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1. 发明授权

US09606212B1 Systems and methods for time/frequency indexed pulse calibrations for vector network analyzers 有权
公开(公告)号：US09606212B1
公开(公告)日：2017-03-28
申请号：US14213134
申请日：2014-03-14
申请人： ANRITSU COMPANY
发明人： Jon S. Martens
IPC分类号： G01R35/00 , G01R31/00
CPC分类号： G01R35/005 , G01R27/32
摘要： A method for measuring scattering parameters in a device under test (DUT) using a vector network analyzer (VNA), includes calibrating the VNA to generate corrections for deterministic setup defects and mapping a plurality of error terms based on a plurality of time indices, wherein each time indicia is associated with an error term. A test signal is transmitted to the DUT to obtain a measurement signal from the DUT in response to the test signal. The generated corrections to obtained measurements are time aligned based on the mapped error terms.

2. 发明授权

US09753071B1 System and method for improved resolution pulsed radio frequency (RF) measurements with phase coherence 有权
公开(公告)号：US09753071B1
公开(公告)日：2017-09-05
申请号：US14213291
申请日：2014-03-14
申请人： ANRITSU COMPANY
发明人： Jon S. Martens
IPC分类号： G01R27/28 , G01R27/32
CPC分类号： G01R27/32 , G01R27/28 , G01R31/2822
摘要： A method for obtaining improved resolution pulsed radio frequency (RF) measurements with phase coherence for a device under test (DUT) using a vector network analyzer (VNA) includes generating a pulsed RF test signal, transmitting the pulsed RF test signal to the DUT and receiving a signal from the DUT at the VNA in response to the pulsed RF test signal. An intermediate frequency (IF) signal is generated using a local oscillator (LO) signal. A phase of the LO signal is shifted by a prescribed amount while generating the IF signal. The IF signal is then sampled over multiple pulses and measurements are constructed from the measurements. A discrete Fourier transform (DFT) is then applied to the constructed measurements.

3. 发明授权

US10225073B1 System and method for continuous acquisition of data during frequency and power sweeps with coherent measurement 有权
公开(公告)号：US10225073B1
公开(公告)日：2019-03-05
申请号：US15442415
申请日：2017-02-24
申请人： ANRITSU COMPANY
发明人： Jon S. Martens , Elena Vayner , Jamie Tu
IPC分类号： G01R27/28 , H04L7/033 , H04L12/26 , G01R31/00
摘要： A system for obtaining measurements for a device under test (DUT) includes a vector network analyzer including a storage medium and a controller for controlling a sweep and a trigger driver configured to provide a synchronization signal to the DUT and the controller to synchronize internal signal components of the vector network analyzer including signal sources, local oscillators (LOs) and an analog-to-digital converter (ADC) clock. A signal is received by the vector network analyzer in response to a test signal generated and transmitted to the DUT. Data related to the received signal is acquired and stored in at the storage medium. The controller inserts a mark into the time record based on an event of the sweep for identifying data from the received signal associated with the event within the time record.

4. 发明授权

US10788529B1 Method for network extraction based on phase localization 有权
公开(公告)号：US10788529B1
公开(公告)日：2020-09-29
申请号：US15967387
申请日：2018-04-30
申请人： ANRITSU COMPANY
发明人： Jon S. Martens
IPC分类号： G01R31/28 , G01R31/319
摘要： A method of network extraction based on phase localization using a test setup including a standard includes measuring frequency data using a measuring instrument connected with the test setup by performing a frequency sweep across an identified bandwidth, correlating filter functions as required against the measured frequency domain data to localize phase across the test setup, removing excess phase rotation and solving for inner plane match of the test setup based on known composite measurement and previously identified components of the test setup.

5. 发明授权

US09176174B1 Systems and methods for simultaneously measuring forward and reverse scattering parameters 有权
标题翻译：同时测量正向和反向散射参数的系统和方法
公开(公告)号：US09176174B1
公开(公告)日：2015-11-03
申请号：US14213171
申请日：2014-03-14
申请人： ANRITSU COMPANY
发明人： Donald Anthony Bradley , Karam Michael Noujeim , Jon S. Martens
IPC分类号： G01R27/28 , G01R31/00 , G01R31/319
CPC分类号： G01R27/28 , G01R29/26 , G01R31/31924
摘要： A system adapted to measure electrical performance of a device under test (DUT) having two or more ports includes a plurality of signal sources synchronized and configured to generated signals simultaneously, a plurality of first signal paths to obtain transmitted and reflected signals from the DUT, a plurality of second signal paths to obtain incident signals from the signal sources, and a receiver for receiving the reflected, transmitted and incident signals obtained at the first signal paths and the second signal paths. The receiver is adapted to separate the reflected and the transmitted signals obtained from each of the first signal paths. The signal sources are configured to each generate a signal having a frequency offset from each of the others of the signal sources by a known frequency delta.
摘要翻译：一种适于测量具有两个或多个端口的被测设备（DUT）的电气性能的系统包括同步并被配置为同时产生信号的多个信号源，多个第一信号路径以从DUT获得发射和反射的信号，多个第二信号路径，用于从信号源获得入射信号，以及接收器，用于接收在第一信号路径和第二信号路径处获得的反射，发射和入射信号。接收器适于分离从每个第一信号路径获得的反射信号和发射信号。信号源被配置为每个通过已知的频率增量产生具有来自信号源中的每一个的频率偏移的信号。

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