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1. 发明授权

US08970830B2 Measuring method and device for determining transmission and/or reflection properties 有权
标题翻译：用于确定透射和/或反射特性的测量方法和装置
公开(公告)号：US08970830B2
公开(公告)日：2015-03-03
申请号：US13492306
申请日：2012-06-08
申请人： Joerg Margraf , Peter Lamparter
发明人： Joerg Margraf , Peter Lamparter
IPC分类号： G01N21/00 , G01N21/89 , G01N21/47 , G01N21/896
CPC分类号： G01N21/8901 , G01N21/474 , G01N21/896 , G01N2201/065
摘要： The disclosure relates to optical measuring methods and apparatus for determining the transmission and/or reflection properties of translucent objects with utility for process monitoring and quality inspection in the manufacture of surface-coated substrates. According to the disclosure the transmission and reflection properties are determined in such a way that sequentially: a first large surface of the object is illuminated by a first illuminating device, with a photodetector measuring the total transmittance (Ttotal), a second, large surface of the object, lying opposite and parallel to the first one, is illuminated by a second illuminating device, with a photodetector measuring the diffuse transmittance (Tdiffuse), and optionally the first large surface of the object is illuminated by the first illuminating device, with the photodetector measuring the reflectance, and/or the second large surface of the object is illuminated by the second illuminating device, with the photodetector measuring the reflectance.
摘要翻译：本公开涉及用于确定半透明物体的透射和/或反射特性的光学测量方法和装置，其用于在表面涂覆的基底的制造中用于过程监测和质量检查。根据本公开，透射和反射特性以如下方式确定：顺序地：物体的第一大表面由第一照明装置照射，光电检测器测量总透射率（T total），第二大表面与第一照明装置相对并平行的物体由第二照明装置照射，光电检测器测量漫透射率（Tdiffuse），并且可选地，物体的第一大表面被第一照明装置照射，测量反射率的光电检测器和/或物体的第二大表面由第二照明装置照射，光电检测器测量反射率。

2. 发明授权

US08830473B2 Device for referenced measurements of reflected light and a method for calibrating such a device 有权
标题翻译：用于反射光的参考测量的装置和用于校准这种装置的方法
公开(公告)号：US08830473B2
公开(公告)日：2014-09-09
申请号：US13486571
申请日：2012-06-01
申请人： Joerg Margraf , Peter Lamparter
发明人： Joerg Margraf , Peter Lamparter
IPC分类号： G01N21/47
CPC分类号： G01N21/474 , G01N21/255 , G01N21/4785
摘要： A device includes a hollow body having a light-exit opening configured to illuminate a specimen, an interior of the hollow body comprising a diffusely scattering layer. The device also includes a light source configured to illuminate the diffusely scattering layer, a first photo-detector aligned along a first detection axis, and a second photo-detector aligned along a second detection axis. The device is configured to measure referenced measurements of reflected light.
摘要翻译：一种装置包括具有被配置为照射样本的光出射开口的空心体，所述中空体的内部包括漫散射层。该装置还包括被配置为照亮漫散射层的光源，沿着第一检测轴对准的第一光检测器和沿第二检测轴对准的第二光检测器。该设备被配置为测量反射光的参考测量。

3. 发明申请

US20120314219A1 DEVICE FOR REFERENCED MEASUREMENTS OF REFLECTED LIGHT AND A METHOD FOR CALIBRATING SUCH A DEVICE 有权
标题翻译：用于反射光的参考测量的装置和用于校准这种装置的方法
公开(公告)号：US20120314219A1
公开(公告)日：2012-12-13
申请号：US13486571
申请日：2012-06-01
申请人： Joerg Margraf , Peter Lamparter
发明人： Joerg Margraf , Peter Lamparter
IPC分类号： G01N21/47
CPC分类号： G01N21/474 , G01N21/255 , G01N21/4785
摘要： A device for referenced measurement of reflected light and a method for calibrating such a device are disclosed.
摘要翻译：公开了用于反射光的参考测量的装置和用于校准这种装置的方法。

4. 发明申请

US20090168060A1 Spectrometric Measurement System and Method for Compensating for Veiling Glare 失效
标题翻译：光谱测量系统和补偿眩光的方法
公开(公告)号：US20090168060A1
公开(公告)日：2009-07-02
申请号：US12225904
申请日：2007-03-12
申请人： Felix Kerstan , Nico Correns , Joerg Margraf
发明人： Felix Kerstan , Nico Correns , Joerg Margraf
IPC分类号： G01J3/40
CPC分类号： G01J3/2803 , G01J3/0262 , G01J3/36 , G01J3/51
摘要： The present solution is directed to a measuring system and a method for determining spectrometric measurement results with high accuracy. The spectrometric measuring system, comprises a radiation source, an entrance slit, a dispersion element, and a detector with detector elements arranged in a linear or matrix-shaped manner in one or more planes. The detector has an even distribution of at least two different wavelength-selective filters on its detector elements. While detectors from photography and video applications are used for this purpose, use of the invention is not limited to the visible spectral region. Further, color filters on the pixels may be omitted or modified in the manufacturing process. It is also possible to use other types of detectors in which the wavelength-selective filters and associated detectors are arranged one behind each other in a plurality of planes in which complete color information is available to each individual picture point.
摘要翻译：本解决方案涉及测量系统和用于以高精度确定光谱测量结果的方法。光谱测量系统包括辐射源，入口狭缝，分散元件和具有在一个或多个平面中以线性或矩阵形式布置的检测器元件的检测器。检测器在其检测器元件上具有至少两个不同波长选择滤波器的均匀分布。虽然用于摄影和视频应用的检测器用于此目的，但是本发明的使用不限于可见光谱区域。此外，可以在制造过程中省略或修改像素上的滤色器。也可以使用其他类型的检测器，其中波长选择滤波器和相关联的检测器在多个平面中相互排列，其中完整的颜色信息可用于每个单独的图像点。

5. 发明申请

US20120105847A1 SPECTROMETRIC MEASUREMENT SYSTEM AND METHOD FOR COMPENSATING FOR VEILING GLARE 审中-公开
标题翻译：光谱测量系统及其补偿方法
公开(公告)号：US20120105847A1
公开(公告)日：2012-05-03
申请号：US13342317
申请日：2012-01-03
申请人： Felix KERSTAN , Nico Correns , Joerg Margraf
发明人： Felix KERSTAN , Nico Correns , Joerg Margraf
IPC分类号： G01J3/28
CPC分类号： G01J3/2803 , G01J3/0262 , G01J3/36 , G01J3/51
摘要： The present solution is directed to a measuring system and a method for determining spectrometric measurement results with high accuracy. The spectrometric measuring system, comprises a radiation source, an entrance slit, a dispersion element, and a detector with detector elements arranged in a linear or matrix-shaped manner in one or more planes. The detector has an even distribution of at least two different wavelength-selective filters on its detector elements. While detectors from photography and video applications are used for this purpose, use of the invention is not limited to the visible spectral region. Further, color filters on the pixels may be omitted or modified in the manufacturing process. It is also possible to use other types of detectors in which the wavelength-selective filters and associated detectors are arranged one behind each other in a plurality of planes in which complete color information is available to each individual picture point.
摘要翻译：本解决方案涉及测量系统和用于以高精度确定光谱测量结果的方法。光谱测量系统包括辐射源，入口狭缝，分散元件和具有在一个或多个平面中以线性或矩阵形式布置的检测器元件的检测器。检测器在其检测器元件上具有至少两个不同波长选择滤波器的均匀分布。虽然用于摄影和视频应用的检测器用于此目的，但是本发明的使用不限于可见光谱区域。此外，可以在制造过程中省略或修改像素上的滤色器。也可以使用其他类型的检测器，其中波长选择滤波器和相关联的检测器在多个平面中相互排列，其中完整的颜色信息可用于每个单独的图像点。

6. 发明申请

US20130271764A1 MEASUREMENT DEVICES AND APPARATUSES FOR SPECTROSCOPIC EXAMINATION OF SAMPLES 审中-公开
标题翻译：测量装置和用于样品的光谱检测的装置
公开(公告)号：US20130271764A1
公开(公告)日：2013-10-17
申请号：US13876981
申请日：2011-09-30
申请人： Joerg Margraf , Nico Correns
发明人： Joerg Margraf , Nico Correns
IPC分类号： G01J3/28
CPC分类号： G01J3/28 , G01J3/0254 , G01N21/474
摘要： A measurement device for spectroscopic examination of samples comprises a cavity extending in a longitudinal direction, a first opening to face a sample, a plurality of second openings for capturing light originating from the sample and at least one third opening for coupling light into the cavity. Such a measurement device is particularly suitable for spectroscopic examinations of planar samples.
摘要翻译：用于样品的光谱检查的测量装置包括沿纵向方向延伸的空腔，面向样品的第一开口，用于捕获源自样品的光的多个第二开口和用于将光耦合到空腔中的至少一个第三开口。这种测量装置特别适用于平面样品的光谱检查。

7. 发明授权

US08111396B2 Spectrometric measurement system and method for compensating for veiling glare 失效
标题翻译：光谱测量系统和补偿眩光的方法
公开(公告)号：US08111396B2
公开(公告)日：2012-02-07
申请号：US12225904
申请日：2007-03-12
申请人： Felix Kerstan , Nico Correns , Joerg Margraf
发明人： Felix Kerstan , Nico Correns , Joerg Margraf
IPC分类号： G01J3/28 , G01J3/36
CPC分类号： G01J3/2803 , G01J3/0262 , G01J3/36 , G01J3/51
摘要： The present solution is directed to a measuring system and a method for determining spectrometric measurement results with high accuracy. The spectrometric measuring system, comprises a radiation source, an entrance slit, a dispersion element, and a detector with detector elements arranged in a linear or matrix-shaped manner in one or more planes. The detector has an even distribution of at least two different wavelength-selective filters on its detector elements. While detectors from photography and video applications are used for this purpose, use of the invention is not limited to the visible spectral region. Further, color filters on the pixels may be omitted or modified in the manufacturing process. It is also possible to use other types of detectors in which the wavelength-selective filters and associated detectors are arranged one behind each other in a plurality of planes in which complete color information is available to each individual picture point.
摘要翻译：本解决方案涉及测量系统和用于以高精度确定光谱测量结果的方法。光谱测量系统包括辐射源，入口狭缝，分散元件和具有在一个或多个平面中以线性或矩阵形式布置的检测器元件的检测器。检测器在其检测器元件上具有至少两个不同波长选择滤波器的均匀分布。虽然用于摄影和视频应用的检测器用于此目的，但是本发明的使用不限于可见光谱区域。此外，可以在制造过程中省略或修改像素上的滤色器。也可以使用其他类型的检测器，其中波长选择滤波器和相关联的检测器在多个平面中相互排列，其中完整的颜色信息可用于每个单独的图像点。

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