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1. 发明授权

US09224544B2 Trace structure for the touch panel and electrical testing method 有权
标题翻译：触摸屏的跟踪结构和电气测试方法
公开(公告)号：US09224544B2
公开(公告)日：2015-12-29
申请号：US13928119
申请日：2013-06-26
申请人： Hannstar Display Corp
发明人： Hung-Chen Kao , Yu-Sheng Lin , Chia-Feng Teng
IPC分类号： G01R31/26 , H01H1/06 , G06F3/041
CPC分类号： H01H1/06 , G06F3/041 , G06F2203/04103
摘要： A trace structure for a touch panel having a transparent substrate with a touch sensing region and a border region surrounding the touch sensing region, the trace structure including: a plurality of traces disposed on the transparent substrate and within the border region; a plurality of bonding pads disposed in the border region of the transparent substrate, wherein each bonding pad has a first side and a second side, and the first side of each bonding pad is connected to a corresponding trace of the plurality of traces; and at least two trace extending portions extended toward an outer edge of the border region from the second side of two of the plurality of bonding pads.
摘要翻译：一种具有触摸屏的跟踪结构，其具有带有触摸感测区域的透明衬底和围绕触摸感测区域的边界区域，所述迹线结构包括：设置在所述透明衬底上并在所述边界区域内的多个迹线; 多个接合焊盘，设置在所述透明基板的边界区域中，其中每个接合焊盘具有第一侧和第二侧，并且每个接合焊盘的第一侧连接到所述多个迹线的相应迹线; 以及从所述多个接合焊盘中的两个的所述第二侧朝向所述边界区域的外边缘延伸的至少两个迹线延伸部分。

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