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1. 发明授权

US09112603B2 Apparatus and method for measuring a delay 有权
标题翻译：用于测量延迟的装置和方法
公开(公告)号：US09112603B2
公开(公告)日：2015-08-18
申请号：US13684459
申请日：2012-11-23
申请人： Electronics and Telecommunications Research Institute
发明人： Jongyoon Shin , Jong-Ho Kim , Ji-Wook Youn
IPC分类号： H04L12/26 , H04B10/077 , H04J3/06
CPC分类号： H04B10/0775 , H04B2210/072 , H04J3/065 , H04J2203/0057
摘要： An apparatus and method for measuring a delay. The apparatus for measuring a delay includes an overhead inserting unit configured to inserting a time stamp into an overhead of a multiframe to be transmitted from a first location to a second location; an overhead extracting unit configured to extract a time stamp from an overhead of a multiframe received from the second location, the time stamp including bypass delay information of the second location; and a delay measuring unit configured to measure a round trip delay between the first location and the second location using the inserted time stamp and the extracted time stamp and adjust the measured round trip delay using the extracted bypass delay information.
摘要翻译：一种用于测量延迟的装置和方法。用于测量延迟的装置包括：开销插入单元，被配置为将时间戳插入要从第一位置发送到第二位置的多帧的开销; 开销提取单元，被配置为从所述第二位置接收到的多帧的开销提取时间戳，所述时间戳包括所述第二位置的旁路延迟信息; 以及延迟测量单元，其被配置为使用所插入的时间戳和所提取的时间戳来测量所述第一位置和所述第二位置之间的往返延迟，并且使用所提取的旁路延迟信息来调整所测量的往返延迟。

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