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    • 4. 发明授权
    • Apparatus and method for time-interleaved analog-to-digital conversion
    • US11082054B1
    • 2021-08-03
    • US16912812
    • 2020-06-26
    • Intel Corporation
    • Giacomo CascioChristian LindholmAlbert MolinaMartin Clara
    • H03M1/12H03M1/06H03M1/36
    • The present disclosure relates to a time-interleaved ADC circuit. The time-interleaved ADC circuit comprises an input for an analog input signal, a first ADC bank comprising a first plurality of parallel time-multiplexed ADCs, wherein the first plurality of parallel time-multiplexed ADCs is configured to subsequently generate a first plurality of samples of the analog input signal during a first time interval, a first buffer amplifier coupled between the input and the first ADC bank. The time-interleaved ADC circuit further comprises a second ADC bank comprising a second plurality of parallel time-multiplexed ADCs, wherein the second plurality of parallel time-multiplexed ADCs is configured to subsequently generate a second plurality of samples of the analog input signal during a second time interval, wherein the first and the second time intervals are subsequent time intervals, a second buffer amplifier coupled between the input and the second ADC bank. The first ADC bank has associated therewith a first dummy sampler, wherein the ADC circuit is configured to activate the first dummy sampler before the start of the first time interval. The second ADC bank has associated therewith a second dummy sampler, wherein the ADC circuit is configured to activate the second dummy sampler before the start of the second time interval.