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    • 8. 发明申请
    • CIRCUIT AND METHOD FOR MEASURING A CURRENT
    • 用于测量电流的电路和方法
    • US20160164279A1
    • 2016-06-09
    • US14564172
    • 2014-12-09
    • Infineon Technologies AG
    • Michael AsamAndreas MeiserSteffen Thiele
    • H02H9/02G01R19/165H03K19/0185
    • G01R19/16519G01R19/16538H02H3/087H03K19/018507
    • Circuits, switches with over-current protection and methods for measuring a current are described herein. A circuit configured to provide a current from a supply voltage to a load includes a first transistor, a second transistor, and a detecting circuit. The first transistor has a larger active area than the second transistor. The detecting circuit is configured to detect a current through the second transistor. A same voltage is applied between a control terminal of the first transistor and a first controlled terminal of the first transistor and is applied between a control terminal of the second transistor and a first controlled terminal of the second transistor. The detecting circuit is coupled to the second controlled terminal of the second transistor and is coupled to the supply voltage.
    • 这里描述了具有过电流保护的电路,开关和用于测量电流的方法。 配置成将电流从电源电压提供给负载的电路包括第一晶体管,第二晶体管和检测电路。 第一晶体管具有比第二晶体管更大的有源面积。 检测电路被配置为检测通过第二晶体管的电流。 在第一晶体管的控制端子和第一晶体管的第一受控端子之间施加相同的电压,并施加在第二晶体管的控制端子和第二晶体管的第一受控端子之间。 检测电路耦合到第二晶体管的第二受控端并耦合到电源电压。