会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 4. 发明授权
    • Semiconductor multipackage module including tape substrate land grid array package stacked over ball grid array package
    • 半导体多功能封装模块,包括堆叠在球栅阵列封装上的带状衬底焊盘栅格阵列封装
    • US07589407B2
    • 2009-09-15
    • US11396954
    • 2006-04-03
    • Marcos Karnezos
    • Marcos Karnezos
    • H01L23/02
    • H01L23/3128H01L23/49816H01L23/49861H01L24/48H01L24/73H01L25/03H01L25/0657H01L2224/32225H01L2224/48091H01L2224/48227H01L2224/48465H01L2224/73265H01L2924/00014H01L2924/01078H01L2924/01079H01L2924/1433H01L2924/15311H01L2924/181H01L2924/19107H01L2924/00H01L2924/00012H01L2224/45099H01L2224/45015H01L2924/207
    • A single metal layer tape substrate includes a patterned metal layer affixed to a patterned dielectric layer. The dielectric layer is patterned to provide openings exposing lands and bond sites on bond fingers on the land side of the metal layer. The metal layer is patterned to provide circuit traces as appropriate for interconnection with the die (on the die attach side) and with other elements (such as other packages in a multi-package module). Interconnection with a die is made by wire bonding to exposed traces on a die attach side of the metal layer, and bond fingers and lands for access to testing the package are provided on the opposite (land) side of the metal layer. In some embodiments a row of wire bond sites on the land side of adjacent bond fingers is exposed by a common opening in the dielectric layer, providing for a finer pitch interconnect and, accordingly, a higher interconnect density between stacked packages. Also a land grid array package having such a single metal layer tape substrate. Also, a multi-package module including such a single metal layer tape substrate land grid array package stacked over a ball grid array package. Methods for making the substrate are also disclosed.
    • 单个金属层带基板包括固定到图案化电介质层上的图案化金属层。 对电介质层进行图案化以提供在金属层的接地侧上的接合指状物上的接合区和接合位置的开口。 金属层被图案化以提供适合于与管芯(管芯附接侧)和其它元件(例如多封装模块中的其它封装)的互连的电路迹线。 通过引线接合到金属层的管芯附着侧上的暴露的迹线,并且在金属层的相对(平台)侧上设置用于接合测试封装的接合指状物和焊盘的区域来实现与管芯的互连。 在一些实施例中,相邻接合指的陆地侧上的一排引线接合位置被介电层中的公共开口暴露,从而提供更细的间距互连,并因此提供堆叠封装之间的更高互连密度。 还有一种具有这种单一金属层带基片的平面阵列阵列封装。 而且,包括堆叠在球栅阵列封装上的这样的单个金属层带衬底焊盘栅格阵列封装的多封装模块。 还公开了制备基底的方法。