会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Quantum efficiency measurement method, quantum efficiency measurement apparatus, and integrator
    • 量子效率测量方法,量子效率测量装置和积分器
    • US08415639B2
    • 2013-04-09
    • US13033612
    • 2011-02-24
    • Yoshihiro OsawaKazuaki Ohkubo
    • Yoshihiro OsawaKazuaki Ohkubo
    • G01J1/58
    • G01N21/645G01J1/58G01J3/0254G01J2001/0481G01J2001/4247G01N2021/6417G01N2021/6469G01N2201/0655
    • A quantum efficiency measurement method includes the steps of: disposing a sample at a predetermined position in an integrator having an integrating space; applying excitation light to the sample and measuring a spectrum in the integrating space as a first spectrum through a second window; configuring an excitation light incident portion so that excitation light after having passed through the sample is not reflected in the integrating space; applying the excitation light to the sample and measuring a spectrum in the integrating space as a second spectrum through the second window; and calculating a quantum efficiency of the sample based on a component constituting a part of the first spectrum and corresponding to a wavelength range of the excitation light, and a component constituting a part of the second spectrum and corresponding to a wavelength range of light generated by the sample from the received excitation light.
    • 量子效率测量方法包括以下步骤:在具有积分空间的积分器中的预定位置处设置样本; 向样品施加激发光并通过第二窗口测量积分空间中的光谱作为第一光谱; 配置激发光入射部分,使得在通过样品之后的激发光不在积分空间中反射; 将激发光施加到样品并通过第二窗口测量积分空间中的光谱作为第二光谱; 并且基于构成所述第一光谱的一部分并且对应于所述激发光的波长范围的分量以及构成所述第二光谱的一部分的分量并且对应于由所述第二光谱产生的光的波长范围而对应的光的波长范围来计算所述样本的量子效率 来自接收到的激发光的样品。
    • 2. 发明申请
    • QUANTUM EFFICIENCY MEASUREMENT METHOD, QUANTUM EFFICIENCY MEASUREMENT APPARATUS, AND INTEGRATOR
    • 量子效率测量方法,量子效率测量装置和整合器
    • US20110226961A1
    • 2011-09-22
    • US13033612
    • 2011-02-24
    • Yoshihiro OSAWAKazuaki Ohkubo
    • Yoshihiro OSAWAKazuaki Ohkubo
    • G01J1/58
    • G01N21/645G01J1/58G01J3/0254G01J2001/0481G01J2001/4247G01N2021/6417G01N2021/6469G01N2201/0655
    • A quantum efficiency measurement method includes the steps of: disposing a sample at a predetermined position in an integrator having an integrating space; applying excitation light to the sample and measuring a spectrum in the integrating space as a first spectrum through a second window; configuring an excitation light incident portion so that excitation light after having passed through the sample is not reflected in the integrating space; applying the excitation light to the sample and measuring a spectrum in the integrating space as a second spectrum through the second window; and calculating a quantum efficiency of the sample based on a component constituting a part of the first spectrum and corresponding to a wavelength range of the excitation light, and a component constituting a part of the second spectrum and corresponding to a wavelength range of light generated by the sample from the received excitation light.
    • 量子效率测量方法包括以下步骤:在具有积分空间的积分器中的预定位置处设置样本; 向样品施加激发光并通过第二窗口测量积分空间中的光谱作为第一光谱; 配置激发光入射部分,使得在通过样品之后的激发光不在积分空间中反射; 将激发光施加到样品并通过第二窗口测量积分空间中的光谱作为第二光谱; 并且基于构成所述第一光谱的一部分并且对应于所述激发光的波长范围的分量和构成所述第二光谱的一部分的分量并且对应于由所述第二光谱产生的光的波长范围对应的样品的量子效率 来自接收到的激发光的样品。
    • 6. 发明授权
    • Spectroradiometer
    • 光谱仪
    • US5497230A
    • 1996-03-05
    • US334066
    • 1994-11-04
    • Kazuaki OhkuboYasuo Nakagawa
    • Kazuaki OhkuboYasuo Nakagawa
    • G01J3/02G01J3/18G01J3/28
    • G01J3/28
    • Light having a wavelength equal to or less than the cut-off wavelength of a sharp-cut filter is cut off so that an output of a photo-sensitive device corresponds to a stray light component when a wavelength control device sets the wavelength equal to or less than the cut-off wavelength of the sharp-cut filter. By subtracting the stray light component from the output of the photo-sensitive device when the photo-sensitive device is to be measured an intensity of light having a predetermined wavelength, the stray light component can be removed from dispersion outputs of the spectroradiometer.
    • 切断具有等于或小于锐利截止滤光器的截止波长的波长的光,当波长控制装置将波长等于或等于或等于或等于其波长时,光敏装置的输出对应于杂散光分量 小于截止滤波器的截止波长。 当要对感光装置测量具有预定波长的光的强度时,通过从感光装置的输出中减去杂散光分量,可以从分光辐射计的色散输出中去除杂散光分量。
    • 7. 发明授权
    • Optical measurement apparatus including hemispherical optical integrator
    • 包括半球形光学积分器的光学测量装置
    • US08422018B2
    • 2013-04-16
    • US13029067
    • 2011-02-16
    • Yoshihiro OsawaKazuaki Ohkubo
    • Yoshihiro OsawaKazuaki Ohkubo
    • G01N21/55G01N21/47
    • G01J3/0254G01J1/58G01J2001/0481G01J2001/4247
    • An optical measurement apparatus includes a hemispherical portion having a diffuse reflection layer on an inner wall, and a plane portion disposed to involve a substantial center of curvature of the hemispherical portion and close an opening of the hemispherical portion, and having a reflection layer on an inner surface side of the hemispherical portion. The plane portion includes: at least one of a window for introducing light to be homogenized in an integrating space formed between the hemispherical portion and the plane portion, and a window for extracting light homogenized in the integrating space; an outer portion formed of a first material chiefly causing specular reflection, and occupying at least a region of a predetermined width from an outermost circumference; and an inner portion formed of a second material chiefly causing diffuse reflection and having a higher reflectance for at least an ultraviolet region than the first material.
    • 光学测量装置包括在内壁上具有漫反射层的半球形部分和设置成包含半球形部分的大致中心的平面部分,并且关闭半球形部分的开口,并且在其上具有反射层 半球形部分的内表面侧。 平面部分包括:用于在形成在半球形部分和平面部分之间的积分空间中引入要均匀化的光的窗口中的至少一个以及用于提取在积分空间中均匀化的光的窗口; 由第一材料形成的外部,主要引起镜面反射,并且至少占据从最外周的预定宽度的区域; 以及由第二材料形成的内部,其主要引起漫反射并且具有比第一材料至少紫外区更高的反射率。
    • 10. 发明申请
    • OPTICAL MEASUREMENT APPARATUS INCLUDING HEMISPHERICAL OPTICAL INTEGRATOR
    • 光学测量装置包括HEMISPHERICAL OPTICAL INTEGRATOR
    • US20110205541A1
    • 2011-08-25
    • US13029067
    • 2011-02-16
    • Yoshihiro OSAWAKazuaki Ohkubo
    • Yoshihiro OSAWAKazuaki Ohkubo
    • G01J3/46G01J1/00G01J1/42
    • G01J3/0254G01J1/58G01J2001/0481G01J2001/4247
    • An optical measurement apparatus includes a hemispherical portion having a diffuse reflection layer on an inner wall, and a plane portion disposed to involve a substantial center of curvature of the hemispherical portion and close an opening of the hemispherical portion, and having a reflection layer on an inner surface side of the hemispherical portion. The plane portion includes: at least one of a window for introducing light to be homogenized in an integrating space formed between the hemispherical portion and the plane portion, and a window for extracting light homogenized in the integrating space; an outer portion formed of a first material chiefly causing specular reflection, and occupying at least a region of a predetermined width from an outermost circumference; and an inner portion formed of a second material chiefly causing diffuse reflection and having a higher reflectance for at least an ultraviolet region than the first material.
    • 光学测量装置包括在内壁上具有漫反射层的半球形部分和设置成包含半球形部分的大致中心的平面部分,并且关闭半球形部分的开口,并且在其上具有反射层 半球形部分的内表面侧。 平面部分包括:用于在形成在半球形部分和平面部分之间的积分空间中引入要均匀化的光的窗口中的至少一个以及用于提取在积分空间中均匀化的光的窗口; 由第一材料形成的外部,主要引起镜面反射,并且至少占据从最外周的预定宽度的区域; 以及由第二材料形成的内部,其主要引起漫反射并且具有比第一材料至少紫外区更高的反射率。