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1. 发明授权

US07181066B1 Method for locating bar codes and symbols in an image 有权
标题翻译：用于定位图像中条形码和符号的方法
公开(公告)号：US07181066B1
公开(公告)日：2007-02-20
申请号：US10329908
申请日：2002-12-26
申请人： Adam Wagman , Sateesh G. Nadabar , Jason Davis
发明人： Adam Wagman , Sateesh G. Nadabar , Jason Davis
IPC分类号： G06K9/18
CPC分类号： G06K7/14 , G06K7/1443 , G06K2009/3225
摘要： A search method is disclosed for finding bar code symbols and various two-dimensional symbols, regardless of orientation, that is efficient, robust, and easy to use. The method works well on cluttered backgrounds, on skewed symbols, when symbols are almost touching, and when symbols are adjacent to text. The method includes choosing a candidate start region in the image, and then determining whether the candidate start region includes at least a portion of a candidate oriented encoded signal. Next, an approximate orientation of the candidate oriented encoded signal is determined. Then, the candidate start region is grown, using the approximate orientation, so as to form a candidate symbol region that encloses an entire candidate code symbol, including at least a portion of the candidate start region. The method is finely responsive to orientation.
摘要翻译：公开了一种搜索方法，用于找到条形码符号和各种二维符号，而不管取向如何，这是有效的，鲁棒的和易于使用的。该方法适用于杂乱的背景，偏斜的符号，符号几乎接触时，符号与文本相邻。该方法包括选择图像中的候选开始区域，然后确定候选开始区域是否包括候选定向编码信号的至少一部分。接下来，确定候选定向编码信号的近似取向。然后，使用近似取向生长候选开始区域，以形成包含候选开始区域的至少一部分的整个候选代码符号的候选符号区域。该方法对取向有很好的响应。

2. 发明授权

US07162073B1 Methods and apparatuses for detecting classifying and measuring spot defects in an image of an object 有权
标题翻译：用于检测物体的图像中的斑点缺陷的分类和测量的方法和装置
公开(公告)号：US07162073B1
公开(公告)日：2007-01-09
申请号：US10001177
申请日：2001-11-30
申请人： Yusuf Akgul , Ivan Bachelder , Adam Wagman , Jason Davis , Juha Koljonen , Prabhav Morje
发明人： Yusuf Akgul , Ivan Bachelder , Adam Wagman , Jason Davis , Juha Koljonen , Prabhav Morje
IPC分类号： G06K9/00 , G01N21/00
CPC分类号： G01N21/8851 , G06K9/38 , G06K2209/19 , G06T7/0004 , G06T7/174 , G06T7/194 , G06T2207/10056 , G06T2207/20081 , G06T2207/30108
摘要： A method is provided for detecting spot defects on an object when an allowable variation (called the “background”) in the appearance of the object can be modeled. Methods are also provided for measuring and classifying detected spot defects. An alignment model is used to align the image of the object, a background model is then used to estimate the (possibly different) background in each region, and each background is substantially removed from the image so as to form a foreground image on which blob analysis can be applied to detect spot defects, the blob analysis using a threshold image that accommodates different noise statistics for each region. The method facilitates robust spot defect inspection of fiber optic end faces, or of any object with different object regions. The method also allows use of blob analysis over a larger range of conditions, including conditions that make simple blob analysis infeasible.
摘要翻译：提供了一种用于在物体的外观中允许的变化（称为“背景”）来建模时，用于检测物体上的斑点缺陷的方法。还提供了用于测量和分类检测到的斑点缺陷的方法。使用对准模型对准对象的图像，然后使用背景模型来估计每个区域中的（可能不同的）背景，并且基本上从图像中删除每个背景，以便形成在其上的前景图像可以应用分析来检测斑点缺陷，使用适应每个区域的不同噪声统计的阈值图像进行斑点分析。该方法有助于光纤端面或具有不同物体区域的任何物体的鲁棒斑点缺陷检测。该方法还允许在更大范围的条件下使用斑点分析，包括使简单斑点分析不可行的条件。

3. 发明授权

US08270748B1 Method for fast, robust, multi-dimensional pattern recognition 有权
公开(公告)号：US08270748B1
公开(公告)日：2012-09-18
申请号：US11022895
申请日：2004-12-24
申请人： William M. Silver , Sanjay Nichani , Adam Wagman
发明人： William M. Silver , Sanjay Nichani , Adam Wagman
IPC分类号： G06K9/40 , G06K9/36
CPC分类号： G06K9/6201 , G06K9/481 , G06K9/6204
摘要： Disclosed is a method for determining the absence or presence of one or more instances of a predetermined pattern in an image, and for determining the location of each found instance within a multidimensional space. A model represents the pattern to be found, the model including a plurality of probes. Each probe represents a relative position at which a test is performed in an image at a given pose, each such test contributing evidence that the pattern exists at the pose. The method further includes a comparison of the model with a run-time image at each of a plurality of poses. A match score is computed at each pose to provide a match score surface. Then, the match score is compared with an accept threshold, and used to provide the location any instances of the pattern in the image.

4. 发明授权

US07016539B1 Method for fast, robust, multi-dimensional pattern recognition 失效
公开(公告)号：US07016539B1
公开(公告)日：2006-03-21
申请号：US09114335
申请日：1998-07-13
申请人： William M. Silver , E. John McGarry , Matthew L. Hill , Nigel Foster , Sanjay Nichani , Willard P. Foster , Adam Wagman
发明人： William M. Silver , E. John McGarry , Matthew L. Hill , Nigel Foster , Sanjay Nichani , Willard P. Foster , Adam Wagman
IPC分类号： G06K9/62
CPC分类号： G06K9/6201 , G06K9/481 , G06K9/6204
摘要： Disclosed is a method for determining the absence or presence of one or more instances of a predetermined pattern in an image, and for determining the location of each found instance within a multidimensional space. A model represents the pattern to be found, the model including a plurality of probes. Each probe represents a relative position at which a test is performed in an image at a given pose, each such test contributing evidence that the pattern exists at the pose. The method further includes a comparison of the model with a run-time image at each of a plurality of poses. A match score is computed at each pose to provide a match score surface. Then, the match score is compared with an accept threshold, and used to provide the location any instances of the pattern in the image.

5. 发明授权

US06993192B1 Fast high-accuracy multi-dimensional pattern inspection 有权
公开(公告)号：US06993192B1
公开(公告)日：2006-01-31
申请号：US10705288
申请日：2003-11-10
申请人： William Silver , Aaron Wallack , Adam Wagman
发明人： William Silver , Aaron Wallack , Adam Wagman
IPC分类号： G06K9/62
CPC分类号： G06K9/32 , G06K9/6203 , G06T7/75
摘要： A method and apparatus are provided for identifying differences between a stored pattern and a matching image subset, where variations in pattern position, orientation, and size do not give rise to false differences. The invention is also a system for analyzing an object image with respect to a model pattern so as to detect flaws in the object image. The system includes extracting pattern features from the model pattern; generating a vector-valued function using the pattern features to provide a pattern field; extracting image features from the object image; evaluating each image feature, using the pattern field and an n-dimensional transformation that associates image features with pattern features, so as to determine at least one associated feature characteristic; and using at least one feature characteristic to identify at least one flaw in the object image. The invention can find at least two distinct kinds of flaws: missing features, and extra features. The invention provides pattern inspection that is faster and more accurate than any known prior art method by using a stored pattern that represents an ideal example of the object to be found and inspected, and that can be translated, rotated, and scaled to arbitrary precision much faster than digital image re-sampling, and without pixel grid quantization errors. Furthermore, since the invention does not use digital image re-sampling, there are no pixel quantization errors to cause false differences between the pattern and image that can limit inspection performance.

6. 发明授权

US06941016B1 Method for finding contours in an image of an object 失效
标题翻译：在物体图像中查找轮廓的方法
公开(公告)号：US06941016B1
公开(公告)日：2005-09-06
申请号：US10035993
申请日：2001-12-31
申请人： Adam Wagman , Ivan Bachelder
发明人： Adam Wagman , Ivan Bachelder
IPC分类号： G06K9/48 , G06T5/00
CPC分类号： G06T7/0004 , G06K9/4638 , G06K9/48 , G06K2009/488 , G06T5/005 , G06T7/12 , G06T7/181 , G06T2207/10056 , G06T2207/20021 , G06T2207/30108
摘要： A method is provided for robustly and efficiently identifying contours in an image of an object. Features are extracted from an image, typically using a Sobel edge detector or a set of large oriented filters, and are locally chained to form contour segments of particular character, such as line segments. A spatial hash table is used to access the contour segments according to the location of their endpoints. Candidate sets for joining to grow contours are reduced by considering only segments having ends in adjacent spatial hash bins. Contour constraints are applied to appropriately choose among the candidates to form contours. The method facilitates robust and efficient scratch detection of fiber-optic end faces, or of any surface that may have smoothly curved scratches.
摘要翻译：提供了一种用于鲁棒且有效地识别对象的图像中的轮廓的方法。特征是从图像中提取的，通常使用Sobel边缘检测器或一组大的定向滤光片，并且被局部链接以形成特定字符的轮廓段，例如线段。空间哈希表用于根据其端点的位置访问轮廓段。通过仅考虑在相邻空间哈希仓中具有末端的段来减少用于加入轮廓的候选集。轮廓约束适用于候选人之间的适当选择以形成轮廓。该方法有助于光纤端面或任何可能具有平滑弯曲划痕的表面的鲁棒和有效的划痕检测。

7. 发明授权

US06856698B1 Fast high-accuracy multi-dimensional pattern localization 有权
标题翻译：快速高精度多维图案定位
公开(公告)号：US06856698B1
公开(公告)日：2005-02-15
申请号：US10273855
申请日：2002-10-18
申请人： William Silver , Aaron Wallack , Adam Wagman
发明人： William Silver , Aaron Wallack , Adam Wagman
IPC分类号： G06K9/48 , G06K9/62 , G06K9/64
CPC分类号： G06K9/6204
摘要： A method and apparatus are provided for rapidly refining a given approximate location of a pattern to produce a more accurate location. The invention employs a multi-dimensional space that includes translation, orientation, and scale. The invention can serve as a replacement for the fine resolution phase of any coarse-fine system for pattern location. Patterns and images are represented by a feature-based description that can be translated, rotated, and scaled to arbitrary precision much faster than digital image re-sampling, and without pixel grid quantization errors. Thus, accuracy is not limited by the ability of a grid to represent small changes in position, orientation, or size (or other degrees of freedom). The invention determines an accurate object pose from an approximate starting pose in a small, fixed number of increments that is independent of the number of dimensions of the space, and independent of the distance between the starting and final poses, provided that the starting pose is within the “capture range” of the true pose. Thus, accuracy need not be sacrificed to keep execution time acceptable for practical applications. Specifying locations in four or more dimensions will often result in better matches between the pattern and image than two-dimensional location systems, thereby improving accuracy. Accuracy is not degraded if some portion of the object is missing or occluded, or if unexpected extra features are present.
摘要翻译：提供了一种方法和装置，用于快速地精化图案的给定的近似位置以产生更准确的位置。本发明采用包括平移，取向和尺度的多维空间。本发明可以作为用于图案定位的任何粗细系统的精细分辨率相位的替代。模式和图像由基于特征的描述表示，其可以比数字图像重新采样更快地转换，旋转和缩放到任意精度，并且没有像素网格量化误差。因此，精度不受网格表示位置，方向或大小（或其他自由度）的小变化的能力的限制。本发明根据独立于空间的数量的小的固定数量的增量来确定来自近似起始姿态的准确的物体姿态，并且独立于起始和最终姿态之间的距离，只要起始姿势为在“拍摄范围”内的真实姿势。因此，不需要牺牲精度来保持实际应用可接受的执行时间。在四维或更多维度上指定位置通常会导致图形和图像之间比二维位置系统更好的匹配，从而提高准确性。如果对象的某些部分丢失或遮挡，或者如果出现意外的额外特征，则精度不会降低。

8. 发明授权

US09412158B2 Method of configuring a machine vision application program for execution on a multi-processor computer 有权
标题翻译：配置机器视觉应用程序以在多处理器计算机上执行的方法
公开(公告)号：US09412158B2
公开(公告)日：2016-08-09
申请号：US12194055
申请日：2008-08-19
申请人： Jason Adam Davis , Adam Wagman
发明人： Jason Adam Davis , Adam Wagman
IPC分类号： G06T7/00 , G06F9/44 , G06T1/20 , G06F9/50 , G05B19/42 , G05B19/042
CPC分类号： G06T7/0004 , G05B19/0421 , G05B2219/37208 , G06F8/314 , G06F9/5066 , G06F2209/5017 , G06F2209/504 , G06T1/20 , Y02P90/265
摘要： A machine vision system includes a computer with one or more processors and software that has a plurality of tool routines each performing a different image analysis function. A machine vision application program is created by selecting certain ones of the plurality of tool routines to analyze the image. A maximum number of processors on the computer is designated as available for executing a machine vision application, wherein the maximum number may be less than the total number of processors on the computer. When the machine vision application program operates execution of each tool routine is limited to using simultaneously no more than the maximum number of processors.
摘要翻译：机器视觉系统包括具有一个或多个处理器的计算机和具有多个工具程序的软件，每个工具程序执行不同的图像分析功能。通过选择多个工具例程中的某些来分析图像来创建机器视觉应用程序。计算机上的最大处理器数量被指定为可用于执行机器视觉应用，其中最大数量可以小于计算机上的处理器总数。当机器视觉应用程序操作每个工具程序的执行被限制为同时使用不超过最大数量的处理器。

9. 发明申请

US20130142421A1 Method for Fast, Robust, Multi-Dimensional Pattern Recognition 有权
标题翻译：快速，鲁棒，多维模式识别的方法
公开(公告)号：US20130142421A1
公开(公告)日：2013-06-06
申请号：US13656167
申请日：2012-10-19
申请人： William M. Silver , E. John McGarry , Sanjay Nichani , Adam Wagman
发明人： William M. Silver , E. John McGarry , Sanjay Nichani , Adam Wagman
IPC分类号： G06K9/62
CPC分类号： G06K9/6201 , G06K9/481 , G06K9/6204
摘要： A method and system for probe-based pattern matching including an apparatus for synthetic training of a model of a pattern. The apparatus comprises a sensor for obtaining an image of the pattern and a processor for receiving the image of the pattern from the sensor and running a program. In the steps performed by the program a boundary of the pattern in the image is identified. A plurality of positive probes are placed at selected points along the boundary of the pattern and at least one straight segment of the boundary of the pattern is identified. The at least one straight segment of the boundary is extended to provide an imaginary straight segment and a plurality of negative probes are placed at selected points along the imaginary straight segment, where each negative probe has a negative weight.
摘要翻译：一种用于基于探针的模式匹配的方法和系统，包括用于模式模型的合成训练的装置。该装置包括用于获得图案的图像的传感器和用于从传感器接收图案的图像并运行程序的处理器。在由程序执行的步骤中，识别图像中的图案的边界。沿着图案的边界的选定点放置多个正探针，并且识别图案的边界的至少一个直线段。边界的至少一个直线段被延伸以提供假想的直线段，并且多个负探针被放置在沿着假想直线段的选定点处，其中每个负探头具有负重。

10. 发明授权

US08363972B1 Method for fast, robust, multi-dimensional pattern recognition 有权
公开(公告)号：US08363972B1
公开(公告)日：2013-01-29
申请号：US11027963
申请日：2004-12-31
申请人： William M. Silver , E. John McGarry , Matthew L. Hill , Nigel J. Foster , Sanjay Nichani , Willard P. Foster , Adam Wagman
发明人： William M. Silver , E. John McGarry , Matthew L. Hill , Nigel J. Foster , Sanjay Nichani , Willard P. Foster , Adam Wagman
IPC分类号： G06K9/62
CPC分类号： G06K9/6201 , G06K9/481 , G06K9/6204
摘要： Disclosed is a method for determining the absence or presence of one or more instances of a predetermined pattern in an image, and for determining the location of each found instance within a multidimensional space. A model represents the pattern to be found, the model including a plurality of probes. Each probe represents a relative position at which a test is performed in an image at a given pose, each such test contributing evidence that the pattern exists at the pose. The method further includes a comparison of the model with a run-time image at each of a plurality of poses. A match score is computed at each pose to provide a match score surface. Then, the match score is compared with an accept threshold, and used to provide the location any instances of the pattern in the image.

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