会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 6. 发明授权
    • Testing device
    • US11372059B2
    • 2022-06-28
    • US17002963
    • 2020-08-26
    • CommScope Technologies LLC
    • Mulan HuangJin LiuQiuliang WangYujun Zhang
    • G01R31/68G01R1/02
    • The present disclosure relates to a testing device comprising a bracket including a first groove and a second groove parallel to each other, wherein the first groove and the second groove run through an inner surface of the bracket perpendicularly to a thickness direction of the testing device; a plate assembly including a first plate and a second plate parallel to each other, wherein the first plate is disposed within the first groove and fits closely within the first groove along a length direction and a thickness direction of the testing device, the second plate is disposed within the second groove, with a gap present in the second groove along a length direction and/or a thickness direction of the testing device; a connector array including a plurality of connector assemblies disposed on the plate assembly in a predetermined pattern, wherein each of the plurality of connector assemblies is connected between the first plate and the second plate; and a displacing tool disposed on the bracket and/or the plate assembly and configured to displace the second plate relative to the first plate within the second groove along a length direction and/or a thickness direction of the testing device. The testing device may simulate various different axial deviations and/or angular deviations of the opposed printed circuit boards, and may be used to test the performance parameters such as low PIM, return loss and insertion loss between the printed circuit boards and the connectors under different axial deviations and/or angular deviations.
    • 10. 发明申请
    • TESTING DEVICE
    • US20210080515A1
    • 2021-03-18
    • US17002963
    • 2020-08-26
    • CommScope Technologies LLC
    • Mulan HuangJin LiuQiuliang WangYujun Zhang
    • G01R31/68G01R1/02
    • The present disclosure relates to a testing device comprising a bracket including a first groove and a second groove parallel to each other, wherein the first groove and the second groove run through an inner surface of the bracket perpendicularly to a thickness direction of the testing device; a plate assembly including a first plate and a second plate parallel to each other, wherein the first plate is disposed within the first groove and fits closely within the first groove along a length direction and a thickness direction of the testing device, the second plate is disposed within the second groove, with a gap present in the second groove along a length direction and/or a thickness direction of the testing device; a connector array including a plurality of connector assemblies disposed on the plate assembly in a predetermined pattern, wherein each of the plurality of connector assemblies is connected between the first plate and the second plate; and a displacing tool disposed on the bracket and/or the plate assembly and configured to displace the second plate relative to the first plate within the second groove along a length direction and/or a thickness direction of the testing device. The testing device may simulate various different axial deviations and/or angular deviations of the opposed printed circuit boards, and may be used to test the performance parameters such as low PIM, return loss and insertion loss between the printed circuit boards and the connectors under different axial deviations and/or angular deviations.