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    • 1. 发明授权
    • Equalizing reference surface capacitance with uneven thickness
    • 使参考表面电容均匀,厚度不均匀
    • US07683891B2
    • 2010-03-23
    • US11316556
    • 2005-12-22
    • Bich Quy Tran
    • Bich Quy Tran
    • G06F3/041
    • G06F3/044
    • One embodiment in accordance with the invention includes a capacitive sensing apparatus that includes a capacitive sensor configured to sense an object proximate to a physical capacitive sensing reference surface. The capacitive sensing apparatus also includes a plurality of dielectric materials disposed between the capacitive sensor and the physical capacitive sensing reference surface. Note that at least one of the plurality of dielectric materials has a non-uniform thickness. The plurality of dielectric materials can be configured such that capacitive coupling between the capacitive sensor and the object proximate to the physical capacitive sensing reference surface is substantially constant across the physical capacitive sensing reference surface.
    • 根据本发明的一个实施例包括电容感测装置,其包括被配置为感测靠近物理电容感测参考表面的物体的电容传感器。 电容感测装置还包括设置在电容传感器和物理电容感测参考表面之间的多个电介质材料。 注意,多个电介质材料中的至少一个具有不均匀的厚度。 多个电介质材料可以被配置为使得电容传感器和靠近物理电容感测参考表面的物体之间的电容耦合在物理电容感测参考表面上基本恒定。