会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 3. 发明授权
    • Touch screen panel
    • 触摸屏面板
    • US08736565B2
    • 2014-05-27
    • US13238466
    • 2011-09-21
    • Dong-Ho KimRyan ChoiHyung-Pil Lee
    • Dong-Ho KimRyan ChoiHyung-Pil Lee
    • G06F3/041
    • G06F3/044
    • An embodiment is directed to a touch screen panel including first sensing electrodes, second sensing electrodes, and a pad unit to be electrically connected to the first sensing electrodes and the second sensing electrodes, the touch screen panel including first trace lines connecting the first sensing electrodes and the pad unit, second trace lines connecting the second sensing electrodes and the pad unit, and a ground line connected to a ground power supply, the ground line being between the first trace lines and the second trace lines.
    • 实施例涉及包括第一感测电极,第二感测电极和电连接到第一感测电极和第二感测电极的焊盘单元的触摸屏面板,触摸屏面板包括连接第一感测电极的第一迹线 并且所述垫单元,连接所述第二感测电极和所述垫单元的第二轨迹线和连接到地电源的接地线,所述接地线在所述第一迹线线和所述第二迹线之间。
    • 8. 发明授权
    • Method for puncturing a low density parity check code
    • 打孔低密度奇偶校验码的方法
    • US07734988B2
    • 2010-06-08
    • US11541749
    • 2006-10-02
    • Dong-Ho KimYung-Soo KimYe-Hoon LeeMyeon-Gyun ChoHyo-Yol ParkKeum-Chan WhangKwang-Soon KimJae-Won Kang
    • Dong-Ho KimYung-Soo KimYe-Hoon LeeMyeon-Gyun ChoHyo-Yol ParkKeum-Chan WhangKwang-Soon KimJae-Won Kang
    • H03M13/35
    • H03M13/1102H03M13/6306H03M13/6362
    • A method for puncturing a Low Density Parity Check (LDPC). The method includes a) setting a codeword length and the total number of bit nodes to be punctured; b) selecting a check node (or check nodes) with highest priority excluding check nodes completely checked in a current round; c) selecting a bit node (or bit nodes) with a highest priority excluding bit nodes completely checked among bit nodes connected to the selected check node (or check nodes); d) determining whether the selected bit node is a bit node to be punctured, that is, it is not systematic, not set by a puncturing prohibition flag; e) puncturing an associated bit node if the selected bit node is the bit node to be punctured, setting unpunctured bit nodes connected to the selected check node by a puncturing prohibition flag, decreasing the number of remained bit nodes to be punctured by 1 and increasing the number of connected punctured node of associated check node by 1; f) determining whether the number of remaining bits to be punctured is greater than 0; and g) returning to step b) if the number of remaining bits to be punctured is greater than 0, and ending a puncturing process if the number of remaining bits to be punctured is not greater than 0.
    • 一种用于打孔低密度奇偶校验(LDPC)的方法。 该方法包括:a)设置码字长度和要被穿孔的比特节点的总数; b)选择具有最高优先级的校验节点(或校验节点),不包括在当前轮次中完全检查的校验节点; c)选择具有最高优先级的比特节点(或比特节点),不包括连接到所选择的校验节点(或校验节点)的比特节点之间完全检查的比特节点; d)确定所选择的比特节点是否是要被穿孔的比特节点,即,它不是系统的,不被打孔禁止标志设置; e)如果选择的比特节点是要被穿孔的比特节点,则对相关联的比特节点进行穿孔,通过打孔禁止标志来设置连接到所选择的校验节点的未穿孔比特节点,将要被穿孔的剩余比特节点的数量减少1并增加 相关检查节点的连接穿孔节点数目为1; f)确定要穿孔的剩余比特数是否大于0; 以及g)如果要删除的剩余比特数大于0,则返回到步骤b),并且如果要穿孔的剩余比特数不大于0,则结束打孔处理。