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1. 发明授权

US07418423B2 System and method for automated commodities transactions including an automatic hedging function 无效
标题翻译：自动商品交易的系统和方法，包括自动对冲功能
公开(公告)号：US07418423B2
公开(公告)日：2008-08-26
申请号：US10870112
申请日：2004-06-17
申请人： Gary Reding , Kent Beadle , Chris Nikkel , Mark Schulze , Walker Humphries , Dave Womeldorf , David Clark , Scott Cerreta , Carl Ozkaynak , Julia A. Granada Rodriguez
发明人： Gary Reding , Kent Beadle , Chris Nikkel , Mark Schulze , Walker Humphries , Dave Womeldorf , David Clark , Scott Cerreta , Carl Ozkaynak , Julia A. Granada Rodriguez
IPC分类号： G06Q40/00
CPC分类号： G06Q40/04 , G06Q30/0601 , G06Q40/06
摘要： An integrated virtual market is provided that facilitates communication between the producers of a given commodity and the parties wishing to purchase such commodities. This system provides real-time updated information about local pricing being offered by those purchasers. In addition, those producers can post offers that can automatically be accepted by purchasers and have contracts automatically generated. An important consideration from a purchaser's prospective is minimizing the risk associated with making such transactions. Due to this, futures contracts are often obtained. The virtual market system of the present inventions automatically requests and obtains futures contracts to hedge the contracts being generated.
摘要翻译：提供了一个综合虚拟市场，促进了某一特定商品的生产者与希望购买这些商品的各方之间的沟通。该系统提供有关购买者提供的当地定价的实时更新信息。此外，这些生产者可以发布可以自动被买方接受并且自动生成合同的优惠。从购买者的角度来看，重要的考虑因素是尽量减少与进行此类交易相关的风险。因此，往往获得期货合约。本发明的虚拟市场体系自动请求并获得期货合约以对冲所生成的合同。

2. 发明授权

US07742979B2 System and method for automated commodities transactions including an automatic hedging function 有权
标题翻译：自动商品交易的系统和方法，包括自动对冲功能
公开(公告)号：US07742979B2
公开(公告)日：2010-06-22
申请号：US12134833
申请日：2008-06-06
申请人： Gary Reding , Kent Beadle , Chris Nikkel , Mark Schulze , Walker Humphries , Dave Womeldorf , David Clark , Scott Cerreta , Carl Ozkaynak , Julia A. Granada Rodriguez
发明人： Gary Reding , Kent Beadle , Chris Nikkel , Mark Schulze , Walker Humphries , Dave Womeldorf , David Clark , Scott Cerreta , Carl Ozkaynak , Julia A. Granada Rodriguez
IPC分类号： G06Q40/00
CPC分类号： G06Q40/04 , G06Q30/0601 , G06Q40/06
摘要： An integrated virtual market is provided that facilitates communication between the producers of a given commodity and the parties wishing to purchase such commodities. This system provides real-time updated information about local pricing being offered by those purchasers. In addition, those producers can post offers that can automatically be accepted by purchasers and have contracts automatically generated. An important consideration from a purchaser's prospective is minimizing the risk associated with making such transactions. Due to this, futures contracts are often obtained. The virtual market system of the present inventions automatically requests and obtains futures contracts to hedge the contracts being generated.
摘要翻译：提供了一个综合虚拟市场，促进了某一特定商品的生产者与希望购买这些商品的各方之间的沟通。该系统提供有关购买者提供的当地定价的实时更新信息。此外，这些生产者可以发布可以自动被买方接受并且自动生成合同的优惠。买家期望的一个重要考虑因素是尽量减少与进行此类交易相关的风险。因此，往往获得期货合约。本发明的虚拟市场体系自动请求并获得期货合约以对冲所生成的合同。

3. 发明授权

US07659734B2 Semiconductor inspection system and apparatus utilizing a non-vibrating contact potential difference sensor and controlled illumination 失效
标题翻译：采用非振动接触电位差传感器和受控照明的半导体检查系统和装置
公开(公告)号：US07659734B2
公开(公告)日：2010-02-09
申请号：US11715149
申请日：2007-03-07
申请人： Jeffrey Alan Hawthorne , M. Brandon Steele , Yeyuan Yang , Mark Schulze
发明人： Jeffrey Alan Hawthorne , M. Brandon Steele , Yeyuan Yang , Mark Schulze
IPC分类号： G01R31/26
CPC分类号： G01N27/002 , G01R31/2648 , G01R31/2656
摘要： A method and system for identifying a defect or contamination on the surface of a semiconductor or in a semiconductor. The method and system involves providing a semiconductor with a surface, such as a semiconductor wafer, providing a non-vibrating contact potential difference sensor, providing a source of illumination with controllable intensity or distribution of wavelengths, using the illumination source to provide controlled illumination of the surface of the wafer under or near the non-vibrating contact potential sensor probe tip, using the non-vibrating contact potential difference sensor to scan the wafer surface during controlled illumination, generating data representative of changes in contact potential difference across the wafer surface, and processing that data to identify a pattern characteristic of a defect or contamination.
摘要翻译：一种用于识别半导体或半导体表面上的缺陷或污染的方法和系统。该方法和系统包括提供具有诸如半导体晶片的表面的半导体，提供非振动接触电位差传感器，使用照明源提供具有可控的强度或波长分布的照明源，以提供受控照明在非振动接触电位传感器探针尖端下或附近的晶片表面，使用非振动接触电位差传感器在受控照明期间扫描晶片表面，产生代表晶片表面的接触电位差的变化的数据，并处理该数据以识别缺陷或污染的图案特征。

4. 发明申请

US20090139312A1 DEFECT CLASSIFICATION UTILIZING DATA FROM A NON-VIBRATING CONTACT POTENTIAL DIFFERENCE SENSOR 有权
标题翻译：从非振动接触式潜在差分传感器中对数据进行缺陷分类
公开(公告)号：US20090139312A1
公开(公告)日：2009-06-04
申请号：US11948518
申请日：2007-11-30
申请人： Jeffrey Alan Hawthorne , M. Brandon Steele , Yeyuan Yang , Mark Schulze
发明人： Jeffrey Alan Hawthorne , M. Brandon Steele , Yeyuan Yang , Mark Schulze
IPC分类号： G01B5/28
CPC分类号： G01Q60/30 , G01N27/002 , H01L22/14
摘要： A method and system for identifying and classifying non-uniformities on the surface of a semiconductor or in a semiconductor. The method and system involves scanning the wafer surface with a non-vibrating contact potential difference sensor to detect the locations of non-uniformities, extracting features characteristic of the non-uniformities, and applying a set of rules to these features to classify the type of each non-uniformity.
摘要翻译：一种用于识别和分类半导体或半导体表面上的不均匀性的方法和系统。该方法和系统包括用非振动接触电位差传感器扫描晶片表面，以检测不均匀性的位置，提取非均匀性特征的特征，以及对这些特征应用一组规则以分类每个不均匀。

5. 发明申请

US20080217530A1 Semiconductor inspection system and apparatus utilizing a non-vibrating contact potential difference sensor and controlled illumination 失效
标题翻译：采用非振动接触电位差传感器和受控照明的半导体检查系统和装置
公开(公告)号：US20080217530A1
公开(公告)日：2008-09-11
申请号：US11715149
申请日：2007-03-07
申请人： Jeffrey Alan Hawthorne , M. Brandon Steele , Yeyuan Yang , Mark Schulze
发明人： Jeffrey Alan Hawthorne , M. Brandon Steele , Yeyuan Yang , Mark Schulze
IPC分类号： G01N23/00
CPC分类号： G01N27/002 , G01R31/2648 , G01R31/2656
摘要： A method and system for identifying a defect or contamination on the surface of a semiconductor or in a semiconductor. The method and system involves providing a semiconductor with a surface, such as a semiconductor wafer, providing a non-vibrating contact potential difference sensor, providing a source of illumination with controllable intensity or distribution of wavelengths, using the illumination source to provide controlled illumination of the surface of the wafer under or near the non-vibrating contact potential sensor probe tip, using the non-vibrating contact potential difference sensor to scan the wafer surface during controlled illumination, generating data representative of changes in contact potential difference across the wafer surface, and processing that data to identify a pattern characteristic of a defect or contamination.
摘要翻译：一种用于识别半导体或半导体表面上的缺陷或污染的方法和系统。该方法和系统包括提供具有诸如半导体晶片的表面的半导体，提供非振动接触电位差传感器，使用照明源提供具有可控的强度或波长分布的照明源，以提供受控照明在非振动接触电位传感器探针尖端下或附近的晶片表面，使用非振动接触电位差传感器在受控照明期间扫描晶片表面，产生代表晶片表面的接触电位差的变化的数据，并处理该数据以识别缺陷或污染的图案特征。

6. 发明授权

US07900526B2 Defect classification utilizing data from a non-vibrating contact potential difference sensor 有权
标题翻译：利用非振动接触电位差传感器的数据进行缺陷分类
公开(公告)号：US07900526B2
公开(公告)日：2011-03-08
申请号：US11948518
申请日：2007-11-30
申请人： Jeffrey Alan Hawthorne , M. Brandon Steele , Yeyuan Yang , Mark Schulze
发明人： Jeffrey Alan Hawthorne , M. Brandon Steele , Yeyuan Yang , Mark Schulze
IPC分类号： G01N33/00
CPC分类号： G01Q60/30 , G01N27/002 , H01L22/14
摘要： A method and system for identifying and classifying non-uniformities on the surface of a semiconductor or in a semiconductor. The method and system involves scanning the wafer surface with a non-vibrating contact potential difference sensor to detect the locations of non-uniformities, extracting features characteristic of the non-uniformities, and applying a set of rules to these features to classify the type of each non-uniformity.
摘要翻译：一种用于识别和分类半导体或半导体表面上的不均匀性的方法和系统。该方法和系统包括用非振动接触电位差传感器扫描晶片表面，以检测不均匀性的位置，提取非均匀性特征的特征，以及对这些特征应用一组规则以分类每个不均匀。

7. 发明申请

US20080098600A1 Valve for Aerosol Container 审中-公开
标题翻译：气溶胶容器阀
公开(公告)号：US20080098600A1
公开(公告)日：2008-05-01
申请号：US11956408
申请日：2007-12-14
申请人： Michael RIEBE , Mark Schulze
发明人： Michael RIEBE , Mark Schulze
IPC分类号： B21D53/00 , B21D51/00 , B21D51/16
CPC分类号： B65D83/54 , A61M15/009 , Y10T29/49405 , Y10T29/4941 , Y10T29/49412
摘要： A valve for an aerosol container suitable for use in dispersing a quantity of the contents thereof is disclosed. The valve components comprise a fluorinated polymer and/or a fluorinated coating which have been found to reduce drug deposition in the valve.
摘要翻译：公开了一种用于分散一定量内容物的气溶胶容器用阀。阀组件包括氟化聚合物和/或氟化涂层，其被发现可以减少阀中的药物沉积。

8. 发明申请

US20060103892A1 System and method for a vector difference mean filter for noise suppression 审中-公开
标题翻译：用于噪声抑制的矢量差分平均滤波器的系统和方法
公开(公告)号：US20060103892A1
公开(公告)日：2006-05-18
申请号：US10992409
申请日：2004-11-18
申请人： Mark Schulze , George John
发明人： Mark Schulze , George John
IPC分类号： H04N1/38
CPC分类号： G06K9/40 , G06T5/004 , G06T5/20 , H04N1/58
摘要： Reduction of noise in digitized multi-spectral images is provided by filtering based on vector values rather than independent scalar values. Vector values refer to a pixel with two or more values. For this method, a metric is defined for pixel vector magnitude. A sliding processing kernel is also defined, with a specified shape, a specified number of pixels to be included in the kernel, and a specified value contrast threshold to avoid distorting edges and fine details. The metric and kernel are used to select pixels for computing filtering of the center pixel in a kernel. A statistical measurement is computed, for example by mean averaging the specified pixels, and the resulting value is made the value of the center pixel of the kernel. The filtering process is applied throughout the image by making each pixel the center of a processing kernel.
摘要翻译：通过基于向量值的过滤而不是独立的标量值来提供数字化多光谱图像中的噪声的降低。矢量值是指具有两个或多个值的像素。对于该方法，为像素矢量幅度定义度量。还定义了一个滑动处理内核，具有指定的形状，要包括在内核中的指定数量的像素，以及指定的值对比度阈值，以避免边缘和细节的畸变。度量和内核用于选择用于计算内核中心像素过滤的像素。计算统计测量，例如通过对指定像素进行平均平均，并将得到的值作为内核的中心像素的值。通过使每个像素成为处理内核的中心，通过整个图像应用滤波处理。

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