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    • 7. 发明申请
    • Image processing apparatus and method of the same
    • 图像处理装置及其方法
    • US20070223067A1
    • 2007-09-27
    • US11595661
    • 2006-11-10
    • Hsin-Hung LeeYun-Cheng LiuYu-Hsiang Huang
    • Hsin-Hung LeeYun-Cheng LiuYu-Hsiang Huang
    • G03F3/08
    • H04N1/6027
    • The invention discloses an image processing apparatus for adjusting the saturation of an input image. The input image also has lightness and hue. The image processing apparatus includes a first processing unit, a second processing unit, a third processing unit, and a converter. According to the lightness, hue, and a first LUT, the first processing unit determines a gain curve. According to the lightness, hue, and a second LUT, the second processing unit determines a normalized limit gain and multiplies the normalized limit gain by the saturation of the input image to generate a normalized saturation. According to the gain curve and a third LUT, the third processing unit determines a set of gain parameters and, according to the normalized saturation and the gain parameters, determines a gain of saturation. According to the gain of saturation, the converter is used for adjusting the saturation of the input image.
    • 本发明公开了一种用于调整输入图像的饱和度的图像处理装置。 输入图像也具有亮度和色调。 图像处理装置包括第一处理单元,第二处理单元,第三处理单元和转换器。 根据亮度,色调和第一LUT,第一处理单元确定增益曲线。 根据亮度,色调和第二LUT,第二处理单元确定归一化极限增益,并将归一化极限增益乘以输入图像的饱和度,以产生归一化饱和度。 根据增益曲线和第三LUT,第三处理单元确定一组增益参数,并且根据归一化饱和度和增益参数确定饱和度增益。 根据饱和度的增益,转换器用于调整输入图像的饱和度。
    • 8. 发明申请
    • TESTING APPARATUS AND METHOD
    • 测试装置和方法
    • US20130328584A1
    • 2013-12-12
    • US13588086
    • 2012-08-17
    • Chun-Hsun LinHsuan-Hao YangTzu-Yuan HuangKuang-Ching FanHsin-Hung Lee
    • Chun-Hsun LinHsuan-Hao YangTzu-Yuan HuangKuang-Ching FanHsin-Hung Lee
    • G01R1/073G01R31/26
    • G01R1/0408G01R31/2831G01R31/2886
    • Disclosed is a testing apparatus, including: a base having opposite upper and lower surfaces, and a plurality of electrical circuits formed in the base, each of the electrical circuits extending from the upper surface to the lower surface and bending backwards to the upper surface such that two terminal ends of the electrical circuit are located on the upper surface. While in a testing, an element is disposed on the upper surface of the base such that testing probes are placed on the electrical contact spots of both the element and the upper surface of the base, thus without resorting to double sided testing that testing probes are placed on the upper and lower surfaces of the element as mentioned in the prior art. Hence, the testing apparatus and testing method can simplify the testing process and prevent the element from damage caused by mechanical stresses of the testing probes.
    • 公开了一种测试装置,包括:具有相对的上表面和下表面的基座和形成在基部中的多个电路,每个电路从上表面延伸到下表面并向后弯曲到上表面, 电路的两个末端位于上表面。 在测试中,将元件设置在基座的上表面上,使得测试探针放置在基座的元件和上表面的电接触点上,因此不需要进行双面测试,测试探针 放置在元件的上表面和下表面上,如现有技术中所述。 因此,测试装置和测试方法可以简化测试过程,并防止元件受到测试探针的机械应力所造成的损坏。
    • 10. 发明授权
    • Asymmetric differential inductor
    • 不对称差分电感
    • US08493168B2
    • 2013-07-23
    • US13222231
    • 2011-08-31
    • Ming-Fan TsaiKuan-Yu ChenBo-Shiang FangHsin-Hung Lee
    • Ming-Fan TsaiKuan-Yu ChenBo-Shiang FangHsin-Hung Lee
    • H01F5/00H01F27/28
    • H01F17/0006H01F19/00
    • An asymmetric differential inductor includes first and second conductive wirings spirally disposed on a substrate having a first input terminal, a second input terminal, a ground terminal, and a central conductive wiring. The central conductive wiring has a central contact connecting the ground terminal and a central end away from the ground terminal. The first conductive wiring extends across the central conductive wiring and has a first contact connecting the first input terminal and a first end connecting the central end. The second conductive wiring extends across the central conductive wiring and interlaces with the first conductive wiring and has a second contact connecting the second input terminal and a second end connecting the central end. Corresponding portions of wiring sections of the first and second conductive wirings at opposite sides of the central conductive wiring are asymmetrical to one another to thereby save substrate space and facilitate circuit layout.
    • 非对称差分电感器包括螺旋地设置在具有第一输入端子,第二输入端子,接地端子和中心导电布线的基板上的第一和第二导电布线。 中心导电布线具有连接接地端子和远离接地端子的中心端的中心接触点。 第一导电布线延伸穿过中心导电布线,并且具有连接第一输入端和连接中心端的第一端的第一触点。 所述第二导电布线延伸穿过所述中心导电布线并与所述第一导电布线交织,并且具有连接所述第二输入端子和连接所述中心端部的第二端部的第二触点。 在中心导电布线的相对侧的第一和第二导电布线的布线部分的相应部分彼此不对称,从而节省基板空间并且便于布线。