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    • 4. 发明申请
    • METHOD AND APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICE
    • 制造半导体器件的方法和装置
    • US20100240223A1
    • 2010-09-23
    • US12729926
    • 2010-03-23
    • Hideki ITONaohisa Ikeya
    • Hideki ITONaohisa Ikeya
    • H01L21/18
    • H01L21/67109
    • A method for manufacturing a semiconductor device, comprising: loading a wafer to be subjected to film formation to a chamber; supporting the wafer to be spaced from a film formation position of the wafer; preliminarily heating the wafer while rotating a rotating member for rotating the wafer through a supporting member during the film formation at a predetermined rotational speed under a state of the wafer to be spaced from the film formation position; placing the wafer on the supporting member in the film formation position; and heating the wafer at a predetermined temperature and supplying a process gas onto the wafer while rotating the wafer.
    • 一种制造半导体器件的方法,包括:将要成膜的晶片加载到腔室; 支撑晶片与晶片的成膜位置间隔开; 在晶片的状态下以预定的转速旋转用于在成膜期间通过支撑构件旋转晶片的旋转构件与晶片形成位置间隔开的同时预先加热晶片; 将晶片放置在成膜位置的支撑构件上; 并在预定温度下加热晶片,并在转动晶片的同时将工艺气体供应到晶片上。
    • 5. 发明授权
    • Method and apparatus for manufacturing semiconductor device
    • 用于制造半导体器件的方法和装置
    • US08008168B2
    • 2011-08-30
    • US12729926
    • 2010-03-23
    • Hideki ItoNaohisa Ikeya
    • Hideki ItoNaohisa Ikeya
    • H01L21/20H01L21/36
    • H01L21/67109
    • A method for manufacturing a semiconductor device, comprising: loading a wafer to be subjected to film formation to a chamber; supporting the wafer to be spaced from a film formation position of the wafer; preliminarily heating the wafer while rotating a rotating member for rotating the wafer through a supporting member during the film formation at a predetermined rotational speed under a state of the wafer to be spaced from the film formation position; placing the wafer on the supporting member in the film formation position; and heating the wafer at a predetermined temperature and supplying a process gas onto the wafer while rotating the wafer.
    • 一种制造半导体器件的方法,包括:将要成膜的晶片加载到腔室; 支撑晶片与晶片的成膜位置间隔开; 在晶片的状态下以预定的转速旋转用于在成膜期间通过支撑构件旋转晶片的旋转构件与晶片形成位置间隔开的同时预先加热晶片; 将晶片放置在成膜位置的支撑构件上; 并在预定温度下加热晶片,并在转动晶片的同时将工艺气体供应到晶片上。