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    • 1. 发明申请
    • CHARACTERIZATION OF FORCE-SENSOR EQUIPPED DEVICES
    • US20220316969A1
    • 2022-10-06
    • US17218322
    • 2021-03-31
    • Cirrus Logic International Semiconductor Ltd.
    • Tom BIRCHALLHamid SEPEHRColin CAMPBELLJason KULPEChin YONGPablo PESO PARADA
    • G01L5/16
    • A method of recording measurement data for characterizing a response of a given type of device to an applied force, the given type defining devices of that type as comprising a defined arrangement of a surface and N force sensors of the device concerned, where N≥1, each force sensor configured to output a sensor signal, wherein in the defined arrangement the N force sensors are operatively coupled to a defined input region of the surface so as to sense a force applied to that input region, the method comprising: for a specimen device of the given type, performing at least one measurement procedure, each measurement procedure comprising at least one measurement operation, each measurement operation comprising applying a defined force at a corresponding location on the input region of the device concerned and recording measurement data for that device and location based on the sensor signals of the N force sensors of that device. Also disclosed are a related computer-implemented method of generating a characterization definition for devices of the given type, a computer-implemented method of generating a configuration definition for devices of the given type for a given use case defined by a use-case definition, a method of configuring a candidate device of the given type for the given use case, and a method of assessing or calibrating a candidate device of the given type.