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    • 1. 发明授权
    • Mitigating leakage in memory circuits
    • 缓解内存电路中的漏电
    • US09406374B1
    • 2016-08-02
    • US14882206
    • 2015-10-13
    • NXP B.V.
    • Jainendra SinghPankaj AgarwalPatrick van de SteegJwalant Kumar Mishra
    • G11C11/00G11C11/419G11C11/418
    • G11C11/418G11C8/08
    • An apparatus includes a memory circuit and a word-line driver circuit. The memory circuit includes a plurality of rows of memory cells, each memory cell in a corresponding row having pass transistors connected to a shared word-line. The word-line driver circuit is configured and arranged to enable pass transistors of a first set of memory cells of the memory circuit by applying a first voltage to word-lines of the first set of memory cells, disable pass transistors of a second set of memory cells of the memory circuit by applying a second voltage to word-lines of the second set of memory cells, and mitigate leakage of pass transistors of a third set of memory cells of the memory circuit by applying a third voltage to word-lines of the third set of memory cells, wherein the third voltage is between the first and second voltages.
    • 一种装置包括存储电路和字线驱动电路。 存储电路包括多行存储单元,相应行中的每个存储单元具有连接到共享字线的传输晶体管。 字线驱动器电路被配置和布置成通过对第一组存储器单元的字线施加第一电压来使能存储器电路的第一组存储单元的通过晶体管,禁用第二组存储器单元的字线 通过对第二组存储器单元的字线施加第二电压并且通过将第三电压施加到存储器电路的字线来减轻存储器电路的第三组存储器单元的传输晶体管的泄漏来减轻存储器电路的存储单元 第三组存储器单元,其中第三电压在第一和第二电压之间。