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1. 发明授权

US08237935B2 Method and system for automatically inspecting parts and for automatically generating calibration data for use in inspecting parts 有权
标题翻译：用于自动检查零件并自动生成用于检查零件的校准数据的方法和系统
公开(公告)号：US08237935B2
公开(公告)日：2012-08-07
申请号：US12704863
申请日：2010-02-12
申请人： Michael G. Nygaard , Gregory M. Nygaard , George M. Nygaard , John D. Spalding
发明人： Michael G. Nygaard , Gregory M. Nygaard , George M. Nygaard , John D. Spalding
IPC分类号： G01B11/04
CPC分类号： G01B11/2425 , G01B11/2433 , G01B11/245
摘要： A method and system for automatically inspecting parts and for automatically generating calibration data for use in inspecting parts are provided. The system includes a support for supporting a part to be inspected and/or a calibration device along a measurement axis. The system further includes a head apparatus including a plurality of radiation plane generators for directing an array of planes of radiation at the part and/or device so that the part and/or device occludes each of the planes of radiation to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part and/or device. The head apparatus further includes a plurality of radiation plane receivers or cameras such as line scan cameras. Each of the cameras measures the amount of radiation present in an adjacent pair of unobstructed planar portions created from the same plane of radiation to obtain at least one measurement signal. The system still further includes a stage subsystem including a stage movable along a stage axis substantially parallel to the measurement axis and coupled to the head apparatus to move therewith for translating the head apparatus relative to the part and/or device along the stage axis so that the planes of radiation scan the part and/or device supported by the support substantially perpendicular to the stage and measurement axes. The system may further include one or more mechanisms for reducing radiation cross talk between neighboring cameras.
摘要翻译：提供一种用于自动检查零件并自动生成用于检测零件的校准数据的方法和系统。该系统包括用于支撑待检查部件和/或沿测量轴线的校准装置的支撑件。该系统还包括头部设备，该头部设备包括多个辐射平面发生器，用于在部件和/或设备处引导辐射平面阵列，使得该部件和/或设备遮挡每个辐射平面以产生相应的阵列辐射平面的无障碍平面部分。每个无障碍平面部分包含代表部件和/或设备的相应几何尺寸的辐射量。头设备还包括多个辐射平面接收器或诸如线扫描照相机的照相机。每个相机测量由相同的辐射平面产生的相邻的一对无障碍平面部分中存在的辐射量，以获得至少一个测量信号。该系统还包括舞台子系统，该舞台子系统包括可沿基本上平行于测量轴线的舞台轴线移动的舞台，并且联接到头部装置以与之移动以便相对于舞台轴线相对于部件和/或装置平移头部装置，使得辐射平面扫描由支撑件支撑的部分和/或装置，其基本上垂直于载物台和测量轴。该系统还可以包括用于减少相邻摄像机之间的辐射串扰的一个或多个机构。

2. 发明申请

US20090103111A1 Method and inspection head apparatus for optically measuring geometric dimensions of a part 有权
标题翻译：用于光学测量零件几何尺寸的方法和检查头装置
公开(公告)号：US20090103111A1
公开(公告)日：2009-04-23
申请号：US11977010
申请日：2007-10-23
申请人： John D. Spalding
发明人： John D. Spalding
IPC分类号： G01B11/02 , G01B11/04
CPC分类号： G01B11/028 , G01B11/245
摘要： A method and inspection head apparatus for optically measuring geometric dimensions of a part are provided. The method optically measures the geometric dimensions of a part having a part axis at an inspection station. The method includes directing an array of spaced planes of radiation at the part so that the part occludes each of the planes of radiation at spaced locations along the part axis to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part. The method further includes measuring the amount of radiation present in each of the unobstructed planar portions.
摘要翻译：提供了用于光学测量零件的几何尺寸的方法和检查头装置。该方法光学地测量在检查站具有部分轴线的部件的几何尺寸。该方法包括在该部分处引导辐射的间隔平面阵列，使得该部分沿着部分轴线在间隔开的位置处封闭辐射平面中的每一个平面，以产生辐射平面中不受阻碍的平面部分的对应阵列。每个无障碍平面部分包含代表部件的相应几何尺寸的辐射量。该方法还包括测量每个无障碍平面部分中存在的辐射量。

3. 发明申请

US20090103109A1 Optical modules and method of precisely assembling same 有权
标题翻译：光模块及精密组装方法
公开(公告)号：US20090103109A1
公开(公告)日：2009-04-23
申请号：US11977102
申请日：2007-10-23
申请人： John D. Spalding , Paul L. Bourget , Harold W. Brunt, JR.
发明人： John D. Spalding , Paul L. Bourget , Harold W. Brunt, JR.
IPC分类号： G01B11/14 , B23Q17/00
CPC分类号： G01B11/27 , H01S3/005 , Y10T29/49769
摘要： Optical modules and a method of precisely assembling the modules are provided. The method includes the step of providing a set of optical components including a plurality of beam shaping components for converting at least one initial shape in cross section of a laser beam to at least one desired shape in cross section and an optical mount for supporting the set of optical components. The method further includes holding and locating the optical mount relative to a reference axis. The method still further includes holding the optical components in position relative to the optical mount during the step of holding and locating wherein the positions of the beam shaping components are initial positions. The method includes directing a laser beam having the at least one initial shape at the set of optical components during the step of holding the optical components. The method further includes adjusting the initial positions of the beam shaping components to obtain final positions of the beam shaping components relative to the optical mount during the step of directing until the laser beam has the at least one desired shape. The method still further includes fixedly securing the optical components to the optical mount wherein the optical mount supports and is fixedly secured to the beam shaping components in their respective final positions after the step of adjusting when the laser beam has the at least one desired shape.
摘要翻译：提供光模块和精确组装模块的方法。该方法包括提供一组光学部件的步骤，该组件包括多个光束成形部件，用于将激光束的横截面中的至少一个初始形状转换成至少一个所需的横截面形状;以及用于支撑该组件的光学支架的光学元件。该方法还包括相对于参考轴保持和定位光学安装座。该方法还包括在保持和定位的步骤期间将光学部件保持在相对于光学安装座的位置，其中光束成形部件的位置是初始位置。该方法包括在保持光学部件的步骤期间将具有至少一个初始形状的激光束定向在该组光学部件处。该方法还包括调整光束成形部件的初始位置，以在引导步骤期间获得光束成形部件相对于光学基座的最终位置，直到激光束具有至少一个期望的形状。该方法还包括将光学部件固定地固定到光学安装座上，其中光学安装座支撑并且在激光束具有至少一个所需形状的调整步骤之后固定地固定到光束成形部件处于它们各自的最终位置。

4. 发明申请

US20100238435A1 CALIBRATION DEVICE FOR USE IN AN OPTICAL PART MEASURING SYSTEM 有权
标题翻译：用于光学部件测量系统的校准装置
公开(公告)号：US20100238435A1
公开(公告)日：2010-09-23
申请号：US12778721
申请日：2010-05-12
申请人： John D. Spalding
发明人： John D. Spalding
IPC分类号： G01J1/10
CPC分类号： G01B11/03 , G01B11/2504 , G01B21/042
摘要： A calibration device for use in an optical, part measuring system is provided. The device has a central axis and a plurality of regions which are rotationally symmetric about the axis. The device includes a series of step-shaped portions defining a multi-step region having a plurality of step edges. A profile of the multi-step region contains information for calibrating the system. The device further includes a plurality of cylindrically-shaped portions spaced apart along the axis and defining constant diameter regions containing information for calibrating the system. The device still further includes a frustum-shaped portion defining a pair of spaced, slope edge regions and a sloped region having boundaries marked by the pair of slope edge regions. The frustum-shaped portion has first and second diameters at its boundaries which define a range of diameters of parts capable of being measured in the system. A profile of the slope edge regions and the sloped region contains information for calibrating the system.
摘要翻译：提供了一种用于光学部件测量系统的校准装置。该装置具有中心轴线和围绕该轴线旋转对称的多个区域。该装置包括限定具有多个台阶边缘的多步骤区域的一系列阶梯形部分。多步区域的配置文件包含用于校准系统的信息。该装置还包括沿着轴线间隔开的多个圆柱形部分，并且限定恒定的直径区域，其包含用于校准系统的信息。该装置还包括限定一对间隔的倾斜边缘区域的截头锥形部分和具有由该对边缘区域标记的边界的倾斜区域。截头锥形部分在其边界处具有第一和第二直径，其限定能够在系统中测量的部分的直径范围。倾斜边缘区域和倾斜区域的轮廓包含用于校准系统的信息。

5. 发明授权

US07755754B2 Calibration device for use in an optical part measuring system 有权
标题翻译：用于光学部件测量系统的校准装置
公开(公告)号：US07755754B2
公开(公告)日：2010-07-13
申请号：US11977114
申请日：2007-10-23
申请人： John D. Spalding
发明人： John D. Spalding
IPC分类号： G01J1/10
CPC分类号： G01B11/03 , G01B11/2504 , G01B21/042
摘要： A calibration device for use in an optical, part measuring system is provided. The device has a central axis and a plurality of regions which are rotationally symmetric about the axis. The device includes a series of step-shaped portions defining a multi-step region having a plurality of step edges. A profile of the multi-step region contains information for calibrating the system. The device further includes a plurality of cylindrically-shaped portions spaced apart along the axis and defining constant diameter regions containing information for calibrating the system. The device still further includes a frustum-shaped portion defining a pair of spaced, slope edge regions and a sloped region having boundaries marked by the pair of slope edge regions. The frustum-shaped portion has first and second diameters at its boundaries which define a range of diameters of parts capable of being measured in the system. A profile of the slope edge regions and the sloped region contains information for calibrating the system.
摘要翻译：提供了一种用于光学部件测量系统的校准装置。该装置具有中心轴线和围绕该轴线旋转对称的多个区域。该装置包括限定具有多个台阶边缘的多步骤区域的一系列阶梯形部分。多步区域的配置文件包含用于校准系统的信息。该装置还包括沿着轴线间隔开的多个圆柱形部分，并且限定恒定的直径区域，其包含用于校准系统的信息。该装置还包括限定一对间隔的倾斜边缘区域的截头锥形部分和具有由该对边缘区域标记的边界的倾斜区域。截头锥形部分在其边界处具有第一和第二直径，其限定能够在系统中测量的部分的直径范围。倾斜边缘区域和倾斜区域的轮廓包含用于校准系统的信息。

6. 发明申请

US20100073687A1 Method For Precisely Measuring Position Of A Part To Be Inspected At A Part Inspection Station 有权
标题翻译：在零件检验站检查零件的位置的精确测量方法
公开(公告)号：US20100073687A1
公开(公告)日：2010-03-25
申请号：US12233821
申请日：2008-09-19
申请人： John D. Spalding , Eric M. Walstra
发明人： John D. Spalding , Eric M. Walstra
IPC分类号： G01B11/14
CPC分类号： G01B11/2433 , G01B11/2425 , G01B11/245
摘要： A method for precisely measuring position of a part to be inspected at a part inspection station is provided. The method includes positioning a part having a part axis relative to a measurement axis at the part inspection station and scanning the positioned part with an array of planes of radiation so that the part occludes each of the planes of radiation over a measurement interval of the part to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part. The method also includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals and processing the measurement signals to obtain a geometric measurement between the axes at the measurement interval. The geometric measurement may be a distance between the axes or angle between the axes. If the geometric measurement is outside an acceptable range of geometric values, the method may further include repositioning the part until the geometric measurement between the axes at the measurement interval is within the acceptable range of geometric values.
摘要翻译：提供了一种用于在零件检查站精确测量待检查部件的位置的方法。该方法包括在部件检查站处定位具有相对于测量轴线的部分轴线的部件，并用辐射平面阵列扫描定位部件，使得该部件在部件的测量间隔上封闭每个辐射平面以产生辐射平面中的无障碍平面部分的相应阵列。每个无障碍平面部分包含代表部件的相应几何尺寸的辐射量。该方法还包括测量每个无障碍平面部分中存在的辐射量以获得测量信号并处理测量信号以获得在测量间隔的轴之间的几何测量。几何测量可以是轴之间的距离或轴之间的角度。如果几何测量值在几何值的可接受范围之外，则该方法还可以包括重新定位该部件，直到在测量间隔处的轴之间的几何测量在可接受的几何值范围内。

7. 发明授权

US07907267B2 Optical method and system for generating calibration data for use in calibrating a part inspection system 有权
标题翻译：光学方法和系统，用于生成用于校准零件检查系统的校准数据
公开(公告)号：US07907267B2
公开(公告)日：2011-03-15
申请号：US12780054
申请日：2010-05-14
申请人： John D. Spalding
发明人： John D. Spalding
IPC分类号： G01J1/00 , G06M1/00
CPC分类号： G01B11/08 , G01B11/2504
摘要： An optical method and system for generating calibration data are provided. The calibration data is for use in calibrating a part inspection system. The method includes supporting a calibration device having a central axis and a plurality of regions which are rotationally symmetric about the axis. The method further includes scanning the device with an array of spaced planes of radiation so that the device occludes each of the planes of radiation at spaced locations along the central axis to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the device. The method still further includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals. The method includes processing the measurement signals to obtain calibration data for calibrating the system. The calibration data is capable of converting raw data to calibrated data.
摘要翻译：提供了一种用于产生校准数据的光学方法和系统。校准数据用于校准零件检查系统。该方法包括支持具有中心轴和围绕轴旋转对称的多个区域的校准装置。该方法还包括用间隔开的平面阵列扫描该装置，使得该装置沿着中心轴在间隔开的位置处封闭每个辐射平面，以产生辐射平面中不受阻碍的平面部分的对应阵列。每个无障碍平面部分包含代表装置的相应几何尺寸的辐射量。该方法还包括测量每个无障碍平面部分中存在的辐射量以获得测量信号。该方法包括处理测量信号以获得用于校准系统的校准数据。校准数据能够将原始数据转换为校准数据。

8. 发明授权

US07633634B2 Optical modules and method of precisely assembling same 有权
标题翻译：光模块及精密组装方法
公开(公告)号：US07633634B2
公开(公告)日：2009-12-15
申请号：US11977102
申请日：2007-10-23
申请人： John D. Spalding , Paul L. Bourget , Harold W. Brunt, Jr.
发明人： John D. Spalding , Paul L. Bourget , Harold W. Brunt, Jr.
IPC分类号： G01B11/02
CPC分类号： G01B11/27 , H01S3/005 , Y10T29/49769
摘要： Optical modules and a method of precisely assembling the modules are provided. The method includes the step of providing a set of optical components including a plurality of beam shaping components for converting at least one initial shape in cross section of a laser beam to at least one desired shape in cross section and an optical mount for supporting the set of optical components. The method further includes holding and locating the optical mount relative to a reference axis. The method still further includes holding the optical components in position relative to the optical mount during the step of holding and locating wherein the positions of the beam shaping components are initial positions. The method includes directing a laser beam having the at least one initial shape at the set of optical components during the step of holding the optical components. The method further includes adjusting the initial positions of the beam shaping components to obtain final positions of the beam shaping components relative to the optical mount during the step of directing until the laser beam has the at least one desired shape.
摘要翻译：提供光模块和精确组装模块的方法。该方法包括提供一组光学部件的步骤，该组件包括多个光束成形部件，用于将激光束的横截面中的至少一个初始形状转换成至少一个所需的横截面形状;以及用于支撑该组件的光学支架的光学元件。该方法还包括相对于参考轴保持和定位光学安装座。该方法还包括在保持和定位的步骤期间将光学部件保持在相对于光学安装座的位置，其中光束成形部件的位置是初始位置。该方法包括在保持光学部件的步骤期间将具有至少一个初始形状的激光束定向在该组光学部件处。该方法还包括调整光束成形部件的初始位置，以在引导步骤期间获得光束成形部件相对于光学基座的最终位置，直到激光束具有至少一个期望的形状。

9. 发明申请

US20090100900A1 Optical method and system for generating calibration data for use in calibrating a part inspection system 有权
标题翻译：光学方法和系统，用于生成用于校准零件检查系统的校准数据
公开(公告)号：US20090100900A1
公开(公告)日：2009-04-23
申请号：US11975977
申请日：2007-10-23
申请人： John D. Spalding
发明人： John D. Spalding
IPC分类号： G01B21/00
CPC分类号： G01B11/08 , G01B11/2504
摘要： An optical method and system for generating calibration data are provided. The calibration data is for use in calibrating a part inspection system. The method includes supporting a calibration device having a central axis and a plurality of regions which are rotationally symmetric about the axis. The method further includes scanning the device with an array of spaced planes of radiation so that the device occludes each of the planes of radiation at spaced locations along the central axis to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the device. The method still further includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals. The method includes processing the measurement signals to obtain calibration data for calibrating the system. The calibration data is capable of converting raw data to calibrated data.
摘要翻译：提供了一种用于产生校准数据的光学方法和系统。校准数据用于校准零件检查系统。该方法包括支持具有中心轴和围绕轴旋转对称的多个区域的校准装置。该方法还包括用间隔开的平面阵列扫描该装置，使得该装置沿着中心轴在间隔开的位置处封闭每个辐射平面，以产生辐射平面中不受阻碍的平面部分的对应阵列。每个无障碍平面部分包含代表装置的相应几何尺寸的辐射量。该方法还包括测量每个无障碍平面部分中存在的辐射量以获得测量信号。该方法包括处理测量信号以获得用于校准系统的校准数据。校准数据能够将原始数据转换为校准数据。

10. 发明授权

US07796278B2 Method for precisely measuring position of a part to be inspected at a part inspection station 有权
标题翻译：在零件检查站精确测量待检查零件位置的方法
公开(公告)号：US07796278B2
公开(公告)日：2010-09-14
申请号：US12233821
申请日：2008-09-19
申请人： John D. Spalding , Eric M. Walstra
发明人： John D. Spalding , Eric M. Walstra
IPC分类号： G01B11/04 , G01B11/08 , G01M1/00
CPC分类号： G01B11/2433 , G01B11/2425 , G01B11/245
摘要： A method for precisely measuring position of a part to be inspected at a part inspection station is provided. The method includes positioning a part having a part axis relative to a measurement axis at the part inspection station and scanning the positioned part with an array of planes of radiation so that the part occludes each of the planes of radiation over a measurement interval of the part to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part. The method also includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals and processing the measurement signals to obtain a geometric measurement between the axes at the measurement interval. The geometric measurement may be a distance between the axes or angle between the axes. If the geometric measurement is outside an acceptable range of geometric values, the method may further include repositioning the part until the geometric measurement between the axes at the measurement interval is within the acceptable range of geometric values.
摘要翻译：提供了一种用于在零件检查站精确测量待检查部件的位置的方法。该方法包括在部件检查站处定位具有相对于测量轴线的部分轴线的部件，并用辐射平面阵列扫描定位部件，使得该部件在部件的测量间隔上封闭每个辐射平面以产生辐射平面中的无障碍平面部分的相应阵列。每个无障碍平面部分包含代表部件的相应几何尺寸的辐射量。该方法还包括测量每个无障碍平面部分中存在的辐射量以获得测量信号并处理测量信号以获得在测量间隔的轴之间的几何测量。几何测量可以是轴之间的距离或轴之间的角度。如果几何测量值在几何值的可接受范围之外，则该方法还可以包括重新定位该部件，直到在测量间隔处的轴之间的几何测量在可接受的几何值范围内。

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