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    • 2. 发明申请
    • METHOD AND APPARATUS FOR OPERATION OF MOVING OBJECT IN UNSTRUCTURED ENVIRONMENT
    • 运动对象在非结构化环境中的运行方法和装置
    • US20120162411A1
    • 2012-06-28
    • US13335829
    • 2011-12-22
    • Min Su JANGYoung-Jo CHOHyeonsung CHOCheonshu PARKJae Hong KIMJoo Chan SOHN
    • Min Su JANGYoung-Jo CHOHyeonsung CHOCheonshu PARKJae Hong KIMJoo Chan SOHN
    • H04N7/18
    • H04N7/188
    • An apparatus for operation of a moving object in an unstructured environment includes a sensor unit configured to sense vibration of the moving object to produce a sensing signal; an image capturing unit configured to capture an image of a surrounding environment on which the moving object travels; a signal synchronization unit configured to synchronize the sensing signal from the sensor unit with the image captured by an image capturing unit through mapping therebetween; an amplitude extraction unit configured to extract a tilt of the moving object based on the sensing signal from the sensor unit and calculate a viewing angle and a moving distance of the moving object based on the calculated tilt; and an image correction unit configured to perform coordinate transformation on the captured image by using the viewing angle and the moving distance to generate a corrected image.
    • 用于在非结构化环境中操作移动物体的装置包括:传感器单元,被配置为感测移动物体的振动以产生感测信号; 被配置为捕获移动对象行进的周围环境的图像的图像拍摄单元; 信号同步单元,被配置为使来自传感器单元的感测信号与由图像捕获单元捕获的图像之间的映射同步; 振幅提取单元,被配置为基于来自所述传感器单元的感测信号来提取所述移动物体的倾斜,并基于所计算的倾斜度来计算所述移动物体的视角和移动距离; 以及图像校正单元,被配置为通过使用所述视角和所述移动距离对所述捕获图像执行坐标变换,以生成校正图像。
    • 6. 发明申请
    • DETECTION OF SEED LAYERS ON A SEMICONDUCTOR DEVICE
    • 在半导体器件上检测种子层
    • US20090289172A1
    • 2009-11-26
    • US12512815
    • 2009-07-30
    • Ji Young YIMJae Hong KIM
    • Ji Young YIMJae Hong KIM
    • H01L27/00
    • H01L21/76871
    • A device and/or method which detects a seed layer and a device and/or method of forming layers on a semiconductor device. The device which forms layers on the semiconductor device may include a metal layer forming unit (which forms a metal layer on a wafer), a copper seed layer forming unit (which forms a copper seed layer on the metal layer), a wafer alignment device (which includes a wafer alignment unit which aligns the wafer to a predetermined position), a copper seed layer detecting unit (which is positioned above the wafer alignment unit to detect the copper seed layer formed on the wafer), and a plating unit (which forms a copper interconnection layer on the copper seed layer).
    • 一种检测种子层的装置和/或方法,以及在半导体器件上形成层的器件和/或方法。 在半导体器件上形成层的器件可以包括金属层形成单元(其在晶片上形成金属层),铜籽晶层形成单元(在金属层上形成铜籽晶层),晶片对准装置 (其包括将晶片对准到预定位置的晶片对准单元),铜籽晶层检测单元(位于晶片对准单元上方以检测形成在晶片上的铜籽晶层),以及电镀单元(其 在铜籽晶层上形成铜互连层)。