for generating a plurality of internal signals, the internal signals used for addressing storage locations and for controlling internal operations, a first selection circuit for receiving the internal circuits in response to selection signals corresponding to test information signals, a second selection circuit for receiving output signals from the first selection circuit and output signals from a sense amplifier, and for opening an alternative one of transfer paths of the internal signals and the output signals in response to the selection signals, and a data output buffer for transferring output signals from the second selection signals to an outside of the device through data input/output pads.
    • 公开了一种用于测试的集成电路装置。 该装置包括用于产生多个内部信号的多个内部电路,用于寻址存储位置和用于控制内部操作的内部信号,用于响应于与测试信息信号对应的选择信号接收内部电路的第一选择电路, 第二选择电路,用于接收来自第一选择电路的输出信号和来自读出放大器的输出信号,以及响应于选择信号打开内部信号和输出信号的传输路径中的另一个传输路径;以及数据输出缓冲器 用于通过数据输入/输出焊盘将输出信号从第二选择信号传送到设备的外部。
    • 8. 发明授权
    • DRAM partial refresh circuits and methods
    • DRAM部分刷新电路和方法
    • US06982917B2
    • 2006-01-03
    • US10192406
    • 2002-07-10
    • Yun-sang LeeWon-chang Jung
    • Yun-sang LeeWon-chang Jung
    • G11C7/00
    • G11C11/406
    • Circuits and methods for refreshing memory banks in a DRAM are provided. A refresh circuit is provided in a DRAM having at least one memory bank and a plurality of word lines connected to memory locations in the memory bank. The word lines are subdivided into first and second groups of subword lines. The refresh circuit includes a delay circuit, a first driving circuit, and a second driving circuit. The delay circuit receives a refresh signal and outputs a delayed refresh signal a predetermined time delay later. The first driving circuit responds to the refresh signal by driving word lines in the first group of subword lines and the second driving circuit responds to the delayed refresh signal by driving word lines in the second group of subword lines.
    • 提供了用于刷新DRAM中的存储体的电路和方法。 在具有至少一个存储体和连接到存储体中的存储器位置的多条字线的DRAM中提供刷新电路。 字线被细分为第一和第二组子字线。 刷新电路包括延迟电路,第一驱动电路和第二驱动电路。 延迟电路接收刷新信号并且稍后在预定的时间延迟中输出延迟的刷新信号。 第一驱动电路通过驱动第一组子字线中的字线来响应刷新信号,并且第二驱动电路通过驱动第二组子字线中的字线来响应延迟的刷新信号。
    • 9. 发明申请
    • Semiconductor memory device with auto refresh to specified bank
    • 具有自动刷新到指定银行的半导体存储器件
    • US20050243627A1
    • 2005-11-03
    • US11105169
    • 2005-04-12
    • Yun-Sang LeeJung-Bae Lee
    • Yun-Sang LeeJung-Bae Lee
    • G11C11/401G11C7/00G11C11/406
    • G11C11/40611G11C11/406G11C11/40618
    • Method and apparatus for use with multi-bank Synchronous Dynamic Random Access Memory (SDRAM) circuits, modules, and memory systems are disclosed. In one described embodiment, an SDRAM circuit receives a bank address to be used in an auto-refresh operation, and performs the auto-refresh operation on the specified bank and for a current refresh row. When all bank addresses have been supplied for the current row, the SDRAM circuit updates the current refresh row and repeats the process. This process can allow a memory controller to modify an auto-refresh bank sequence as necessary such that auto-refresh operations can proceed on some memory banks concurrently with reads and writes to other memory banks, allowing better utilization of the SDRAM circuit. Other embodiments are described and claimed.
    • 公开了用于多存储体同步动态随机存取存储器(SDRAM)电路,模块和存储器系统的方法和装置。 在一个描述的实施例中,SDRAM电路接收要在自动刷新操作中使用的存储体地址,并对指定的存储体和当前刷新行执行自动刷新操作。 当所有存储体地址已被提供给当前行时,SDRAM电路更新当前刷新行并重复该过程。 该过程可以允许存储器控制器根据需要修改自动刷新存储体序列,使得自动刷新操作可以在一些存储体上与对其它存储体的读取和写入同时进行,从而更好地利用SDRAM电路。 描述和要求保护其他实施例。
    • 10. 发明授权
    • Semiconductor memory device having write column select line or read column select line for shielding signal line
    • 具有用于屏蔽信号线的写列选择线或读列选择线的半导体存储器件
    • US06775170B2
    • 2004-08-10
    • US10222110
    • 2002-08-16
    • Yun-Sang LeeWon-Chang Jung
    • Yun-Sang LeeWon-Chang Jung
    • G11C702
    • G11C7/02G11C7/1048G11C2207/002
    • A semiconductor memory device comprises a write column select line or read column select line for shielding a signal line. The semiconductor memory device may include a signal line, a read column select line, and a write column select line. The signal line may transmit an operation signal related to the operation of the semiconductor memory device. The read column select line may transmit a read column select signal, which may control transfer of a data signal of a bit line to a data line. The write column select line may transmit a write column select signal, which may control transfer of the data signal of the data line to the bit line. One of the read column select line and the write column select line to transmit a deactivated column select signal among the read column select signal and the write column select signal, may be maintained at a predetermined logic level and may shield the signal line.
    • 半导体存储器件包括用于屏蔽信号线的写入列选择线或读取列选择线。 半导体存储器件可以包括信号线,读取列选择线和写入列选择线。 信号线可以发送与半导体存储器件的操作相关的操作信号。 读列选择线可以发送读列选择信号,其可以控制位线的数据信号到数据线的传送。 写列选择线可以发送写列选择信号,其可以控制数据线的数据信号到位线的传送。 在读列选择信号和写列选择信号之间读取列选择线和写列选择线之一发送去激活的列选择信号可以保持在预定的逻辑电平并且可以屏蔽信号线。