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1. 发明授权

US10018685B2 Method for operating a magnetic field detector circuit and a magnetic field detector circuit 有权
公开(公告)号：US10018685B2
公开(公告)日：2018-07-10
申请号：US15366401
申请日：2016-12-01
申请人： Micronas GmbH
发明人： Thomas Kauter , David Muthers , Joachim Ritter
IPC分类号： G01R33/06 , G01R33/00 , G01R33/07
CPC分类号： G01R33/0023 , G01R33/07
摘要： A method is provided for operating a magnetic field detector circuit, whereby the magnetic field detector circuit is operated alternately in an active state or in a sleep state and the magnetic field detector circuit has a magnetic field measuring device and a wake-up timer, whereby the magnetic field measuring device comprises a magnetic field sensor. In the active state, the magnetic field measuring device is operated with a supply voltage and an output signal is generated by the magnetic field sensor. The magnetic field detector circuit comprises a wake-up timer, whereby the wake-up timer is operated with the supply voltage in the sleep state and a wake-up signal is generated by the wake-up timer after a predetermined sleep interval, and the magnetic field measuring device changes from the sleep state to the active state.

2. 发明授权

US09739845B2 Method for testing a signal path 有权
公开(公告)号：US09739845B2
公开(公告)日：2017-08-22
申请号：US14872729
申请日：2015-10-01
申请人： Micronas GmbH
发明人： David Muthers , Joachim Ritter , Michael Wagner , Markus Von Ehr , Thomas Kauter
IPC分类号： G01R31/3187 , G01R33/07 , G01R35/00
CPC分类号： G01R33/07 , G01R35/00
摘要： A method for testing a signal path of a first IC formed as a monolithically integrated circuit on a semiconductor body together with a magnetic field sensor and has a signal output and a power supply connection and a test mode state and a normal operating state. A power supply of the first IC is switched off, and a signal output is connected with a reference potential, and the power supply of the first IC is switched on and the signal output is disconnected from the reference potential. Subsequently in a test mode state, a self-test is performed in the first IC and a test pattern is configured at the signal output or at the power supply connection and the test pattern is evaluated by the control unit for testing of the signal path.

3. 发明授权

US09279702B2 Circuit and measuring system 有权
标题翻译：电路和测量系统
公开(公告)号：US09279702B2
公开(公告)日：2016-03-08
申请号：US14154995
申请日：2014-01-14
申请人： Micronas GmbH
发明人： Joachim Ritter , Joerg Franke
IPC分类号： G01B7/30 , G01R33/09 , G01D5/16 , G01D5/14 , G01R33/07
CPC分类号： G01D5/16 , G01D5/145 , G01R33/072 , G01R33/091
摘要： A measuring system having a first magnetic field sensor, a second magnetic field sensor, an encoder, and an evaluation circuit to which the first magnetic field sensor and the second magnetic field sensor are connected. The evaluation circuit generates a first signal and a second measurement signal. The encoder generates a second magnetic field change with a second periodicity. The evaluation circuit generates a second signal with the second periodicity from the first measurement signal of the first magnetic field sensor and the second measurement signal of the second magnetic field sensor according to an absolute value function.
摘要翻译：具有连接第一磁场传感器和第二磁场传感器的第一磁场传感器，第二磁场传感器，编码器和评估电路的测量系统。评估电路产生第一信号和第二测量信号。编码器产生具有第二周期性的第二磁场变化。评估电路根据绝对值函数从第一磁场传感器的第一测量信号和第二磁场传感器的第二测量信号产生具有第二周期的第二信号。

4. 发明授权

US09348003B2 Measuring system 有权
标题翻译：测量系统
公开(公告)号：US09348003B2
公开(公告)日：2016-05-24
申请号：US14154812
申请日：2014-01-14
申请人： Micronas GmbH
发明人： Joachim Ritter , Joerg Franke
IPC分类号： G01B7/30 , G01R33/09 , G01D5/14
CPC分类号： G01R33/09 , G01D5/145
摘要： A measuring system having a first magnetic field sensor, a second magnetic field sensor, a third magnetic field sensor, an encoder, and an evaluation circuit to which the first magnetic field sensor, the second magnetic field sensor, and the third magnetic field sensor are connected. The evaluation circuit is configured to determine the position of the encoder based on a first measurement signal of the first magnetic field sensor and a second measurement signal of the second magnetic field sensor and a third measurement signal of the third magnetic field sensor.
摘要翻译：具有第一磁场传感器，第二磁场传感器，第三磁场传感器，编码器和第一磁场传感器，第二磁场传感器和第三磁场传感器的评估电路的测量系统是连接的。评估电路被配置为基于第一磁场传感器的第一测量信号和第二磁场传感器的第二测量信号以及第三磁场传感器的第三测量信号来确定编码器的位置。

5. 发明授权

US09341463B2 Measuring system 有权
标题翻译：测量系统
公开(公告)号：US09341463B2
公开(公告)日：2016-05-17
申请号：US14154752
申请日：2014-01-14
申请人： Micronas GmbH
发明人： Joachim Ritter , Joerg Franke
IPC分类号： G01B7/14 , G01D5/14
CPC分类号： G01B7/14 , G01D5/145
摘要： A measuring system having a first magnetic field sensor, an encoder, and an evaluation circuit. The first magnetic field sensor and the second magnetic field sensor and the third magnetic field sensor are connected to the encoder. The evaluation circuit has a logic, which is set up to determine the position of the encoder based on a first measurement signal of a first magnetic field sensor and a second measurement signal of a second magnetic field sensor and a third measurement signal of a third magnetic field sensor.
摘要翻译：一种具有第一磁场传感器，编码器和评估电路的测量系统。第一磁场传感器和第二磁场传感器以及第三磁场传感器连接到编码器。评估电路具有逻辑，其被设置为基于第一磁场传感器的第一测量信号和第二磁场传感器的第二测量信号以及第三磁场的第三测量信号来确定编码器的位置现场传感器。

6. 发明授权

US10317479B2 Sensor unit and method for detecting an encoder at a predefined position 有权
公开(公告)号：US10317479B2
公开(公告)日：2019-06-11
申请号：US15668031
申请日：2017-08-03
申请人： TDK—Micronas GmbH
发明人： Joachim Ritter
IPC分类号： G01R33/00 , G01R33/07 , G01D5/244 , G01R33/09 , G01D5/14
摘要： A sensor unit for detecting an encoder at a predefined position, having a circuit device and a threshold signal present at the circuit device, and a magnetic field sensor. The magnetic field sensor has a supply and ground terminal and first and second outputs, and outputs an analog sensor signal that is dependent on the distance of the encoder, and a supply unit connected to the supply terminal of the magnetic field sensor, the supply unit having a control input, and the circuit device is connected to the magnetic field sensor. The circuit device is configured to provide the sensor signal as an amplified signal value, and the circuit device is configured to determine an amount from the difference between the amplified signal value and the threshold signal and to control the amplification of the signal value and the supply unit as a function of the magnitude of the amount.

7. 发明授权

US10161997B2 Arrangement for testing integrated circuits 有权
公开(公告)号：US10161997B2
公开(公告)日：2018-12-25
申请号：US14746224
申请日：2015-06-22
申请人： Micronas GmbH
发明人： Joachim Ritter
IPC分类号： G01R31/28 , H01L21/66
摘要： An arrangement for testing integrated circuits includes an integrated test circuit and a cluster which has at least one integrated circuit and a second integrated circuit. The first integrated circuit is provided in a first component region of a wafer, and the second integrated circuit in a second component region. The first component region and the second component region are spaced a distance apart by a scribe line of the wafer. The integrated test circuit is connected to the first integrated circuit via a first test line section, and the second integrated circuit is connected to the first test line section via a first connecting line that has a first well in the semiconductor material, the first well extending continuously in the wafer from the first component region over the scribe line to the second component region, the first well being electrically insulated from a substrate of the wafer.

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