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    • 3. 发明申请
    • Structured-Light Based Measuring Method and System
    • 基于结构光的测量方法和系统
    • US20130050476A1
    • 2013-02-28
    • US13696785
    • 2010-05-07
    • Danwei ShiDi WuWenchuang ZhaoQi Xie
    • Danwei ShiDi WuWenchuang ZhaoQi Xie
    • H04N7/18
    • G01B11/2545G06T7/521G06T2207/10012
    • A structured-light measuring method, includes: matching process, in which the number and the low-precision depth of a laser point are achieved by using the imaging position of the laser point on a first camera (21) according to a first corresponding relationship in a calibration database, and the imaging position of the laser point on a second camera (22) is searched according to the number and the low-precision depth of the laser point so as to acquire the candidate matching points, then the matching process is completed according to the imaging position of the first camera (21) and the candidate matching points of the imaging position of the first camera (21) on the second camera (22) so that a matching result is achieved; and computing process, in which the imaging position of the second camera (22) matching with the imaging position of the first camera (21) is achieved according to the matching result, and then the precision position of the laser point is determined by a second corresponding relationship in the calibration database. A structured-light measuring system utilizes the above measuring method.
    • 一种结构光测量方法,包括:匹配处理,其中通过根据第一对应关系在第一相机(21)上使用激光点的成像位置来实现激光点的数量和低精度深度 在校准数据库中,根据激光点的数量和低精度深度搜索激光点在第二相机(22)上的成像位置,以获得候选匹配点,则匹配处理为 根据第一相机(21)的成像位置和第二相机(22)上的第一相机(21)的成像位置的候选匹配点完成,从而实现匹配结果; 以及计算处理,其中根据匹配结果实现与第一相机(21)的成像位置匹配的第二相机(22)的成像位置,然后由第二相位确定激光点的精确位置 校准数据库中的对应关系。 结构光测量系统采用上述测量方法。
    • 4. 发明授权
    • Structured-light based measuring method and system
    • 基于结构光的测量方法和系统
    • US09360307B2
    • 2016-06-07
    • US13696785
    • 2010-05-07
    • Danwei ShiDi WuWenchuang ZhaoQi Xie
    • Danwei ShiDi WuWenchuang ZhaoQi Xie
    • H04N7/18G01B11/25G06T7/00
    • G01B11/2545G06T7/521G06T2207/10012
    • A structured-light measuring method, includes: matching process, in which the number and the low-precision depth of a laser point are achieved by using the imaging position of the laser point on a first camera (21) according to a first corresponding relationship in a calibration database, and the imaging position of the laser point on a second camera (22) is searched according to the number and the low-precision depth of the laser point so as to acquire the candidate matching points, then the matching process is completed according to the imaging position of the first camera (21) and the candidate matching points of the imaging position of the first camera (21) on the second camera (22) so that a matching result is achieved; and computing process, in which the imaging position of the second camera (22) matching with the imaging position of the first camera (21) is achieved according to the matching result, and then the precision position of the laser point is determined by a second corresponding relationship in the calibration database. A structured-light measuring system utilizes the above measuring method.
    • 一种结构光测量方法,包括:匹配处理,其中通过根据第一对应关系在第一相机(21)上使用激光点的成像位置来实现激光点的数量和低精度深度 在校准数据库中,根据激光点的数量和低精度深度搜索激光点在第二相机(22)上的成像位置,以获得候选匹配点,则匹配处理为 根据第一相机(21)的成像位置和第二相机(22)上的第一相机(21)的成像位置的候选匹配点完成,从而实现匹配结果; 以及计算处理,其中根据匹配结果实现与第一相机(21)的成像位置匹配的第二相机(22)的成像位置,然后由第二相位确定激光点的精确位置 校准数据库中的对应关系。 结构光测量系统采用上述测量方法。