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1. 发明授权

US08901953B2 Enforcing performance longevity on semiconductor devices 有权
标题翻译：在半导体器件上实现性能长寿
公开(公告)号：US08901953B2
公开(公告)日：2014-12-02
申请号：US13631271
申请日：2012-09-28
申请人： Intel Corporation
发明人： Abdi Nassib , Gyan Prakash
IPC分类号： H03K19/00
CPC分类号： G06F21/71 , G06F2221/2137
摘要： Technologies for enforcing an expiration policy on an electronic engineering sample component includes a one-time programmable fuse to store a manufacture date of the electronic engineering sample component, another one-time programmable fuse to store an expiration date of the electronic engineering sample component, and a component life management engine to compare a current date of the electronic engineering sample component with the expiration date of the electronic engineering sample component. The component life management engine to disable or lock the electronic engineering sample component in response to determining that the current date of the electronic engineering sample component exceeds the expiration date of the electronic engineering sample component. In some embodiments, a computing device may enforce the expiration policy for the electronic engineering sample component. The computing device may also be communicatively coupled to a remote unlock server and may receive authorization to unlock a disabled engineering sample component.
摘要翻译：用于在电子工程样品组件上执行到期政策的技术包括一次性可编程保险丝，用于存储电子工程样品组分的制造日期，另一个一次性可编程保险丝，用于存储电子工程样品组分的有效期;以及将电子工程样本组件的当前日期与电子工程样本组件的到期日期进行比较的组件生命管理引擎。响应于确定电子工程样本组件的当前日期超过电子工程样本组件的有效期限，禁用或锁定电子工程样本组件的组件生命周期管理引擎。在一些实施例中，计算设备可以强制电子工程样本组件的到期策略。计算设备还可以通信地耦合到远程解锁服务器，并且可以接收授权来解锁被禁用的工程样本组件。

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