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    • 1. 发明授权
    • Memory apparatus having a short word line cycle time and method for operating a memory apparatus
    • 具有短字线周期时间的存储装置和用于操作存储装置的方法
    • US07092300B2
    • 2006-08-15
    • US10822997
    • 2004-04-13
    • Jean-Marc DortuWolfgang Spirkl
    • Jean-Marc DortuWolfgang Spirkl
    • G11C7/10
    • G11C11/4076G11C7/22G11C2207/2281G11C2207/229
    • Memory apparatus having a short word line cycle time and method for operating a memory apparatus. One embodiment provides a memory apparatus comprising at least one cell array having a multiplicity of memory cells, with each of the memory cells having an associated word line and an associated bit line; a control device which has a signaling connection to the word lines and to the bit lines and is configured to read data stored in the memory cells and to write data to the memory cells; wherein the control device is configured to execute a destructive read command (DRD) for reading data from at least one of the memory cells, comprising: electrically biasing a bit line associated with the at least one memory cell, opening a word line associated with the at least one memory cell, and destructively reading data stored in the at least one memory cell.
    • 具有短字线周期时间的存储装置和用于操作存储装置的方法。 一个实施例提供了一种存储器装置,其包括具有多个存储器单元的至少一个单元阵列,其中每个存储器单元具有相关联的字线和相关联的位线; 控制装置,其具有与字线和位线的信令连接,并且被配置为读取存储在存储器单元中的数据并将数据写入存储器单元; 其中所述控制设备被配置为执行用于从所述存储器单元中的至少一个读取数据的破坏性读取命令(DRD),包括:电气偏置与所述至少一个存储器单元相关联的位线,打开与所述至少一个存储器单元相关联的字线 至少一个存储器单元,并且破坏性地读取存储在所述至少一个存储器单元中的数据。
    • 2. 发明授权
    • Semiconductor memory having a short effective word line cycle time and method for reading data from a semiconductor memory of this type
    • 具有短的有效字线周期时间的半导体存储器和用于从这种类型的半导体存储器读取数据的方法
    • US08635393B2
    • 2014-01-21
    • US11333758
    • 2006-01-17
    • Jean-Marc DortuWolfgang Spirkl
    • Jean-Marc DortuWolfgang Spirkl
    • G06F12/06
    • G11C7/1051G11C7/22G11C11/4076G11C11/4096
    • The invention relates to a method for reading data from a semiconductor memory, said method comprising the following steps in this order: providing at least one first memory bank and at least one shadow memory bank which are each designed to store a multiplicity of binary data items, the same data as in the first memory bank being stored in the shadow memory bank; receiving a command for reading data which are to be read from the first memory bank; utilizing a state checking device of the semiconductor memory to check whether the first memory bank is in an open memory bank state, and, if the first memory bank is in the open memory bank state, reading the data which are to be read from the at least one shadow memory bank, and, if the first memory bank is not in the open memory bank state, reading the data which are to be read from the first memory bank, the open memory state being such a memory state of the memory bank which does not allow the data which are to be read to be read without previously closing an open word line of the memory bank. The invention also relates to a corresponding semiconductor memory.
    • 本发明涉及一种用于从半导体存储器读取数据的方法,所述方法包括以下步骤:提供至少一个第一存储体和至少一个影子存储体,每个阴影存储体被设计成存储多个二进制数据项 与第一存储体中相同的数据存储在阴影存储体中; 接收用于读取要从第一存储体读取的数据的命令; 利用半导体存储器的状态检查装置来检查第一存储体是否处于开放存储器组状态,并且如果第一存储体处于开放存储体状态,则读取要从其读取的数据 至少一个影子存储器组,并且如果第一存储体不处于开放存储体状态,则读取要从第一存储体读取的数据,则开放存储器状态是存储体的存储状态, 不允许在未先前关闭存储体的打开字线的情况下读取要读取的数据。 本发明还涉及相应的半导体存储器。
    • 3. 发明申请
    • Memory apparatus having a short word line cycle time and method for operating a memory apparatus
    • 具有短字线周期时间的存储装置和用于操作存储装置的方法
    • US20050135139A1
    • 2005-06-23
    • US10822997
    • 2004-04-13
    • Jean-Marc DortuWolfgang Spirkl
    • Jean-Marc DortuWolfgang Spirkl
    • G11C7/22G11C11/4076G11C11/22
    • G11C11/4076G11C7/22G11C2207/2281G11C2207/229
    • Memory apparatus having a short word line cycle time and method for operating a memory apparatus. One embodiment provides a memory apparatus comprising at least one cell array having a multiplicity of memory cells, with each of the memory cells having an associated word line and an associated bit line; a control device which has a signaling connection to the word lines and to the bit lines and is configured to read data stored in the memory cells and to write data to the memory cells; wherein the control device is configured to execute a destructive read command (DRD) for reading data from at least one of the memory cells, comprising: electrically biasing a bit line associated with the at least one memory cell, opening a word line associated with the at least one memory cell, and destructively reading data stored in the at least one memory cell.
    • 具有短字线周期时间的存储装置和用于操作存储装置的方法。 一个实施例提供了一种存储器装置,其包括具有多个存储器单元的至少一个单元阵列,其中每个存储器单元具有相关联的字线和相关联的位线; 控制装置,其具有与字线和位线的信令连接,并且被配置为读取存储在存储器单元中的数据并将数据写入存储器单元; 其中所述控制设备被配置为执行用于从所述存储器单元中的至少一个读取数据的破坏性读取命令(DRD),包括:电气偏置与所述至少一个存储器单元相关联的位线,打开与所述至少一个存储器单元相关联的字线 至少一个存储器单元,并且破坏性地读取存储在所述至少一个存储器单元中的数据。
    • 4. 发明申请
    • Semiconductor memory having a short effective word line cycle time and method for reading data from a semiconductor memory of this type
    • 具有短的有效字线周期时间的半导体存储器和用于从这种类型的半导体存储器读取数据的方法
    • US20070030751A1
    • 2007-02-08
    • US11333758
    • 2006-01-17
    • Jean-Marc DortuWolfgang Spirkl
    • Jean-Marc DortuWolfgang Spirkl
    • G11C8/00
    • G11C7/1051G11C7/22G11C11/4076G11C11/4096
    • The invention relates to a method for reading data from a semiconductor memory, said method comprising the following steps in this order: providing at least one first memory bank and at least one shadow memory bank which are each designed to store a multiplicity of binary data items, the same data as in the first memory bank being stored in the shadow memory bank; receiving a command for reading data which are to be read from the first memory bank; utilizing a state checking device of the semiconductor memory to check whether the first memory bank is in an open memory bank state, and, if the first memory bank is in the open memory bank state, reading the data which are to be read from the at least one shadow memory bank, and, if the first memory bank is not in the open memory bank state, reading the data which are to be read from the first memory bank, the open memory state being such a memory state of the memory bank which does not allow the data which are to be read to be read without previously closing an open word line of the memory bank. The invention also relates to a corresponding semiconductor memory.
    • 本发明涉及一种用于从半导体存储器读取数据的方法,所述方法包括以下步骤:提供至少一个第一存储体和至少一个影子存储体,每个阴影存储体被设计成存储多个二进制数据项 与第一存储体中相同的数据存储在阴影存储体中; 接收用于读取要从第一存储体读取的数据的命令; 利用半导体存储器的状态检查装置来检查第一存储体是否处于开放存储器组状态,并且如果第一存储体处于开放存储体状态,则读取要从其读取的数据 至少一个影子存储器组,并且如果第一存储体不处于开放存储体状态,则读取要从第一存储体读取的数据,则开放存储器状态是存储体的存储状态, 不允许在未先前关闭存储体的打开字线的情况下读取要读取的数据。 本发明还涉及相应的半导体存储器。
    • 7. 发明授权
    • Semiconductor memory device with write protected memory banks
    • 具有写保护存储器的半导体存储器件
    • US07467254B2
    • 2008-12-16
    • US11041084
    • 2005-01-21
    • Jean-Marc Dortu
    • Jean-Marc Dortu
    • G06F13/00G06F12/00
    • G06F12/1433
    • The invention provides a semiconductor memory device that includes at least two memory banks. The semiconductor memory device is designed in such a way that: at least two processor units can carry out read accesses and write accesses to memory banks; and by means of an inhibit command communicated by one of the processor units, the write access by the processor unit which has communicated the inhibit command and/or by at least one of the other processor units to the inhibited memory bank is prevented at least occasionally. A circuit arrangement including the above semiconductor memory device is furthermore proposed.
    • 本发明提供一种包括至少两个存储体的半导体存储器件。 半导体存储器件被设计成:至少两个处理器单元可以执行对存储体的读访问和写存取; 并且通过由处理器单元之一传送的禁止命令,至少偶尔地防止已经传送禁止命令的处理器单元和/或其他处理器单元中的至少一个到禁止存储器组的写访问 。 此外还提出了包括上述半导体存储器件的电路装置。