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1. 发明申请

US20120219185A1 APPARATUS AND METHOD FOR DETERMINING A LOCATION IN A TARGET IMAGE 有权
标题翻译：用于确定目标图像中的位置的装置和方法
公开(公告)号：US20120219185A1
公开(公告)日：2012-08-30
申请号：US13393325
申请日：2010-09-01
申请人： Mingxing Hu , Baptiste Allain , David Hawkes , Sebastien Ourselin , Laurence Lovat , Richard Cook
发明人： Mingxing Hu , Baptiste Allain , David Hawkes , Sebastien Ourselin , Laurence Lovat , Richard Cook
IPC分类号： G06K9/00
CPC分类号： G06K9/32 , G06T7/73 , G06T7/77 , G06T2207/10016 , G06T2207/10021 , G06T2207/10068 , G06T2207/30024
摘要： An apparatus and a computer-implemented method are provided for determining a location in a target image (T) of a site on a surface of a physical object using two or more reference images (I1, I2) of said physical object that have been obtained with a reference imaging device. Each of said two or more reference images includes said site on the surface of the physical object and was obtained with the reference imaging device having a different position and/or orientation relative to said physical object. The target image is obtained by a target imaging device and includes the site on the surface of the physical object. For each reference image, a set of feature mappings from the reference image to the target image is used to determine the epipolar geometry between the reference image and the target image, and a projection of the site from the reference image onto the target image is calculated from said epipolar geometry. The location in the target image of the site on the surface of the physical object is determined from the calculated epipolar projections for the two or more reference images.
摘要翻译：提供了一种装置和计算机实现的方法，用于使用已经获得的所述物理对象的两个或更多个参考图像（I1，I2）来确定物理对象的表面上的位置的目标图像（T）中的位置具有参考成像装置。所述两个或更多个参考图像中的每一个包括物理表面上的所述位置，并且使用具有与所述物理对象不同的位置和/或取向的参考成像装置获得。目标图像由目标成像装置获得，并且包括物体表面上的位置。对于每个参考图像，使用从参考图像到目标图像的一组特征映射来确定参考图像和目标图像之间的对极几何，并且计算从参考图像到目标图像的位置投影从所述对极几何。从物理对象的表面上的场地的目标图像中的位置由所计算的两个或更多个参考图像的对极投影确定。

2. 发明授权

US08781167B2 Apparatus and method for determining a location in a target image 有权
标题翻译：用于确定目标图像中的位置的装置和方法
公开(公告)号：US08781167B2
公开(公告)日：2014-07-15
申请号：US13393325
申请日：2010-09-01
申请人： Mingxing Hu , Baptiste Allain , David Hawkes , Sebastien Ourselin , Laurence Lovat , Richard Cook
发明人： Mingxing Hu , Baptiste Allain , David Hawkes , Sebastien Ourselin , Laurence Lovat , Richard Cook
IPC分类号： G06K9/00 , A61B1/00 , A61B1/04
CPC分类号： G06K9/32 , G06T7/73 , G06T7/77 , G06T2207/10016 , G06T2207/10021 , G06T2207/10068 , G06T2207/30024
摘要： An apparatus and a computer-implemented method are provided for determining a location in a target image (T) of a site on a surface of a physical object using two or more reference images (I1, I2) of said physical object that have been obtained with a reference imaging device. Each of said two or more reference images includes said site on the surface of the physical object and was obtained with the reference imaging device having a different position and/or orientation relative to said physical object. The target image is obtained by a target imaging device and includes the site on the surface of the physical object. For each reference image, a set of feature mappings from the reference image to the target image is used to determine the epipolar geometry between the reference image and the target image, and a projection of the site from the reference image onto the target image is calculated from said epipolar geometry. The location in the target image of the site on the surface of the physical object is determined from the calculated epipolar projections for the two or more reference images.
摘要翻译：提供了一种装置和计算机实现的方法，用于使用已经获得的所述物理对象的两个或更多个参考图像（I1，I2）来确定物理对象的表面上的位置的目标图像（T）中的位置具有参考成像装置。所述两个或更多个参考图像中的每一个包括物理表面上的所述位置，并且使用具有与所述物理对象不同的位置和/或取向的参考成像装置获得。目标图像由目标成像装置获得，并且包括物体表面上的位置。对于每个参考图像，使用从参考图像到目标图像的一组特征映射来确定参考图像和目标图像之间的对极几何，并且计算从参考图像到目标图像的位置投影从所述对极几何。从物理对象的表面上的场地的目标图像中的位置由所计算的两个或更多个参考图像的对极投影确定。

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