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1. 发明申请

US20200013606A1 NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTROMETRY 审中-公开
公开(公告)号：US20200013606A1
公开(公告)日：2020-01-09
申请号：US16571962
申请日：2019-09-16
申请人： Ionwerks, Inc.
发明人： J. Albert Schultz , Thomas F. Egan , Ernest K. Lewis , Steven Ulrich , Kelley L. Waters
IPC分类号： H01J49/10 , H01J49/04 , G01N21/65 , H01J49/40 , H01J49/26 , G01N21/64 , H01J49/00 , H01J49/14
摘要： Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.

2. 发明申请

US20170221691A1 NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTROMETRY 审中-公开
公开(公告)号：US20170221691A1
公开(公告)日：2017-08-03
申请号：US15485003
申请日：2017-04-11
申请人： Ionwerks, Inc.
发明人： J. Albert Schultz , Thomas F. Egan , Ernest K. Lewis , Steven Ulrich , Kelley L. Waters
IPC分类号： H01J49/10 , G01N21/64 , G01N21/65 , H01J49/04
CPC分类号： H01J49/10 , G01N21/64 , G01N21/6458 , G01N21/65 , G01N21/658 , G01N23/2258 , G01N2021/6417 , H01J49/0004 , H01J49/0422 , H01J49/0463 , H01J49/142 , H01J49/164 , H01J49/26 , H01J49/40
摘要： Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.

3. 发明申请

US20160189942A1 NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTROMETRY 审中-公开
标题翻译：纳米粒子辅助纳米粒子分子显微镜
公开(公告)号：US20160189942A1
公开(公告)日：2016-06-30
申请号：US15061680
申请日：2016-03-04
申请人： Ionwerks, Inc.
发明人： J. Albert Schultz , Thomas F. Egan , Ernest K. Lewis , Steven Ulrich , Kelley L. Waters
IPC分类号： H01J49/00 , H01J49/14
CPC分类号： H01J49/10 , G01N21/64 , G01N21/6458 , G01N21/65 , G01N21/658 , G01N23/2258 , G01N2021/6417 , H01J49/0004 , H01J49/0422 , H01J49/0463 , H01J49/142 , H01J49/164 , H01J49/26 , H01J49/40
摘要： Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.
摘要翻译：描述了用于质谱的方法和装置，具体地，使用纳米颗粒注入作为二次离子的基质，更一般地说是二次粒子。光子束源或纳米颗粒束源可用于解吸源或初级离子/一次粒子源。

4. 发明申请

US20130134305A1 POST-IONIZATION OF NEUTRALS FOR ION MOBILITY oTOFMS IDENTIFICATION OF MOLECULES AND ELEMENTS DESORBED FROM SURFACES 有权
标题翻译：离子移动物质的中和离子化表征从表面脱落的分子和元素的鉴定
公开(公告)号：US20130134305A1
公开(公告)日：2013-05-30
申请号：US13746704
申请日：2013-01-22
申请人： Ionwerks, Inc.
发明人： J. Albert Schultz , Thomas F. Egan , Kelley L. Waters , Ernest K. Lewis
IPC分类号： H01J49/40 , H01J49/00
CPC分类号： H01J49/40 , G01N27/622 , H01J49/0027 , H01J49/0045 , H01J49/107
摘要： The present invention relates to a method and apparatus for ionizing a neutral MALDI desorption plume, and in particular, for efficiently measuring the ionized MALDI desorption plume when post-ionization techniques are combined with a medium pressure MALDI-IM-oTOFMS instrument. Additionally, the present disclosure provides a method and apparatus that simultaneously separates tissue-sample MALDI ions by IM-oTOFMS according to their chemical family. After separation, the MALDI ions are directly compared to the ions created by post-ionizing the co-desorbed neutral molecules with a second laser wherein the second laser is delayed by a few hundred microseconds. The present disclosure further provides novel approaches that enhance the analysis of ions, including the use of giant fullerene internal standards to enhance mass accuracy, and ultraviolet (UV) declustering lasers to generate intact peptides and proteins, either of which may be followed by VUV post-ionization which generates identifiable structural fragments.
摘要翻译：本发明涉及一种用于离子化中性MALDI解吸羽流的方法和装置，特别是当电离后技术与中压MALDI-IM-OTOFMS仪器结合时，用于有效测量电离的MALDI解吸羽流。此外，本公开提供了一种方法和装置，其通过IM-oTOFMS根据其化学族同时分离组织样品MALDI离子。分离后，将MALDI离子直接与通过用第二激光离子化共解吸的中性分子产生的离子进行比较，其中第二激光器延迟几百微秒。本公开进一步提供了增强离子分析的新方法，包括使用巨富勒烯内标来提高质量精度，以及紫外（UV）去聚簇激光以产生完整的肽和蛋白质，其中之一可以是VUV柱产生可识别的结构碎片。

5. 发明申请

US20140084153A1 Nanoparticulate Assisted Nanoscale Molecular Imaging by Mass Spectrometery 有权
标题翻译：纳米粒子辅助纳米尺度分子成像质谱
公开(公告)号：US20140084153A1
公开(公告)日：2014-03-27
申请号：US14092732
申请日：2013-11-27
申请人： Ionwerks, Inc.
发明人： J. Albert Schultz , Thomas F. Egan , Ernest K. Lewis , Steven Ulrich , Kelley L. Waters
IPC分类号： G01N21/64 , H01J49/26 , H01J49/40
CPC分类号： H01J49/10 , G01N21/64 , G01N21/6458 , G01N21/65 , G01N21/658 , G01N23/2258 , G01N2021/6417 , H01J49/0004 , H01J49/0422 , H01J49/0463 , H01J49/142 , H01J49/164 , H01J49/26 , H01J49/40
摘要： Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.
摘要翻译：描述了用于质谱的方法和装置，具体地，使用纳米颗粒注入作为二次离子的基质，更一般地说是二次粒子。光子束源或纳米颗粒束源可用于解吸源或初级离子/一次粒子源。

6. 发明申请

US20220404298A1 NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTROMETRY 有权
公开(公告)号：US20220404298A1
公开(公告)日：2022-12-22
申请号：US17809851
申请日：2022-06-29
申请人： Ionwerks, Inc.
发明人： J. Albert Schultz , Thomas Egan , Ernest K. Lewis , Steven Ulrich , Kelley L. Waters
IPC分类号： G01N23/2258 , H01J49/04 , H01J49/14 , H01J49/16 , H01J49/00 , G01N21/64 , H01J49/26 , H01J49/40 , G01N21/65 , H01J49/10
摘要： Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.

7. 发明申请

US20210116402A1 NANOPARTICULATE ASSISTED NANOSCALE MOLECULAR IMAGING BY MASS SPECTROMETRY 有权
公开(公告)号：US20210116402A1
公开(公告)日：2021-04-22
申请号：US17129444
申请日：2020-12-21
申请人： Ionwerks, Inc.
发明人： J. Albert Schultz , Thomas F. Egan , Ernest K. Lewis , Steven Ulrich , Kelley L. Waters
IPC分类号： G01N23/2258 , H01J49/04 , H01J49/14 , H01J49/16 , H01J49/00 , G01N21/64 , H01J49/26 , H01J49/40 , G01N21/65 , H01J49/10
摘要： Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.

8. 发明授权

US10446383B2 Nanoparticulate assisted nanoscale molecular imaging by mass spectrometry 有权
公开(公告)号：US10446383B2
公开(公告)日：2019-10-15
申请号：US15485003
申请日：2017-04-11
申请人： Ionwerks, Inc.
发明人： J. Albert Schultz , Thomas F. Egan , Ernest K. Lewis , Steven Ulrich , Kelley L. Waters
IPC分类号： G01N21/65 , G01N21/64 , H01J49/00 , H01J49/10 , H01J49/04 , H01J49/14 , H01J49/26 , H01J49/40 , H01J49/16 , G01N23/2258
摘要： Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.

9. 发明授权

US09297761B2 Nanoparticulate assisted nanoscale molecular imaging by mass spectrometery 有权
标题翻译：纳米微粒辅助纳米尺度分子成像质谱
公开(公告)号：US09297761B2
公开(公告)日：2016-03-29
申请号：US14092732
申请日：2013-11-27
申请人： Ionwerks, Inc.
发明人： J. Albert Schultz , Thomas F. Egan , Ernest K. Lewis , Steven Ulrich , Kelley L. Waters
IPC分类号： H01J49/40 , G01N21/64 , H01J49/04 , H01J49/00 , H01J49/14 , H01J49/26
CPC分类号： H01J49/10 , G01N21/64 , G01N21/6458 , G01N21/65 , G01N21/658 , G01N23/2258 , G01N2021/6417 , H01J49/0004 , H01J49/0422 , H01J49/0463 , H01J49/142 , H01J49/164 , H01J49/26 , H01J49/40
摘要： Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.
摘要翻译：描述了用于质谱的方法和装置，具体地，使用纳米颗粒注入作为二次离子的基质，更一般地说是二次粒子。光子束源或纳米颗粒束源可用于解吸源或初级离子/一次粒子源。

10. 发明授权

US08558168B2 Post-ionization of neutrals for ion mobility oTOFMS identification of molecules and elements desorbed from surfaces 有权
公开(公告)号：US08558168B2
公开(公告)日：2013-10-15
申请号：US13746704
申请日：2013-01-22
申请人： Ionwerks, Inc.
发明人： J. Albert Schultz , Thomas F. Egan , Ernest K. Lewis , Kelley L. Waters
IPC分类号： H01J49/00
CPC分类号： H01J49/40 , G01N27/622 , H01J49/0027 , H01J49/0045 , H01J49/107
摘要： The present invention relates to a method and apparatus for ionizing a neutral MALDI desorption plume, and in particular, for efficiently measuring the ionized MALDI desorption plume when post-ionization techniques are combined with a medium pressure MALDI-IM-oTOFMS instrument. Additionally, the present disclosure provides a method and apparatus that simultaneously separates tissue-sample MALDI ions by IM-oTOFMS according to their chemical family. After separation, the MALDI ions are directly compared to the ions created by post-ionizing the co-desorbed neutral molecules with a second laser wherein the second laser is delayed by a few hundred microseconds. The present disclosure further provides novel approaches that enhance the analysis of ions, including the use of giant fullerene internal standards to enhance mass accuracy, and ultraviolet (UV) declustering lasers to generate intact peptides and proteins, either of which may be followed by VUV post-ionization which generates identifiable structural fragments.

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